IP Library Granted Patent US 9,835,504
Granted Patent B2
US 9,835,504 · App. 15/403,341 · Granted Dec 5, 2017

Image sensor including temperature sensor and electronic shutter function

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Quick Facts
Patent No.
US 9,835,504
App. No.
15/403,341
Granted
Dec 5, 2017
Kind
B2
Abstract

An image capture device includes an image sensor, a reading component, a timing generator, and a voltage regulator. The image sensor includes a temperature sensor configured to measure temperature measurements of the image sensor. The reading component is configured to read the temperature measurements from the temperature sensor. The timing generator is configured to apply an electronic shutter pulse to the image sensor. The voltage regulator is coupled between the temperature sensor and the reading component for regulating increased voltage at the reading component resulting from the electronic shutter pulse.

Claims (28)

1. An image capture device comprising:

an image sensor including an image sensing region and a temperature sensor configured to measure temperature measurements of said image sensor and to output a temperature measurement signal representative of a temperature measured by said temperature sensor, wherein said image sensing region and said temperature sensor are formed in a semiconductor substrate;

a reading component configured to receive said temperature measurement signal and to read said temperature measurements from said temperature sensor;

a timing generator configured to apply an electronic shutter pulse to said image sensor by applying a high voltage pulse to said semiconductor substrate; and

a voltage regulator coupled between said temperature sensor and said reading component for regulating an increased voltage of said temperature measurement signal resulting from the electronic shutter pulse.

2. The image capture device as set forth in claim 1 , further comprising a processor configured to instruct said timing generator to apply the electronic shutter pulse to said image sensor and to disable the reading of the temperature measurements by said reading component during an application of the electronic shutter pulse.

3. The image capture device as set forth in claim 1 , further comprising a cooler wherein the cooler is responsive to a temperature measurement from the reading component to cool the image sensor.

4. The image capture device as set forth in claim 3 , wherein the cooler is a thermoelectric cooler.

5. The image capture device as set forth in claim 3 , further comprising a processor coupled to the reading component and the cooler, wherein the processor instructs the cooler during the electronic shutter pulse based on a last temperature measurement before the electronic shutter pulse.

6. The image capture device as set forth in claim 5 , wherein the processor resumes reading of the temperature measurements after the electronic shutter pulse is applied and instructs the cooler based on new temperature measurements after the reading of the temperature measurements is resumed.

7. The image capture device as set forth in claim 1 , wherein the voltage regulator includes a Zener diode.

8. The image capture device as set forth in claim 7 , wherein said Zener diode is connected to ground and is configured to short-circuit to ground when voltage from the electronic shutter pulse is applied to said temperature sensor.

9. The image capture device as set forth in claim 7 , wherein the voltage regulator includes a resistor between said Zener diode and said temperature sensor.

10. The image capture device as set forth in claim 7 , wherein said temperature sensor is a diode.

11. The image capture device as set forth in claim 10 , wherein a cathode of said diode is connected to said reading component and an anode of said diode is connected to ground.

12. The image capture device as set forth in claim 10 , wherein a substrate of the image sensor is an n-type substrate and wherein said diode is disposed in a p-type well and includes an n-plus implant in said p-type well.

13. A method of determining a temperature of an image sensor, said method comprising:

measuring the temperature of the image sensor with a temperature sensor and providing a temperature measurement signal in response, wherein the temperature sensor and the image sensor are formed in a semiconductor substrate;

reading temperature measurements from the temperature sensor with a reading component;

applying an electronic shutter pulse to the image sensor wherein the electronic shutter pulse is a high voltage pulse applied to the semiconductor substrate; and

regulating a voltage of the temperature measurement signal between the temperature sensor and the reading component resulting from the electronic shutter pulse to prevent damage to the reading component.

14. The method as set forth in claim 13 , wherein regulating the voltage includes short-circuiting current through the temperature sensor from the electronic shutter pulse through a Zener diode to ground.

15. The method as set forth in claim 13 , wherein the temperature sensor is a diode and wherein measuring the temperature further comprises forward biasing the diode and reading a voltage across the diode or a current through the diode.

16. The method as set forth in claim 13 , further comprising disabling the reading of the temperature measurements during the electronic shutter pulse to avoid reading a temperature measurement that is altered by the electronic shutter pulse.

17. The method as set forth in claim 13 , further comprising cooling the image sensor responsive to a temperature measurement from the reading component.

18. The method as set forth in claim 17 , wherein the cooling comprises cooling using is a thermoelectric cooler.

19. The method as set forth in claim 18 , further comprising instructing the thermoelectric cooler during the electronic shutter pulse based on a last temperature measurement before the electronic shutter pulse.

20. The method as set forth in claim 19 , further comprising resuming reading of the temperature measurements after the electronic shutter pulse is applied and instructing the thermoelectric cooler based on new temperature measurements after the reading of the temperature measurements is resumed.

Assignments (4)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 04481, FRAME 0541 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064072/0459 →
PATENT SECURITY AGREEMENT Recorded Nov 17, 2017
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 044481/0541 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 11, 2017
From: WANG, SHEN; MOBERG, GREGORY OSCAR
To: TRUESENSE IMAGING, INC.
Reel/Frame 040947/0437 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 11, 2017
From: TRUESENSE IMAGING, INC.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 041331/0410 →