Voltage and temperature sensor for a serializer/deserializer communication application

1. A method comprising:

measuring a first temperature on an integrated circuit using a temperature sensor;

determining a first reference value for the integrated circuit at the first temperature, the reference value based on a first delay electrical characteristic;

measuring a second delay electrical characteristic for the integrated circuit;

determining a second reference value for the integrated circuit based on the second delay electrical characteristic and a second temperature;

determining a gain value from the first reference value and the second reference value;

generating a line equation using the gain value;

measuring a third delay electrical characteristic comprising a differential signal from a delay core; and

determining a third temperature using the third delay electrical characteristic and the line equation.

2. The method of claim 1 wherein the first reference value is proportional to current.

3. The method of claim 1 wherein the first reference value is proportional to the first temperature.

4. The method of claim 1 wherein the second temperature is a new equivalent temperature.

5. The method of claim 1 further comprising generating the second reference value using one or more control switches.

6. The method of claim 1 wherein the gain value is a ratio between a changing electrical characteristic and a corresponding changing temperature.

7. The method of claim 1 wherein the first reference value comprises a current proportional to absolute temperature value described by equation IPTAT=K*T*ln(M)/R, where K is Boltzmann's constant, T is absolute temperature in Kelvin, M is a design constant, and R is a resistance value.

8. The method of claim 1 wherein the integrated circuit comprises a Serializer/Deserializer (SerDes) device, a DDR register device, a DSP device, a controller device, a microcontroller device, or an ASIC device.

9. The method of claim 1 wherein:

the delay core comprises a first delay core and a second delay core receiving a common feedback voltage; and

the differential signal is from the first delay core and the second delay core.

10. A system comprising:

a temperature sensor positioned on an integrated circuit and associated with a reference value and a line equation for determining a temperature value;

a control element configured to change one or more variables of the reference value;

a processor configured to determine the temperature value using at least the line equation;

wherein:

the reference value is proportional to the temperature value;

the line equation is determined by calculating a gain factor, the gain factor being based on change in temperature corresponding to change in the one or more variables caused by the control element;

the processor determines the temperature value using reading of one or more delay electrical characteristics comprising a signal from a delay core that is included in the temperature sensor.

11. The system of claim 10 wherein the temperature sensor is configured to determine delay values.

12. The system of claim 10 further comprising a memory element for storing at least the reference value.

13. The system of claim 10 further comprising an interface for transmitting the temperature value.

14. The system of claim 10 wherein the first reference value comprises a current proportional to absolute temperature value described by equation IPTAT=K*T*ln(M)/R, where K is Boltzmann's constant, T is absolute temperature in Kelvin, M is a design constant, and R is a resistance value.

15. The system of claim 14 further comprising a memory storing characterization data associated with the integrated circuit, the characterization data comprising the design constant.

16. The system of claim 10 wherein the temperature value is determined using a base reference temperature value.

17. The system of claim 10 wherein:

the delay core comprises a first delay core and a second delay core receiving a common feedback voltage; and

the signal comprises a differential signal from the first delay core and the second delay core.

18. The system of claim 10 wherein the integrated circuit comprises a plurality of temperature sensors at different locations.

19. The system of claim 18 wherein the integrated circuit comprises a Serializer/Deserializer (SerDes) device having a first temperature sensor at a receiver and a second temperature sensor at a transmitter.

20. The system of claim 10 wherein the integrated circuit comprises a DDR register device, a DSP device, a controller device, a microcontroller device, or an ASIC device.