IP Library Granted Patent US 9,905,584
Granted Patent B2
US 9,905,584 · App. 15/427,103 · Granted Feb 27, 2018

Display device

Inventor: Atsushi Umezaki (Kanagawa, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H01L27/124G02F1/1368G02F1/133345G02F1/136286G09G3/3266G09G3/3677G11C19/28H01L27/105H01L27/12H01L27/1214H01L27/1222H01L27/1251H01L27/1255H01L29/78663H01L29/78678G02F1/13454G02F1/13624G02F1/134309G02F2202/103G09G3/3688G09G2300/0417G09G2300/0426G09G2320/043G09G2330/021G09G2330/023H01L27/13H01L27/3262H01L27/3276H01L29/42384H01L29/78696
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Quick Facts
Patent No.
US 9,905,584
App. No.
15/427,103
Granted
Feb 27, 2018
Kind
B2
Abstract

By applying an AC pulse to a gate of a transistor which easily deteriorates, a shift in threshold voltage of the transistor is suppressed. However, in a case where amorphous silicon is used for a semiconductor layer of a transistor, the occurrence of a shift in threshold voltage naturally becomes a problem for a transistor which constitutes a part of circuit that generates an AC pulse. A shift in threshold voltage of a transistor which easily deteriorates and a shift in threshold voltage of a turned-on transistor are suppressed by signal input to a gate electrode of the transistor which easily deteriorates through the turned-on transistor. In other words, a structure for applying an AC pulse to a gate electrode of a transistor which easily deteriorates through a transistor to a gate electrode of which a high potential (VDD) is applied, is included.

Claims (159)

1. A display device comprising:

a first scan line side input terminal;

a second scan line side input terminal;

a pixel portion between the first scan line side input terminal and the second scan line side input terminal;

a first scan line;

a second scan line;

a third scan line;

a first signal line;

a second signal line;

a first transistor;

a second transistor;

a third transistor; and

a fourth transistor,

wherein one end portion of each of the first scan line, the second scan line and the third scan line is electrically connected to the first scan line side input terminal,

wherein the other end portion of each of the first scan line, the second scan line and the third scan line is electrically connected to the second scan line side input terminal,

wherein one of a source and a drain of the first transistor is electrically connected to the first scan line,

wherein a gate of the first transistor is electrically connected to the first scan line,

wherein the other of the source and the drain of the first transistor is electrically connected to the second scan line,

wherein one of a source and a drain of the second transistor is electrically connected to the first scan line,

wherein a gate of the second transistor is electrically connected to the second scan line,

wherein the other of the source and the drain of the second transistor is electrically connected to the second scan line,

wherein one of a source and a drain of the third transistor is electrically connected to the second scan line,

wherein a gate of the third transistor is electrically connected to the second scan line,

wherein the other of the source and the drain of the third transistor is electrically connected to the third scan line,

wherein one of a source and a drain of the fourth transistor is electrically connected to the second scan line,

wherein a gate of the fourth transistor is electrically connected to the third scan line,

wherein the other of the source and the drain of the fourth transistor is electrically connected to the third scan line,

wherein the pixel portion comprises a first pixel, a second pixel and a third pixel in a first column,

wherein the first pixel is electrically connected to the first scan line,

wherein the second pixel is electrically connected to the second scan line,

wherein the third pixel is electrically connected to the third scan line,

wherein the first pixel is electrically connected to the first signal line,

wherein the second pixel is electrically connected to the second signal line, and

wherein the third pixel is electrically connected to the first signal line.

2. The display device according to claim 1 ,

wherein the pixel portion further comprises a fourth pixel in a second column,

wherein the fourth pixel is electrically connected to the first scan line, and

wherein the fourth pixel is electrically connected to the second signal line.

3. A display device comprising:

a first scan line driver circuit;

a second scan line driver circuit;

a pixel portion between the first scan line driver circuit and the second scan line driver circuit;

a first scan line;

a second scan line;

a third scan line;

a first signal line;

a second signal line;

a first transistor;

a second transistor;

a third transistor; and

a fourth transistor,

wherein one end portion of each of the first scan line, the second scan line and the third scan line is electrically connected to the first scan line driver circuit,

wherein the other end portion of each of the first scan line, the second scan line and the third scan line is electrically connected to the second scan line driver circuit,

wherein the first scan line driver circuit is configured to select the first scan line while the first scan line driver circuit is configured to select the second scan line,

wherein the second scan line driver circuit is configured to select the first scan line while the second scan line driver circuit is configured to select the second scan line,

wherein one of a source and a drain of the first transistor is electrically connected to the first scan line,

wherein a gate of the first transistor is electrically connected to the first scan line,

wherein the other of the source and the drain of the first transistor is electrically connected to the second scan line,

wherein one of a source and a drain of the second transistor is electrically connected to the first scan line,

wherein a gate of the second transistor is electrically connected to the second scan line,

wherein the other of the source and the drain of the second transistor is electrically connected to the second scan line,

wherein one of a source and a drain of the third transistor is electrically connected to the second scan line,

wherein a gate of the third transistor is electrically connected to the second scan line,

wherein the other of the source and the drain of the third transistor is electrically connected to the third scan line,

wherein one of a source and a drain of the fourth transistor is electrically connected to the second scan line,

wherein a gate of the fourth transistor is electrically connected to the third scan line,

wherein the other of the source and the drain of the fourth transistor is electrically connected to the third scan line,

wherein the pixel portion comprises a first pixel, a second pixel and a third pixel in a first column,

wherein the first pixel comprises a fifth transistor comprising a semiconductor layer comprising amorphous silicon,

wherein the first pixel is electrically connected to the first scan line,

wherein the second pixel is electrically connected to the second scan line,

wherein the third pixel is electrically connected to the third scan line,

wherein the first pixel is electrically connected to the first signal line,

wherein the second pixel is electrically connected to the second signal line, and

wherein the third pixel is electrically connected to the first signal line.

4. The display device according to claim 3 ,

wherein the pixel portion, the first scan line driver circuit and the second scan line driver circuit are formed over a same substrate.

5. The display device according to claim 3 ,

wherein the first scan line driver circuit comprises a sixth transistor comprising a semiconductor layer comprising amorphous silicon.

6. A display panel module comprising:

a first scan line side input terminal formed over a substrate;

a second scan line side input terminal formed over the substrate;

a pixel portion formed over the substrate, the pixel portion being between the first scan line side input terminal and the second scan line side input terminal;

a first IC chip configured to input a signal to the first scan line side input terminal;

a second IC chip configured to input a signal to the second scan line side input terminal;

a first scan line;

a second scan line;

a third scan line;

a first signal line;

a second signal line;

a first transistor;

a second transistor;

a third transistor; and

a fourth transistor,

wherein one end portion of each of the first scan line, the second scan line and the third scan line is electrically connected to the first scan line side input terminal,

wherein the other end portion of each of the first scan line, the second scan line and the third scan line is electrically connected to the second scan line side input terminal,

wherein one of a source and a drain of the first transistor is electrically connected to the first scan line,

wherein a gate of the first transistor is electrically connected to the first scan line,

wherein the other of the source and the drain of the first transistor is electrically connected to the second scan line,

wherein one of a source and a drain of the second transistor is electrically connected to the first scan line,

wherein a gate of the second transistor is electrically connected to the second scan line,

wherein the other of the source and the drain of the second transistor is electrically connected to the second scan line,

wherein one of a source and a drain of the third transistor is electrically connected to the second scan line,

wherein a gate of the third transistor is electrically connected to the second scan line,

wherein the other of the source and the drain of the third transistor is electrically connected to the third scan line,

wherein one of a source and a drain of the fourth transistor is electrically connected to the second scan line,

wherein a gate of the fourth transistor is electrically connected to the third scan line,

wherein the other of the source and the drain of the fourth transistor is electrically connected to the third scan line,

wherein the pixel portion comprises a first pixel, a second pixel and a third pixel in a first column,

wherein the first pixel comprises a fifth transistor comprising a semiconductor layer comprising amorphous silicon,

wherein the first pixel is electrically connected to the first scan line,

wherein the second pixel is electrically connected to the second scan line,

wherein the third pixel is electrically connected to the third scan line,

wherein the first pixel is electrically connected to the first signal line,

wherein the second pixel is electrically connected to the second signal line, and

wherein the third pixel is electrically connected to the first signal line.

7. The display panel module according to claim 6 ,

wherein the first IC chip is mounted on an FPC by a TAB method.

8. A television receiver comprising:

a speaker; and

a display panel module comprising:

a first scan line side input terminal formed over a substrate;

a second scan line side input terminal formed over the substrate;

a pixel portion formed over the substrate, the pixel portion being between the first scan line side input terminal and the second scan line side input terminal;

a first IC chip configured to input a signal to the first scan line side input terminal;

a second IC chip configured to input a signal to the second scan line side input terminal;

a first scan line;

a second scan line;

a third scan line;

a first signal line;

a second signal line;

a first transistor;

a second transistor;

a third transistor; and

a fourth transistor,

wherein one end portion of each of the first scan line, the second scan line and the third scan line is electrically connected to the first scan line side input terminal,

wherein the other end portion of each of the first scan line, the second scan line and the third scan line is electrically connected to the second scan line side input terminal,

wherein one of a source and a drain of the first transistor is electrically connected to the first scan line,

wherein a gate of the first transistor is electrically connected to the first scan line,

wherein the other of the source and the drain of the first transistor is electrically connected to the second scan line,

wherein one of a source and a drain of the second transistor is electrically connected to the first scan line,

wherein a gate of the second transistor is electrically connected to the second scan line,

wherein the other of the source and the drain of the second transistor is electrically connected to the second scan line,

wherein one of a source and a drain of the third transistor is electrically connected to the second scan line,

wherein a gate of the third transistor is electrically connected to the second scan line,

wherein the other of the source and the drain of the third transistor is electrically connected to the third scan line,

wherein one of a source and a drain of the fourth transistor is electrically connected to the second scan line,

wherein a gate of the fourth transistor is electrically connected to the third scan line,

wherein the other of the source and the drain of the fourth transistor is electrically connected to the third scan line,

wherein the pixel portion comprises a first pixel, a second pixel and a third pixel in a first column,

wherein the first pixel comprises a fifth transistor comprising a semiconductor layer comprising amorphous silicon,

wherein the first pixel is electrically connected to the first scan line,

wherein the second pixel is electrically connected to the second scan line,

wherein the third pixel is electrically connected to the third scan line,

wherein the first pixel is electrically connected to the first signal line,

wherein the second pixel is electrically connected to the second signal line, and

wherein the third pixel is electrically connected to the first signal line.

9. The television receiver according to claim 8 ,

wherein the first IC chip is mounted on an FPC by a TAB method.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 3, 2017
From: UMEZAKI, ATSUSHI
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 041834/0742 →
Priority Claims (1)
JP 2006-269689 · Sep 29, 2006 · national
Continuity (6)
Continuation 15000096 · Jan 19, 2016
Continuation 14072878 · Nov 6, 2013
Division 13117658 · May 27, 2011
Division 12694514 · Jan 27, 2010
Division 11863913 · Sep 28, 2007
Related Publication 20170207241A1 · Jul 20, 2017