TEMPERATURE SENSING SYSTEM FOR ROTATABLE WAFER SUPPORT ASSEMBLY
A semiconductor processing apparatus includes a wafer support assembly, a temperature sensor integrated in the wafer support assembly for measuring a temperature of the wafer support assembly, and a signal transmission device that wirelessly transmits a signal relating to a temperature measurement obtained by the temperature sensor to an external control module.
1 . A semiconductor processing apparatus, comprising:
a wafer support assembly;
a temperature sensor integrated in the wafer support assembly for measuring a temperature of the wafer support assembly; and
a signal transmission device that wirelessly transmits a signal relating to a temperature measurement obtained by the temperature sensor to an external control module.
2 . The semiconductor processing apparatus according to claim 1 , wherein the signal transmission device is integrated in the wafer support assembly.
3 . The semiconductor processing apparatus according to claim 1 , wherein the signal transmission device includes an interactive WiFi connectivity module.
4 . The semiconductor processing unit according to claim 1 , further comprising a DC power supply integrated in the wafer support assembly, and an inductive power supply charging module disposed outside the wafer support assembly.
5 . The semiconductor processing unit according to claim 4 , wherein the inductive power supply charging module includes a first coil, and the DC power supply includes a second coil, the first coil generating magnetic field to induce an electric current in the second coil.
6 . The semiconductor processing unit according to claim 1 , further comprising a sensing electronic input module integrated in the wafer support assembly.
7 . The semiconductor processing unit according to claim 1 , wherein the wafer support assembly includes a wafer support portion and a shaft connected to the wafer support portion, wherein the temperature sensor is disposed in the wafer support portion, and the signal transmission device is disposed in the shaft.
8 . The semiconductor processing apparatus according to claim 7 , further comprising a heater disposed under the wafer support portion of the wafer support assembly.
9 . The semiconductor processing apparatus according to claim 7 , wherein the wafer support assembly is rotatable.
10 . The semiconductor processing apparatus according to claim 1 , wherein the external control module is a heater control module that controls a heater based on the temperature measurement.
11 . A temperature sensing system comprising:
a temperature sensor for obtaining temperature information; and
a WiFi connectivity module for wirelessly transmitting a signal relating to the temperature information obtained by the temperature sensor to an external control module, wherein the temperature sensing system is part of a rotating device.
12 . The temperature sensing system according to claim 11 , further comprising a power source to supply power to the WiFi connectivity module, wherein the power source includes a DC power supply and an inductive power supply charging module that charges the DC power supply through induction.
13 . The temperature sensing system according to claim 12 , wherein the inductive power supply charging module includes a first coil, and the DC power supply includes a second coil, wherein the first coil generates a magnetic field that induces an electric current in the second coil.
14 . The temperature sensing system according to claim 11 , further comprising a scanning sensing electronic input module.
15 . The temperature sensing system according to claim 11 , further comprising an access electronic module.
16 . The temperature sensing system according to claim 11 , further comprising an operating system electronic module.
17 . A semiconductor processing system, comprising:
a processing chamber;
a rotatable wafer support assembly including a wafer support portion disposed inside the processing chamber and a shaft connected to the wafer support portion and extending through a wall of the processing chamber;
a heater for heating the wafer support portion;
a heater control module for controlling the heater;
a temperature sensor integrated in the wafer support portion; and
a WiFi connectivity module electrically connected to the temperature sensor and wirelessly transmitting a signal relating to a temperature measurement obtained by the temperature sensor to the heater control module.
18 . The semiconductor processing system according to claim 17 , wherein the heater control module includes a receiver for receiving the signal from the WiFi connectivity module.
19 . The semiconductor processing system according to claim 17 , further comprising a DC power supply disposed in the shaft and an inductive power supply charging module disposed proximate the DC power supply and outside the shaft.
20 . The semiconductor processing system according to claim 17 further comprising a scanning sensing electronic input module, an access electronic module, and an operating system electronic module.
21 . The semiconductor processing system according to claim 17 further comprising a cooling device disposed around the shaft.