Image combining using images with different focal-spot sizes
View Patent ↗A method and apparatus is provided to generate two X-ray projection images, using different focal-spot sizes in the X-ray source. The large and small focal-spot images have different image qualities (e.g., different signal-to-noise rations (SNR) and different resolution). The two images are combined, in either the spatial or frequency domains, to generate a combined image, exhibiting the best attributes of the constitutive small and large focal-spot images. In the spatial domain, change regions and uniform regions are determined based on spatial variations within the images, and the superposition generating the combined image weights the small focal-spot image more in the change regions and the large focal-spot image more in the uniform regions. In the frequency domain, the combined image superimposes low-frequency components of the large focal-spot image with high-frequency components of the small focal-spot image.
1. A radiography apparatus, comprising:
processing circuitry configured to
obtain a first X-ray image of an object, the first X-ray image representing an attenuation of an intensity of X-ray radiation detected at a plurality of detectors, and corresponding to a first focal-spot size of an X-ray source generating the X-ray radiation,
obtain a second X-ray image of the object, the second X-ray image representing the attenuation of the intensity of X-ray radiation detected at the plurality of detectors, and corresponding to a second focal-spot size of the X-ray source, wherein the second focal-spot size is larger than the first focal-spot size,
combine the first X-ray image with the second X-ray image to generate a combined X-ray image, wherein a resolution of the combined image is finer than a resolution of the second X-ray image and a signal-to-noise ratio of the combined image is greater than a signal-to-noise ratio of the first X-ray image,
determine a change region within the first X-ray image, the second X-ray image, and the combined image, corresponding to spatial variations in the first X-ray image and the second X-ray image, and
determine a uniform region within the first X-ray image, the second X-ray image, and the combined image, corresponding to an absence of the spatial variations in the first X-ray image and the second X-ray image, wherein
the combining of the first X-ray image with the second X-ray image to generate the combined X-ray image includes superimposing the first X-ray image with the second X-ray image such that, within the uniform region, the combined X-ray image predominantly derives from the second X-ray image, and, within the change region, the combined X-ray image predominantly derives from the first X-ray image.
2. The radiography apparatus of claim 1 , wherein the processing circuitry is further configured to
determine a high-frequency image by filtering the first X-ray image using a first filter, which has a high-frequency pass-band that passes high-frequency components and has a first frequency cutoff, and
determine a low-frequency image by filtering the second X-ray image using a second filter, which has a low-frequency pass-band that passes low-frequency components and has a second frequency cutoff, wherein
the combining of the first X-ray image with the second X-ray image to generate the combined X-ray image includes superimposing the low-frequency image with the high-frequency image.
3. The radiography apparatus of claim 2 , wherein the processing circuitry is further configured to
determine the high-frequency image using the first frequency cutoff, which corresponds to a resolution of the second X-ray image and is determined using the second focal-spot size, and
determine the low-frequency image using the second frequency cutoff, which corresponds to the first frequency cutoff of the high-frequency image.
4. The radiography apparatus of claim 3 , wherein the determining of the high-frequency image further includes filtering using the first filter, which is a band-pass filter, the first filter having a third frequency cutoff that is higher than the first frequency cutoff and corresponds to a resolution of the first X-ray image, which is determined using the first focal-spot size.
5. The radiography apparatus of claim 1 , wherein the processing circuitry is further configured to
determine a low-frequency image from the second X-ray image using low-frequency components of a wavelet transformation of the second X-ray image, and
determine a high-frequency image from the first X-ray image using high-frequency components of a wavelet transformation of the first X-ray image, wherein
the combining of the first X-ray image with the second X-ray image to generate the combined X-ray image includes superimposing the low-frequency image with the high-frequency image.
6. The radiography apparatus of claim 1 , wherein the processing circuitry is further configured to
determine a point-spread function of the first X-ray image using a magnification determined using a ratio of a source-to-imager distance (SID) to an source-to-object distance (SOD), and using the first focal-spot size and a distance between detector elements of the plurality of detectors, and
determine a point-spread function of the second X-ray image using the magnification, and using the second focal-spot size and the distance between detector elements of the plurality of detectors.
7. The radiography apparatus of claim 1 , wherein the processing circuitry is further configured to
determine the first focal-spot size using a first tube current and a first tube voltage of the X-ray source used to obtain the first X-ray image, and
determine the second focal-spot size using a second tube current and a second tube voltage of the X-ray source used to obtain the second X-ray image.
8. The radiography apparatus of claim 1 , wherein the processing circuitry is further configured to
obtain first computed tomography (CT) scan data of the object using the first focal-spot size, the first CT scan data including the first X-ray image,
obtain second CT scan data of the object using the first focal-spot size, the second CT scan data including the second X-ray image,
reconstruct a CT image from one of the first CT scan data and the second CT scan data,
determine a change region of the CT image corresponding to spatial variations in the CT image, and forward-project an image of the change region to generate a projected change region, and
determine a uniform region of the CT image corresponding to an absence of the spatial variations in the CT image, and forward-project an image of the uniform region to generate a projected uniform region, wherein
the combining of the first X-ray image with the second X-ray image to generate the combined X-ray image includes superimposing the first X-ray image with the second X-ray image such that, within the projected uniform region, the combined X-ray image predominantly derives from the second X-ray image, and, within the projected change region, the combined X-ray image predominantly derives from the first X-ray image.
9. The radiography apparatus of claim 1 , wherein the processing circuitry is further configured to
perform material decomposition on one of the first X-ray image and the second X-ray image to generate material-component images,
determine a change region corresponding to spatial variations in relative material concentrations among the material-component images, and
determine a uniform region corresponding an absence of the spatial variations in the relative material concentrations among the material-component images, wherein
the combining of the first X-ray image with the second X-ray image to generate the combined X-ray image includes superimposing the first X-ray image with the second X-ray image such that the uniform region in the combined X-ray image predominantly derives from the second X-ray image and the change region in the combined X-ray image predominantly derives from the first X-ray image.
10. The radiography apparatus of claim 1 , wherein the processing circuitry is further configured to determine the change region and the uniform region by
subtracting the first-X-ray image from the second X-ray image to generate a difference image,
perform a wavelet transformation on the difference image to generate wavelet components,
determine the change region as corresponding to the wavelet components exceeding a first threshold, and
determine the uniform region as corresponding to the wavelet components less than a second threshold.
11. The radiography apparatus of claim 1 , wherein the processing circuitry is further configured to determine the change region using an edge-detection method.
12. The radiography apparatus of claim 1 , wherein the processing circuitry is further configured to
obtain the first X-ray image and the second X-ray image by respectively reconstructing first projection data and second projection data, wherein
the first projection data and the second projection data are generated using one of an single-scan imaging method using a single scan acquiring projection images at a series of projection angles, and the respective projection images alternate between being acquired using the first focal-spot size and the second focal-spot size, and a multi-scan imaging method using respective scans each acquiring respective projection images at the projection angles using no more than one of the first focal-spot size and the second focal-spot size per scan.
13. The radiography apparatus of claim 1 , wherein the processing circuitry is further configured to
determine the first focal-spot size of the X-ray source by selecting a first beam filter of the X-ray source and by selecting a first kVp value of the X-ray source, and
determine the second focal-spot size of the X-ray source by selecting a second beam filter of the X-ray source and by selecting a second kVp value of the X-ray source.
14. The radiography apparatus of claim 1 , wherein the processing circuitry is further configured to
adjust the first focal-spot size to a smaller size for applications in accordance with a signal to increase the resolution of the combined image, and
adjust the second focal-spot size to increase an exposure corresponding to the second X-ray image in accordance with a signal to increase the signal-to-noise ratio of the combined image.
15. The radiography apparatus of claim 1 , wherein the processing circuitry is further configured to
obtain at least one additional X-ray image of the object, the at least one additional X-ray image respectively representing the attenuation of the intensity of the X-ray radiation detected at the plurality of detectors, and respectively corresponding to at least one additional focal-spot size of the X-ray source generating the X-ray radiation, the at least one additional focal-spot size being unequal to the first focal-spot size and the second focal-spot size, and
the combining of the first X-ray image with the second X-ray image to generate the combined X-ray image further including combining the least one additional X-ray image with the first X-ray image and the second X-ray image.
16. A radiography apparatus, comprising:
processing circuitry configured to
obtain a first X-ray image of an object, the first X-ray image representing an attenuation of an intensity of X-ray radiation detected at a plurality of detectors, and corresponding to a first focal-spot size of an X-ray source generating the X-ray radiation,
obtain a second X-ray image of the object, the second X-ray image representing the attenuation of the intensity of X-ray radiation detected at the plurality of detectors, and corresponding to a second focal-spot size of the X-ray source, wherein the second focal-spot size is larger than the first focal-spot size,
combine the first X-ray image with the second X-ray image to generate a combined X-ray image, wherein a resolution of the combined image is finer than a resolution of the second X-ray image and a signal-to-noise ratio of the combined image is greater than a signal-to-noise ratio of the first X-ray image,
determine a high-frequency image by filtering the first X-ray image using a first filter, which has a high-frequency pass-band that passes high-frequency components and has a first frequency cutoff, and
determine a low-frequency image by filtering the second X-ray image using a second filter, which has a low-frequency pass-band that passes low-frequency components and has a second frequency cutoff, wherein
the combining of the first X-ray image with the second X-ray image to generate the combined X-ray image includes superimposing the low-frequency image with the high-frequency image.
17. The radiography apparatus of claim 16 , further comprising:
a radiation source configured to generate the X-ray radiation; and
a radiation detector configured to receive the X-ray radiation from the radiation source.
18. A radiography apparatus, comprising:
processing circuitry configured to
obtain a first X-ray image of an object, the first X-ray image representing an attenuation of an intensity of X-ray radiation detected at a plurality of detectors, and corresponding to a first focal-spot size of an X-ray source generating the X-ray radiation,
obtain a second X-ray image of the object, the second X-ray image representing the attenuation of the intensity of X-ray radiation detected at the plurality of detectors, and corresponding to a second focal-spot size of the X-ray source, wherein the second focal-spot size is larger than the first focal-spot size,
combine the first X-ray image with the second X-ray image to generate a combined X-ray image, wherein a resolution of the combined image is finer than a resolution of the second X-ray image and a signal-to-noise ratio of the combined image is greater than a signal-to-noise ratio of the first X-ray image,
determine a low-frequency image from the second X-ray image using low-frequency components of a wavelet transformation of the second X-ray image, and
determine a high-frequency image from the first X-ray image using high-frequency components of a wavelet transformation of the first X-ray image, wherein
the combining of the first X-ray image with the second X-ray image to generate the combined X-ray image includes superimposing the low-frequency image with the high-frequency image.
19. The radiography apparatus of claim 18 , further comprising:
a radiation source configured to generate the X-ray radiation; and
a radiation detector configured to receive the X-ray radiation from the radiation source.
20. A radiography apparatus, comprising:
processing circuitry configured to
obtain a first X-ray image of an object, the first X-ray image representing an attenuation of an intensity of X-ray radiation detected at a plurality of detectors, and corresponding to a first focal-spot size of an X-ray source generating the X-ray radiation,
obtain a second X-ray image of the object, the second X-ray image representing the attenuation of the intensity of X-ray radiation detected at the plurality of detectors, and corresponding to a second focal-spot size of the X-ray source, wherein the second focal-spot size is larger than the first focal-spot size,
combine the first X-ray image with the second X-ray image to generate a combined X-ray image, wherein a resolution of the combined image is finer than a resolution of the second X-ray image and a signal-to-noise ratio of the combined image is greater than a signal-to-noise ratio of the first X-ray image,
determine a point-spread function of the first X-ray image using a magnification determined using a ratio of a source-to-imager distance (SID) to an source-to-object distance (SOD), and using the first focal-spot size and a distance between detector elements of the plurality of detectors, and
determine a point-spread function of the second X-ray image using the magnification, and using the second focal-spot size and the distance between detector elements of the plurality of detectors.
21. The radiography apparatus of claim 20 , further comprising:
a radiation source configured to generate the X-ray radiation; and
a radiation detector configured to receive the X-ray radiation from the radiation source.