Multiple MEMS device and methods
A method for operating an electronic device comprising a first and second MEMS device and a semiconductor substrate disposed upon a mounting substrate includes subjecting the first MEMS device and the second MEMS device to physical perturbations, wherein the physical perturbations comprise first physical perturbations associated with the first MEMS device and second physical perturbations associated with the second MEMS device, wherein the first physical perturbations and the second physical perturbations are substantially contemporaneous, determining in a plurality of CMOS circuitry formed within the one or more semiconductor substrates, first physical perturbation data from the first MEMS device in response to the first physical perturbations and second physical perturbation data from the second MEMS device in response to the second physical perturbations, determining output data in response to the first physical perturbation data and to the second physical perturbation data, and outputting the output data.
1. An electronic device comprising:
a mounting substrate selected from a group consisting of: a rigid printed circuit board, a flexible circuit board, a packaging substrate, and a wafer substrate;
a first MEMS device comprising a first accelerometer configured to provide first data in response to a first physical perturbation of the electronic device;
a second MEMS device comprising a second accelerometer configured to provide second data in response to the first physical perturbation of the electronic device and configured to provide third data in response to a second physical perturbation subsequent to the first physical perturbation;
a first semiconductor substrate disposed on the mounting substrate and coupled to the first MEMS device, wherein the first semiconductor substrate comprises a first plurality of CMOS circuitry configured to sense the first data from the first MEMS device and configured to output first sensed data in response to the first data;
a second semiconductor substrate disposed above the first MEMS device and coupled to the second MEMS device, wherein the second semiconductor substrate comprises a second plurality of CMOS circuitry configured to sense the second data from the second MEMS device and configured to output second sensed data at a first data rate in response to the second data, and configured to sense the third data from the second MEMS device and configured to output third sensed data at a second data rate in response to the third data; and
a processor disposed upon the mounting substrate and coupled to the first and second semiconductor substrates, wherein the processor is configured to receive the first sensed data, wherein the processor is configured to determine whether a magnitude of the first sensed data exceeds a predetermined magnitude, and wherein the processor is configured to change a driving rate associated with the second MEMS device from a first frequency to a second frequency in response to determining that the magnitude of the first sensed data exceeds the predetermined magnitude, wherein the second frequency exceeds the first frequency.
2. The electronic device of claim 1
wherein the processor is configured increase a data rate associated with the second MEMS device from the first data rate to the second data rate in response to determining that the magnitude of the first accelerometer data exceeds the predetermined magnitude.
3. The electronic device of claim 1 further comprising an additional MEMS device disposed above the mounting substrate selected from a group consisting of: a gyroscope, a magnetometer, a pressure sensor, a sound sensor, a light sensor, and an image sensor.
4. The electronic device of claim 1 further comprising a potting material disposed upon the mounting substrate and covering the first MEMS device, the second MEMS device, and the first and second semiconductor substrates.
5. The electronic device of claim 1
wherein the first semiconductor substrate comprises a first driver configured to provide first drive signals to the first MEMS device;
wherein the second semiconductor substrate comprises a second driver, configured to provide second drive signals to the second MEMS device and third drive signals to the second MEMS device; and
wherein the first drive signals and the second drive signals include a parameter selected from a group consisting of: operation frequency, power consumption mode, and performance parameters.
6. The electronic device of claim 5 wherein an operation frequency associated with the second drive signals is lower than an operation frequency associated with the third drive signals.
7. The electronic device of claim 1 wherein the mounting substrate comprises a land grid array substrate.
8. The electronic device of claim 1
wherein the processor is configured to determine output data in response to the first sensed data, to the second sensed data, and to the third sensed data; and
wherein the processor is configured to provide the output data to a host processor.
9. The electronic device of claim 1
wherein the first accelerometer is configured to provide fourth data in response to the second physical perturbation of the electronic device; and
wherein the first plurality of CMOS circuitry is configured to sense the fourth data from the first MEMS device and configured to output fourth sensed data.
10. The electronic device of claim 9
wherein the processor is configured to determine output data in response to a mathematical function performed upon the third sensed data and to the fourth sensed data; and
wherein the mathematical function is selected from a group consisting of:
addition, averaging, selecting, and subtracting.
11. A method for operating an electronic device comprising a first MEMS device comprising a first accelerometer, a second MEMS device comprising a second accelerometer, and a first and a second semiconductor substrate, wherein the first semiconductor substrate is disposed upon a mounting substrate, and wherein the second semiconductor substrate is disposed upon the first MEMS device, wherein the method comprises:
subjecting the first MEMS device and the second MEMS device to physical perturbations, wherein the physical perturbations comprise first physical perturbations associated with the first MEMS device and second physical perturbations associated with the second MEMS device, wherein the first physical perturbations and the second physical perturbations are substantially contemporaneous;
determining in a first plurality of CMOS circuitry formed within the first semiconductor substrate first physical perturbation data from the first MEMS device in response to the first physical perturbations;
determining in a second plurality of CMOS circuitry formed with the second semiconductor substrate second physical perturbation data from the second MEMS device in response to the second physical perturbations, wherein the second MEMS device is driven with a first driving rate;
determining whether a magnitude of the first physical perturbation data exceeds a predetermined magnitude; thereafter
subjecting the second MEMS device to third physical perturbations;
in response to determining that the magnitude of the first physical perturbation data exceeds the predetermined magnitude, driving the second MEMS device with a second driving rate and determining in the second plurality of CMOS circuitry third physical perturbation data from the second MEMS device in response to the third physical perturbations, wherein the second driving rate exceeds the first driving rate;
determining output data in response to the first physical perturbation data, to the second physical perturbation data, and to the third physical perturbation data; and
outputting the output data.
12. The method of claim 11
wherein a processor is disposed upon the mounting substrate; and
wherein the determining whether the magnitude of the first physical perturbation data exceeds the predetermined magnitude comprises determining in the processor whether the magnitude of the first physical perturbation data exceeds the predetermined magnitude.
13. The method of claim 12
wherein the first physical perturbation data is associated with a first quality value; and
wherein the second physical perturbation data is associated with a second quality value;
wherein the third physical perturbation data is associated with a third quality value; and
wherein the third quality value and the second quality value are associated with a parameter selected from a group consisting of: noise, resolution, offset, and data rate.
14. The method of claim 13
wherein determining the output data comprises selecting the third physical perturbation data as the output data.
15. The method of claim 14 wherein the outputting the output data comprising outputting the output data to a host device.
16. The method of claim 11
wherein the second semiconductor substrate comprises a second driver; and
wherein the method comprises driving with the second driver, the second MEMS device at the first driving rate.
17. The method of claim 16 wherein second drive signals, associated with determining the third physical perturbation data, and first drive signals, associated with determining the second physical perturbation data, are different and are associated with parameters selected from a group consisting of: operation frequency, power consumption mode, resolution, offset, bit rate, and data rate.
18. The method of claim 16 further comprising:
driving with the second driver, the second MEMS device at the second driving rate in response to determining that the magnitude of the first physical perturbation data exceeds the predetermined magnitude.
19. The method of claim 11 further comprising:
subjecting the first MEMS device to the third physical perturbations substantially contemporaneous with the subjecting the second MEMS device to the third physical perturbations;
determining in the first plurality of CMOS circuitry fourth physical perturbation data from the first MEMS device in response to the third physical perturbations; and
wherein the determining the output data is in response to the third physical perturbation data and to the fourth physical perturbation data.
20. The method of claim 19 wherein the determining the output data comprises mathematically processing the third physical perturbation data and the fourth physical perturbation data with a mathematical function.
21. The method of claim 20 wherein the mathematical function is selected from a group consisting of: addition, averaging, selecting, and subtracting.