Semiconductor memory device
According to one embodiment, a semiconductor memory device includes a memory cell, a sense amplifier, a first transfer transistor, a second transfer transistor, and a controller. The memory cell can store a first value and a second value. The sense amplifier amplifies the first value or the second value read from the memory cell to the sense node. The first transfer transistor has a first control terminal connected to the sense node. The second transfer transistor has a second control terminal connected to the sense node. The controller applies a backgate potential to backgate terminals of the first transfer transistor and the second transfer transistor.
1. A semiconductor memory device, comprising:
a memory cell capable of storing a first value and a second value;
a sense amplifier configured to amplify a sense node to a first read potential when the first value is read from the memory cell to the sense node, and amplify the sense node to a second read potential when the second value is read from the memory cell to the sense node;
a first transfer transistor having a first control terminal connected to the sense node and a first backgate terminal of the first control terminal, the first transfer transistor configured to transfer a first write potential to the memory cell when the sense node is at the first read potential;
a second transfer transistor having a second control terminal connected to the sense node and a second backgate terminal of the second control terminal, the second transfer transistor configured to transfer a second write potential to the memory cell when the sense node is at the second read potential; and
a controller configured to apply a first backgate potential to the first backgate terminal, and apply a second backgate potential to the second backgate terminal.
2. The device of claim 1 , wherein
the memory cell is capable of storing 2 n values (n is a natural number equal to or larger than 1) including the first value and the second value.
3. The device of claim 1 , wherein
the sense amplifier is disposed on a semiconductor substrate,
the memory cell includes a capacitor and a select transistor, the capacitor having a first electrode and a second electrode, the select transistor having a first current terminal connected to the first electrode, a second current terminal connected to the sense node, and a control terminal that controls turn-on and turn-off of a current path between the first and second current terminals, and
the current path includes an oxide semiconductor layer.
4. The device of claim 1 , wherein
the first backgate potential is different from the second backgate potential.
5. The device of claim 1 , wherein
the first backgate potential is identical to the second backgate potential.
6. A semiconductor memory device, comprising:
a memory cell capable of storing a first value and a second value;
a sense amplifier configured to amplify a sense node to a first read potential when the first value is read from the memory cell to the sense node, and amplify the sense node to a second read potential when the second value is read from the memory cell to the sense node;
a first transfer transistor having a first control terminal connected to the sense node, the first transfer transistor configured to transfer a first write potential to the memory cell via a conductive wire when the sense node is at the first read potential;
a second transfer transistor having a second control terminal connected to the sense node, the second transfer transistor configured to transfer a second write potential to the memory cell via the conductive wire when the sense node is at the second read potential;
a first switch element connected between the memory cell and the sense node;
a second switch element connected between the memory cell and the conductive wire; and
a controller configured to read the first value or the second value from the memory cell to the sense node by setting the first switch element to an on-state and setting the second switch element to an off-state.
7. The device of claim 6 , wherein
the memory cell is capable of storing 2 n values (n is a natural number equal to or larger than 1) including the first value and the second value.
8. The device of claim 6 , wherein
the sense amplifier is disposed on a semiconductor substrate,
the memory cell includes a capacitor and a select transistor, the capacitor having a first electrode and a second electrode, the select transistor having a first current terminal connected to the first electrode, a second current terminal connected to the sense node, and a control terminal that controls turn-on and turn-off of a current path between the first and second current terminals, and
the current path includes an oxide semiconductor layer.
9. The device of claim 6 , wherein
the first transfer transistor has a first backgate terminal, and the second transfer transistor has a second backgate terminal.
10. The device of claim 9 , wherein
the controller supplies a first backgate potential to the first backgate terminal, and supplies a second backgate potential to the second backgate terminal.
11. The device of claim 10 , wherein
the first backgate potential is different from the second backgate potential.
12. The device of claim 10 , wherein
the first backgate potential is identical to the second backgate potential.
13. A semiconductor memory device, comprising:
a memory cell capable of storing a first value and a second value;
a sense amplifier configured to amplify a sense node to a first read potential when the first value is read from the memory cell to the sense node, and amplify the sense node to a second read potential when the second value is read from the memory cell to the sense node;
a conductive wire connected to the memory cell;
a first N-channel transistor having a first control terminal to which a control signal is supplied, the first N-channel transistor configured to transfer a first write potential to the conductive wire;
a second N-channel transistor having a second control terminal connected to the sense node, the second N-channel transistor configured to transfer a second write potential to the conductive wire when the sense node is at the second read potential; and
a controller configured to set the first N-channel transistor to an on-state using the control signal when the sense node is at the first read potential or the second read potential.
14. The device of claim 13 , wherein
the memory cell is capable of storing 2 n value (n is a natural number equal to or larger than 1) including the first value and the second value.
15. The device of claim 13 , wherein
the sense amplifier is disposed on a semiconductor substrate,
the memory cell includes a capacitor and a select transistor, the capacitor having a first electrode and a second electrode, the select transistor having a first current terminal connected to the first electrode, a second current terminal connected to the sense node, and a control terminal that controls turn-on and turn-off of a current path between the first and second current terminals, and
the current path includes an oxide semiconductor layer.
16. The device of claim 13 , wherein
the first N-channel transistor has a first backgate terminal, and the second N-channel transistor has a second backgate terminal.
17. The device of claim 16 , wherein
the controller supplies a first backgate potential to the first backgate terminal, and supplies a second backgate potential to the second backgate terminal.
18. The device of claim 17 , wherein
the first backgate potential is different from the second backgate potential.
19. The device of claim 13 , further comprising:
a switch element connected between the memory cell and the conductive wire.
20. The device of claim 19 , wherein
the controller sets the switch element to an off-state when the first value or the second value is read from the memory cell to the sense node.