IP Library Granted Patent US 10,297,893
Granted Patent B2
US 10,297,893 · App. 15/448,566 · Granted May 21, 2019

High frequency transmission line with an open-ended stub

Inventor: Satoru Fukuchi (Chigasaki Kanagawa, JP)
Assignee: TOSHIBA MEMORY CORPORATION
H01P1/207G11C5/06
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Quick Facts
Patent No.
US 10,297,893
App. No.
15/448,566
Granted
May 21, 2019
Kind
B2
Abstract

A circuit includes a conductive layer, an insulation layer on the conductive layer, a transmission line on the insulation layer, the transmission line having a first end and a second end, and a stub on the insulation layer and having a first section of a first constant width connected to the transmission line at a location on the transmission line between the first and second ends, and a second section of a second constant width adjacent to the first section. The first constant width is less than the second constant width.

Claims (40)

1. A circuit comprising:

a first insulation layer;

a first conductive layer on the first insulation layer;

a second insulation layer on the first conductive layer;

a second conductive layer on the second insulation layer;

a third insulation layer on the second conductive layer;

a transmission line on the third insulation layer, the transmission line having a first end and a second end; and

a stub on the third insulation layer and having a first section connected to the transmission line at a location on the transmission line between the first and second ends, and a second section adjacent to the first section, wherein

the second conductive layer includes a first region made of a conductive material and a second region directly underneath the first section of the stub that is made of an insulating material, and

the conductive material is copper and the insulating material is one of silicon dioxide, silicon nitride, and high-K dielectric material.

2. The circuit of claim 1 , wherein the second conductive layer is made entirely of copper except for the second region.

3. The circuit of claim 1 , wherein the third insulation layer is made of one of glass epoxy material, silicon dioxide, silicon nitride, a high-κ dielectric material.

4. The circuit of claim 1 , further comprising a signal analysis pad connected to an open end of the second section.

5. The circuit of claim 1 , wherein the first and second sections have the same constant width.

6. The circuit of claim 5 , wherein the transmission line has a constant width that is equal to the constant width of the first and second sections.

7. The circuit of claim 1 , wherein the transmission line extends linearly along a first direction and the stub extends linearly along a second direction that is non-perpendicular with respect to the first direction.

8. The circuit of claim 1 , wherein the transmission line is a high-frequency signal transmission line configured to transmit a signal having a frequency of equal to or higher than 100 MHz.

9. The circuit of claim 8 , wherein the transmission line is configured to transmit an electrical signal.

10. The circuit of claim 9 , wherein the transmission line is made of metal.

11. An electronic device comprising:

a first insulation layer;

a first conductive layer on the first insulation layer;

a second insulation layer on the first conductive layer;

a second conductive layer on the second insulation layer;

a third insulation layer on the second conductive layer;

a memory chip provided on the third insulation layer;

a controller configured to control the memory chip;

a transmission line on the third insulation layer, the transmission line connecting the memory chip and the controller; and

a stub on the third insulation layer and having a first section connected to the transmission line at a location on the transmission line between the memory chip and the controller, and a second section adjacent to the first section, wherein

the second conductive layer includes a first region made of a conductive material and a second region directly underneath the first section of the stub that is made of an insulating material, and

the conductive material is copper and the insulating material is one of silicon dioxide, silicon nitride, and high-κ dielectric material.

12. The electronic device of claim 11 , wherein the second conductive layer is made entirely of copper except for the second region.

13. The electronic device of claim 11 , wherein the third insulation layer is made of one of glass epoxy material, silicon dioxide, silicon nitride, a high-κ dielectric material.

14. The electronic device of claim 11 , further comprising a signal analysis pad connected to an open end of the second section.

15. The electronic device of claim 11 , wherein the first and second sections have the same constant width.

16. The electronic device of claim 15 , wherein the transmission line has a constant width that is equal to the constant width of the first and second sections.

17. The electronic device of claim 11 , wherein the transmission line extends linearly along a first direction and the stub extends linearly along a second direction that is non-perpendicular with respect to the first direction.

18. The electronic device of claim 11 , wherein the transmission line is a high-frequency signal transmission line configured to transmit a signal having a frequency of equal to or higher than 100 MHz.

19. The electronic device of claim 18 , wherein the transmission line is configured to transmit an electrical signal.

20. The electronic device of claim 19 , wherein the transmission line is made of metal.

Assignments (5)
MERGER Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 14, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043194/0647 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 2, 2017
From: FUKUCHI, SATORU
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 041447/0677 →
Continuity (1)
Related Publication 20180254537A1 · Sep 6, 2018