IP Library Granted Patent US 10,355,323
Granted Patent B2
US 10,355,323 · App. 15/450,090 · Granted Jul 16, 2019

Temperature detecting apparatus

Inventors: Junya Tanigawa (Susono, JP); Takahiro Shoda (Susono, JP)
Assignee: Yazaki Corporation
H01M10/486G01K7/24H02J7/0008H02J7/0091
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Quick Facts
Patent No.
US 10,355,323
App. No.
15/450,090
Granted
Jul 16, 2019
Kind
B2
Abstract

A temperature detecting apparatus which detects a temperature of an assembled battery in which a plurality of cells are assembled, the temperature detecting apparatus includes a plurality of detecting circuits which respectively correspond to the plurality of the cells, a pair of detection lines which electrically connects the plurality of the detecting circuits in parallel, and a processing part which outputs a sine-wave detection signal to the pair of the detection lines through a voltage-dividing resistor so as to detect a temperature of each of the plurality of the cells. Each of the plurality of the detecting circuits includes a circuit in which a temperature-sensitive resistor whose electrical characteristic changes responding to a temperature, a coil and a capacitor are connected in series.

Claims (19)

1. A temperature detecting apparatus which detects a temperature of an assembled battery in which a plurality of cells are assembled, the temperature detecting apparatus comprising:

a plurality of detecting circuits which respectively correspond to the plurality of the cells,

a pair of detection lines which electrically connects the plurality of the detecting circuits in parallel, and

a processing part which outputs a sine-wave detection signal to the pair of the detection lines through a voltage-dividing resistor so as to detect a temperature of each of the plurality of the cells,

wherein each of the plurality of the detecting circuits includes a circuit in which a temperature-sensitive resistor whose electrical characteristic changes responding to a temperature, a coil and a capacitor are connected in series.

2. The temperature detecting apparatus according to claim 1 ,

wherein an inductance of the coil and a capacitance of the capacitor in each of the plurality of the detecting circuits are set so that a resonance frequency of each of the plurality of the detecting circuits is a different value from each other, and

wherein the processing part outputs the sine-wave detection signal to the pair of the detection lines on varying a frequency of the sine-wave detection signal so as to correspond to the resonance frequency of each of the plurality of the detecting circuits.

3. The temperature detecting apparatus according to claim 2 ,

wherein the processing part calculates a resistance value of the temperature-sensitive resistor in each of the detecting circuits in which the frequency of the sine-wave detection signal corresponds to the resonance frequency, based on a voltage applied to the voltage-dividing resistor, and

wherein the processing part detects the temperature of each of the plurality of the cells provided with the plurality of the detecting circuits, based on the resistance value of the temperature-sensitive resistor.

4. The temperature detecting apparatus according to claim 1 ,

wherein the temperature-sensitive resistor is a thermistor.

5. The temperature detecting apparatus according to claim 2 ,

wherein the temperature-sensitive resistor is a thermistor.

6. The temperature detecting apparatus according to claim 2 ,

wherein in each of the plurality of the detecting circuits, the inductance of the coil is set to be a common value and the capacitance of the capacitor is set to be a different value so that the resonance frequency of each of the plurality of the detecting circuits is a different value from each other.

7. The temperature detecting apparatus according to claim 2 ,

wherein in each of the plurality of the detecting circuits, the capacitance of the capacitor is set to be a common value and the inductance of the coil is set to be a different value so that a resonance frequency of each of the plurality of the detecting circuits is a different value from each other.

Assignments (2)
CHANGE OF ADDRESS Recorded Jun 5, 2023
From: YAZAKI CORPORATION
To: YAZAKI CORPORATION
Reel/Frame 063845/0802 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 8, 2017
From: TANIGAWA, JUNYA; SHODA, TAKAHIRO
To: YAZAKI CORPORATION
Reel/Frame 041500/0088 →
Priority Claims (1)
JP 2014-184074 · Sep 10, 2014 · national
Continuity (2)
Continuation PCTJP2015073233 · Aug 19, 2015
Related Publication 20170179550A1 · Jun 22, 2017