Semiconductor memory device
According to one embodiment, a semiconductor memory device comprises: first to fourth memory cells, each of which is configured to have a first resistance state or a second resistance state; and a first circuit configured to output first data based on a first signal representing a resistance state of the first memory cell and a second signal representing a resistance state of the second memory cell, output second data based on the second signal and a third signal representing a resistance state of the third memory cell, and output third data based on the third signal and a fourth signal representing a resistance state of the fourth memory cell.
1. A semiconductor memory device comprising:
first to fourth memory cells, each of which is configured to have one of a first resistance state and a second resistance state; and
a first circuit configured to:
output first data by comparing a first signal and a second signal, the first signal representing a resistance state of the first memory cell and the second signal representing a resistance state of the second memory cell,
output second data by comparing the second signal and a third signal, the third signal representing a resistance state of the third memory cell, and
output third data by comparing the third signal and a fourth signal, the fourth signal representing a resistance state of the fourth memory cell.
2. The device of claim 1 , wherein the first circuit is further configured to:
output the first data as a first logical value when the first memory cell has the first resistance state and the second memory cell has the first resistance state, or the first memory cell has the second resistance state and the second memory cell has the second resistance state and
output the first data as a second logical value when the first memory cell has the first resistance state and the second memory cell has the second resistance state, or the first memory cell has the second resistance state and the second memory cell has the first resistance state.
3. The device of claim 1 , wherein the first circuit comprises:
first and second sense amplifiers, each of which having first and second input terminals,
a first transistor which electrically couples the first memory cell and the second input terminal of the first sense amplifier,
a second transistor which electrically couples the second memory cell and the first input terminal of the first sense amplifier,
a third transistor which electrically couples the first memory cell and the first input terminal of the second sense amplifier, and
a fourth transistor which electrically couples the second memory cell and the second input terminal of the second sense amplifier.
4. The device of claim 3 , wherein a gate of the first transistor and a gate of the second transistor are electrically coupled to a first control line.
5. The device of claim 3 , wherein a gate of the third transistor and a gate of the fourth transistor are electrically coupled to a second control line.
6. The device of claim 3 , wherein:
a gate of the first transistor and a gate of the second transistor are electrically coupled to a first control line,
a gate of the third transistor and a gate of the fourth transistor are electrically coupled to a second control line, and
the first circuit applies a first voltage to the second control line after applying the first voltage to the first control line during reading.
7. The device of claim 3 , wherein:
the first sense amplifier comprises:
a fifth transistor having a first terminal electrically coupled to the first input terminal of the first sense amplifier; and
a sixth transistor having a first terminal electrically coupled to the second input terminal of the first sense amplifier, and
a gate length of the fifth transistor and a gate length of the sixth transistor are different.
8. The device of claim 3 , wherein:
the first sense amplifier comprises:
a fifth transistor having a first terminal electrically coupled to the first input terminal of the first sense amplifier; and
a sixth transistor having a first terminal electrically coupled to the second input terminal of the first sense amplifier, and
an impurity concentration of a channel of the fifth transistor and an impurity concentration of a channel of the sixth transistor are different.
9. The device of claim 3 , wherein:
the first sense amplifier comprises:
a fifth transistor having a first terminal electrically coupled to the first input terminal of the first sense amplifier; and
a sixth transistor having a first terminal electrically coupled to the second input terminal of the first sense amplifier, and
a second voltage is applied to a gate of the fifth transistor and a third voltage is applied to a gate of the sixth transistor during reading.
10. The device of claim 3 , wherein the first circuit further comprises an XOR circuit including a first input terminal electrically coupled to an output terminal of the first sense amplifier and a second input terminal electrically coupled to an output terminal of the second sense amplifier.
11. A semiconductor memory device comprising:
first and second memory cells, each of which is configured to have one of a first resistance state and a second resistance state; and
a first circuit configured to:
output a first data as a first logical value by comparing a resistance state of the first memory cell and a resistance state of the second memory cell when the first memory cell has the first resistance state and the second memory cell has the first resistance state, or the first memory cell has second resistance state and the second memory cell has the second resistance state, and
output the first data as a second logical value by comparing the resistance state of the first memory cell and the resistance state of the second memory cell when the first memory cell has the first resistance state and the second memory cell has the second resistance state, or the first memory cell has the second resistance state and the second memory cell has the first resistance state.
12. The device of claim 11 , wherein the first circuit comprises:
first and second sense amplifiers, each of which having first and second input terminals,
a first transistor that electrically couples the first memory cell and the second input terminal of the first sense amplifier,
a second transistor that electrically couples the second memory cell and the first input terminal of the first sense amplifier,
a third transistor that electrically couples the first memory cell and the first input terminal of the second sense amplifier, and
a fourth transistor that electrically couples the second memory cell and the second input terminal of the second sense amplifier.
13. The device of claim 12 , wherein a gate of the first transistor and a gate of the second transistor are electrically coupled to a first control line.
14. The device of claim 12 , wherein a gate of the third transistor and a gate of the fourth transistor are electrically coupled to a second control line.
15. The device of claim 12 , wherein:
a gate of the first transistor and a gate of the second transistor are electrically coupled to a first control line,
a gate of the third transistor and a gate of the fourth transistor are electrically coupled to a second control line, and
the first circuit applies a first voltage to the second control line after applying the first voltage to the first control line during reading.
16. The device of claim 12 , wherein:
the first sense amplifier comprises:
a fifth transistor having a first terminal electrically coupled to the first input terminal of the first sense amplifier; and
a sixth transistor having a first terminal electrically coupled to the second input terminal of the first sense amplifier, and
a gate length of the fifth transistor and a gate length of the sixth transistor are different.
17. The device of claim 12 , wherein:
the first sense amplifier comprises:
a fifth transistor having a first terminal electrically coupled to the first input terminal of the first sense amplifier; and
a sixth transistor having a first terminal electrically coupled to the second input terminal of the first sense amplifier, and
an impurity concentration of a channel of the fifth transistor and an impurity concentration of a channel of the sixth transistor are different.
18. The device of claim 12 , wherein:
the first sense amplifier comprises:
a fifth transistor having a first terminal electrically coupled to the first input terminal of the first sense amplifier; and
a sixth transistor having a first terminal electrically coupled to the second input terminal of the first sense amplifier, and
a second voltage is applied to a gate of the fifth transistor and a third voltage is applied to a gate of the sixth transistor during reading.
19. The device of claim 12 , wherein the first circuit further comprises an XOR circuit including a first input terminal electrically coupled to an output terminal of the first sense amplifier and a second input terminal electrically coupled to an output terminal of the second sense amplifier.
20. A semiconductor memory device comprising:
first and second memory cells whose resistance state is variable;
first and second sense amplifiers, each of which having first and second input terminals;
a first transistor that electrically couples the first memory cell and the second input terminal of the first sense amplifier;
a second transistor that electrically couples the second memory cell and the first input terminal of the first sense amplifier;
a third transistor that electrically couples the first memory cell and the first input terminal of the second sense amplifier; and
a fourth transistor that electrically couples the second memory cell and the second input terminal of the second sense amplifier.