Method for autocorrective writing to a multiport static random access memory device, and corresponding device
An autocorrective writing to a multiport static random access memory device is performed on at least one multiport static random access memory cell circuit. A first datum is written to the multiport static random access memory cell circuit and a second datum stored in the circuit is read from the multiport static random access memory cell subsequent to writing. The first and second data are compared. In response to the results of that comparison, an operation to rewriting the first datum to the circuit along with application of a write assist mechanism is selectively performed.
1. A method for autocorrective writing to a multiport static random access memory device that includes at least one multiport static random access memory cell circuit, the method comprising the following steps:
writing a first datum to the at least one multiport static random access memory cell circuit using a driver circuit and without application of a write assist;
reading a second datum stored in the at least one multiport static random access memory cell circuit subsequent to writing;
comparing the first and second data; and
selectively rewriting the first datum to the at least one multiport static random access memory cell circuit using said driver circuit along with application of the write assist in dependence on the result of the comparison,
wherein application of the write assist comprises applying a write assist voltage to a power supply node of the driver circuit during said rewriting.
2. The method according to claim 1 , wherein writing the first datum and reading the second datum are carried out in one and the same write clock cycle.
3. The method according to claim 1 , wherein selectively rewriting comprises not performing a rewriting of the first datum along with the application of said write assist to the at least one multiport static random access memory cell circuit if the result of the comparison indicates that the first and second data are identical.
4. The method according to claim 1 , wherein selectively rewriting comprises performing a rewriting of the first datum along with the application of said write assist to the at least one multiport static random access memory cell circuit if the result of the comparison indicates that the first and second data are different.
5. The method according to claim 1 , wherein said write assist voltage comprises a negative voltage.
6. The method according to claim 1 , wherein the multiport static random access memory device comprises a matrix plane of multiport static random access memory cells arranged in rows and columns, the columns being parallel to write bit lines, and the write assist mechanism is applied to the bit lines that are coupled to all of the cell multiport static random access memory cell circuits of one and the same column.
7. A multiport static random access memory device, comprising at least one multiport static random access memory cell circuit, comprising:
a write circuit configured to write a first datum to the at least one multiport static random access memory cell circuit through actuation of a driver circuit and without application of a write assist;
a read circuit configured to read a second datum stored in the at least one multiport static random access memory cell circuit subsequent to writing the first datum;
a comparison circuit configured to compare the first and second data;
a processing circuit configured to selectively cause the write circuit to rewrite the first datum to the at least one multiport static random access memory cell circuit through actuation of a driver circuit along with application of the write assist in dependence on the result of the comparison; and
a write assist circuit configured to apply the write assist by applying a write assist voltage to a power supply node of the driver circuit during said rewrite of the first datum.
8. The device according to claim 7 , wherein the write circuit and the read circuit are additionally configured to write the first datum and read the second datum, respectively, in one and the same write clock cycle.
9. The device according to claim 7 , wherein the processing circuit does not cause the write circuit to rewrite the first datum to the at least one multiport static random access memory cell circuit along with application of a write assist if the first and second data are identical.
10. The device according to claim 7 , wherein the processing circuit does cause the write circuit to rewrite the first datum to the at least one multiport static random access memory cell circuit along with application of a write assist if the first and second data are different.
11. The device according to claim 7 , wherein said write assist voltage is a negative voltage.
12. The device according to claim 7 , wherein said at least one multiport static random access memory cell circuit is part of a matrix plane of memory cells arranged in rows and columns, the columns being parallel to write bit lines, and said write assist mechanism is applied by the processing circuit to the bit lines of the multiport static random access memory cell circuits of one and the same column.
13. A system including at least one multiport static random access memory device with at least one multiport static random access memory cell circuit, comprising:
a write circuit configured to write a first datum to the at least one multiport static random access memory cell circuit through actuation of a driver circuit and without application of a write assist;
a read circuit configured to read a second datum stored in the at least one multiport static random access memory cell circuit subsequent to writing the first datum;
a comparison circuit configured to compare the first and second data;
a processing circuit configured to selectively cause the write circuit to rewrite the first datum to the at least one multiport static random access memory cell circuit through actuation of a driver circuit along with application of the write assist dependence on the result of the comparison; and
a write assist circuit configured to apply the write assist by applying a write assist voltage to a power supply node of the driver circuit during said rewrite of the first datum.
14. The system of claim 13 , wherein this system is a component of an electronic apparatus selected from a group consisting of: a mobile cell phone, a tablet, and a laptop computer.
15. A method for autocorrective writing to a multiport static random access memory device that includes at least one multiport static random access memory cell circuit coupled to a pair of write bit lines and at least one read bit line, the method comprising the following steps:
writing a first datum to the at least one multiport static random access memory cell circuit through actuation of driver circuitry coupled to the pair of write bit lines and without simultaneously applying a negative voltage to a supply node of the driver circuit during said writing of the first datum;
reading a second datum stored in the at least one multiport static random access memory cell circuit subsequent to writing through the at least one read bit line;
comparing the first and second data; and
if the first and second data do not match, then rewriting the first datum to the at least one multiport static random access memory cell circuit through actuation of driver circuitry coupled to the pair of write bit lines along with simultaneously applying the negative voltage to the supply node of the driver circuitry during said rewriting of the first datum.
16. The method according to claim 15 , wherein writing the first datum and reading the second datum are carried out in one and the same cycle of a write clock which controls timing of the writing of the first datum to the at least one multiport static random access memory cell circuit through the pair of write bit lines.
17. The system of claim 13 , wherein said write assist voltage is a negative voltage.
18. A multiport static random access memory device, comprising at least one multiport static random access memory cell circuit coupled to a pair of write bit lines and at least one read bit line, comprising:
a write circuit configured to write a first datum to the at least one multiport static random access memory cell circuit through driver circuitry coupled to the pair of write bit lines and without simultaneously applying a negative voltage to a supply node of the driver circuitry during said writing of the first datum;
a read circuit configured to read, subsequent to writing the first datum, a second datum stored in the at least one multiport static random access memory cell circuit through the at least one read bit line;
a comparison circuit configured to compare the first and second data; and
a processing circuit configured, if the first and second data do not match, to cause the write circuit to rewrite the first datum to the at least one multiport static random access memory cell circuit through actuation of the driver circuitry coupled to the pair of write bit lines along with simultaneously applying the negative voltage to the supply node of the driver circuitry during said rewriting of the first datum.
19. The device according to claim 18 , wherein the write circuit and the read circuit are additionally configured to write the first datum and read the second datum, respectively, in one and the same cycle of a write clock which controls timing of the writing of the first datum to the at least one multiport static random access memory cell circuit through the pair of write bit lines.