Voltage regulator having a test circuit
View Patent ↗To provide a voltage regulator which is capable of testing a phase compensation capacitor without impairing stability as a regulator and prevents a chip area from being increased. A voltage regulator is configured to be equipped with a phase compensation capacitance test circuit for a phase compensation circuit and a negative voltage detection circuit for an external output voltage adjustment terminal and to apply a negative voltage to the external output voltage adjustment terminal to thereby start up the phase compensation capacitance test circuit, and measure the discharge time or current of a phase compensation capacitor to thereby test whether the phase compensation capacitor is good or not.
1. A voltage regulator equipped with a first output terminal and a second output terminal, comprising:
a voltage division circuit connected to the second output terminal and that outputs a feedback voltage based on an output voltage;
a differential amplifier that compares a reference voltage and the feedback voltage;
an output transistor having a drain connected to the first output terminal and a source connected to a power supply voltage and outputting the output voltage from a voltage based on the power supply voltage and an output voltage of the differential amplifier input to a gate of the output transistor;
a phase compensation circuit and a phase compensation capacitance test circuit connected to an output terminal of the differential amplifier; and
a negative voltage detection circuit that outputs a detected signal when detecting that the second output terminal has a negative voltage,
wherein, in response to the detected signal of the negative voltage detection circuit, the phase compensation capacitance test circuit discharges an electric charge in a phase compensation capacitor of the phase compensation circuit to a ground terminal.
2. The semiconductor device according to claim 1 , further comprising a plurality of smaller slits extending in the first direction.
3. The semiconductor device according to claim 1 ;
wherein the second interconnect comprises a plurality of second interconnects on one side of the first interconnect, and
wherein the slit comprises a plurality of slits each along the first coupling portion between the first interconnect and the one end of each of the plurality of second interconnects.
4. The semiconductor device according to claim 1 , further comprising a third interconnect coupled to another end of the second interconnect on an opposite side to the one end.
5. The semiconductor device according to claim 1 , further comprising a VIA contact at another end of the second interconnect on an opposite side to the one end.
6. A semiconductor device, comprising:
a semiconductor substrate;
an insulating film on a surface of the semiconductor substrate;
a pad on the insulating film and having a first width in a first direction and a second width in a second direction, the second direction orthogonal to the first direction;
a second interconnect having a third width in the first direction, wherein the third width is smaller than the first width and the second width, and the second interconnect is coupled to the first interconnect at a first coupling portion between the first interconnect and one end of the second interconnect, the first coupling portion extending in the first direction; and
a slit in the pad at a location away from the first coupling portion by a length of the third width or more, and having a fourth width which is half or more of the third width in the first direction, wherein the fourth width of the slit is symmetrical with respect to the first coupling portion.
7. The semiconductor device according to claim 6 , further comprising a plurality of smaller slits in the first direction.
8. The semiconductor device according to claim 6 ;
wherein the second interconnect comprises a plurality of second interconnects on one side of the pad, and
wherein the slit comprises a plurality of slits each along the first coupling portion between the pad and the one end of each of the plurality of second interconnects.
9. The semiconductor device according to claim 6 , further comprising a third interconnect coupled to another end of the second interconnect on an opposite side to the one end.
10. The semiconductor device according to claim 6 , further comprising a VIA contact at another end of the second interconnect on an opposite side to the one end.