IP Library Granted Patent US 9,847,232
Granted Patent B1
US 9,847,232 · App. 15/468,772 · Granted Dec 19, 2017

Pattern-forming method

Inventors: Hitoshi Osaki (Sunnyvale, CA); Kristin Schmidt (San Jose, CA); Chi-Chun Liu (Albany, NY)
Assignees: JSR CORPORATION; International Business Machines Corporation
H01L21/31144G03F7/039G03F7/11G03F7/16G03F7/2004G03F7/322H01L21/31116H01L21/76802H01L21/76832
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Quick Facts
Patent No.
US 9,847,232
App. No.
15/468,772
Granted
Dec 19, 2017
Kind
B1
Abstract

A pattern-forming method includes forming a base pattern having recessed portions on a front face side of a substrate. A first composition is applied on lateral faces of the recessed portions of the base pattern, to form a coating. The first composition includes a first polymer which includes on at least one end of a main chain thereof a group capable of interacting with the base pattern. A surface of the coating is contacted with a highly polar solvent. The recessed portions are filled with a second composition. The second composition includes a second polymer which is capable of forming a phase separation structure through directed self-assembly. Phase separation is permitted in the second composition to form phases. A part of the phases is removed to form a miniaturized pattern. The substrate is etched directly or indirectly using the miniaturized pattern as a mask.

Claims (12)

1. A pattern-forming method comprising:

forming a base pattern having a recessed portions on a front face side of a substrate directly or via other layer;

applying a first composition on lateral faces of the recessed portions of the base pattern to form a coating, the first composition comprising a first polymer and a solvent, the first polymer comprising on at least one end of a main chain thereof a group capable of interacting with the base pattern;

contacting a surface of the coating with a highly polar solvent;

filling the recessed portions, after the contacting of the highly polar solvent, with a second composition comprising a second polymer and a solvent, the second polymer being capable of forming a phase separation structure through directed self-assembly;

permitting phase separation in the second composition to form phases after the filling of the second composition;

removing a part of the phases, after the phase separation, to form a miniaturized pattern; and

etching the substrate directly or indirectly using the miniaturized pattern as a mask.

2. The pattern-forming method according to claim 1 , wherein the highly polar solvent is water, methanol or ethanol.

3. The pattern-forming method according to claim 1 , wherein the second polymer is a block copolymer.

4. The pattern-forming method according to claim 3 , wherein the block copolymer is a styrene-(meth)acrylic acid ester block copolymer.

5. The pattern-forming method according to claim 1 , wherein the first polymer comprises a structural unit derived from a substituted or unsubstituted styrene.

Assignments (5)
CHANGE OF NAME Recorded Sep 22, 2025
From: JICC-02 CORPORATION
To: JSR CORPORATION
Reel/Frame 072326/0282 →
MERGER Recorded Sep 22, 2025
From: JSR CORPORATION
To: JICC-02 CORPORATION
Reel/Frame 072935/0152 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 15, 2017
From: SCHMIDT, KRISTIN; LIU, CHI-CHUN
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 043598/0769 →
CORRECTIVE ASSIGNMENT TO REMOVE 2ND & 3RD ASSIGNORS AND THE 2ND ASSIGNEE FROM THE PREVIOUS ASSIGNMENT PREVIOUSLY RECORDED ON REEL 041729 FRAME 0459. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Aug 22, 2017
From: OSAKI, HITOSHI
To: JSR CORPORATION
Reel/Frame 043576/0110 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 24, 2017
From: OSAKI, HITOSHI; SCHMIDT, KRISTIN; LIU, CHI-CHUN
To: JSR CORPORATION; INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 041729/0459 →