IP Library Patent Application 15472660
Patent Application
App. No. 15/472,660

Apparatus and Method for Measuring a Level of a Liquid

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Quick Facts
Patent No.
US None
App. No.
15/472,660
Abstract

An apparatus and method for measuring the level of a liquid. The apparatus includes an elongated probe comprising an electrically and thermally conductive material. The probe has an upper region to be disposed above the surface of the liquid, a lower region to be disposed below the surface of the liquid, and a middle region. A heater adds heat to the probe, and temperature sensors may measure the temperature of the probe in the upper and lower regions. Electrical circuitry may be used to control and receive signals from the various components and to measure the electrical resistance between a location in the upper region of the probe and a location in the lower region of the probe. The liquid level may be computed as a function of the measured values, the probe dimensions, and the known temperature dependence of the electrical resistance of the probe.

Claims (31)

1 . An apparatus for measuring the level of a liquid, comprising:

(a) an elongated probe comprising an electrically and thermally conductive material, said probe comprising an upper region to be disposed above the surface of the liquid, a lower region to be disposed below the surface of the liquid, and a middle region between the upper region and the lower region;

(b) a heater adding heat to the probe and thereby raising the average temperature along the length thereof;

(c) a temperature sensor measuring the temperature of the probe in the upper region;

(d) a temperature sensor measuring the temperature of the probe in the lower region; and

(e) electrical circuitry performing at least the functions of controlling the heater, receiving signals from the temperature sensors, and measuring the electrical resistance between a first location in the upper region of the probe and a second location in the lower region of the probe.

2 . The apparatus of claim 1 , wherein at least a portion of the probe has a generally circular cross section.

3 . The apparatus of claim 1 , wherein at least a portion of the probe is substantially helical in shape.

4 . The apparatus of claim 1 , wherein the thermally conductive material comprises a material selected from the group consisting of ceramics, polymers, metallic oxides of iron, metallic oxides of manganese, metallic oxides of copper, stainless steel, and copper.

5 . The apparatus of claim 1 , wherein the heater comprises an elongated heating element running axially through the central portion of the probe.

6 . The apparatus of claim 1 , the heater employing electrical resistance heating.

7 . The apparatus of claim 6 , wherein the heater comprises an electrical circuit channeling electrical current through the probe such that the probe itself acts as an electrical resistance heating element.

8 . The apparatus of claim 3 , the heater employing electrical resistance heating.

9 . The apparatus of claim 8 , wherein the heater comprises an electrical circuit channeling electrical current through the probe such that the probe itself acts as an electrical resistance heating element.

10 . The apparatus of claim 1 , wherein at least one of the temperature sensors comprises a thermister.

11 . The apparatus of claim 1 , wherein at least one of the temperature sensors comprises a thermocouple.

12 . The apparatus of claim 1 , wherein at least one of the temperature sensors comprises a resistance temperature detector.

13 . The apparatus of claim 1 , wherein at least one of the temperature sensors comprises a semiconductor-based temperature sensor.

14 . The apparatus of claim 1 , wherein at least one of the temperature sensors comprises a silicon bandgap temperature sensor.

15 . The apparatus of claim 1 , the electrical circuitry employing wireless connections to at least one member of the group consisting of the heater and each of the temperature sensors.

16 . The apparatus of claim 1 , the electrical circuitry further performing the function of computing the level of the liquid.

17 . A method of measuring the level of a liquid, comprising the steps of:

(a) providing an elongated probe comprising an electrically and thermally conductive material, said probe comprising an upper region to be disposed above the surface of the liquid, a lower region to be disposed below the surface of the liquid, and a middle region between the upper region and the lower region;

(b) disposing the upper region of the probe above the surface of the liquid and the lower region of the probe below the surface of the liquid;

(c) adding heat to the probe to raise the average temperature along the length thereof;

(d) measuring the temperature of the probe in the upper region and the temperature of the probe in the lower region;

(e) after electrical circuitry has determined that the difference between the measured temperature of the probe in the upper region and the measured temperature of the probe in the lower region has reached a predetermined value, measuring the electrical resistance between a first location in the upper region of the probe and a second location in the lower region of the probe;

(f) computing the level of the liquid as a function of the measured temperature of the probe in the upper region, the measured temperature of the probe in the lower region, the measured electrical resistance of the probe between the first location and the second location, the length of the probe between the first location and the second location, and the known temperature dependence of the electrical resistance of the probe between the first location and the second location.

18 . The method of claim 17 , further comprising a calibration step to characterize the temperature dependence of the electrical resistance of the probe between the first location and the second location.

19 . The method of claim 17 , further comprising an equilibration step wherein the heater is turned off and the probe is allowed a period of time for local temperature equilibration before final temperature and resistance measurements are made.

20 . The method of claim 19 , wherein the period of time allowed for local temperature equilibration is between 1 second and 10 minutes, inclusive.

Assignments (6)
PATENT CONFIRMATORY GRANT Recorded Dec 28, 2022
From: SUSTAINABLE ENERGY SOLUTIONS, INC.
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION
Reel/Frame 062231/0950 →
SECURITY INTEREST Recorded Oct 18, 2021
From: SUSTAINABLE ENERGY SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 057840/0920 →
CONFIRMATORY LICENSE Recorded Mar 27, 2020
From: SUSTAINABLE ENERGY SOLUTIONS, LLC
To: UNITED STATES DEPARTMENT OF ENERGY
Reel/Frame 052252/0675 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 22, 2019
From: FRANKMAN, DAVID
To: SUSTAINABLE ENERGY SOLUTIONS, LLC
Reel/Frame 050790/0857 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 13, 2018
From: BAXTER, LARRY
To: SUSTAINABLE ENERGY SOLUTIONS, LLC
Reel/Frame 047827/0202 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 11, 2018
From: SAYRE, AARON
To: SUSTAINABLE ENERGY SOLUTIONS, LLC
Reel/Frame 047748/0861 →