IP Library Granted Patent US 10,292,275
Granted Patent B2
US 10,292,275 · App. 15/479,858 · Granted May 14, 2019

Method of manufacturing glass substrate that has through hole, method of forming through hole in glass substrate and system for manufacturing glass substrate that has through hole

Inventor: Mamoru Isobe (Chiyoda-ku, JP)
Assignee: AGC INC.
H05K3/002H01L21/486H01L23/15H05K1/0306H05K3/0029H05K2201/09827
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Quick Facts
Patent No.
US 10,292,275
App. No.
15/479,858
Granted
May 14, 2019
Kind
B2
Abstract

A method of manufacturing a glass substrate that has a through hole, includes (1) forming an initial hole in a glass substrate by irradiating laser light from a first surface side of the glass substrate; (2) performing a first etching process using a first etching solution to form, from the initial hole, a first through hole that extends from a first opening formed at a first surface to a second opening formed at a second surface, and to make a ratio “d 1 /R t1 ” of a thickness “d 1 ” of the glass substrate with respect to a diameter “R t1 ” of the first opening to be within a range between 10 to 20; and (3) performing a second etching process to enlarge the first through hole using a second etching solution, whose etching rate with respect to the glass substrate is faster than that of the first etching solution.

Claims (28)

1. A method of manufacturing a glass substrate that has a through hole, the method comprising:

(1) forming an initial hole in a glass substrate, having first and second surfaces opposing each other, by irradiating laser light from a first surface side of the glass substrate;

(2) performing a first etching on the glass substrate using a first etching solution to form, from the initial hole, a first through hole that extends from a first opening formed at the first surface to a second opening formed at the second surface, and to make a ratio d 1 /R t1 of a thickness d 1 of the glass substrate with respect to a diameter R t1 of the first opening to be within a range of from 10 to 15.6, wherein d 1 is a thickness of the substrate after the performing of the first etching; and

(3) after the performing of the first etching (2), performing a second etching on the glass substrate to enlarge the first through hole using a second etching solution, whose etching rate with respect to the glass substrate is faster than an etching rate of the first etching solution with respect to the glass substrate,

wherein a ratio V 2 /V 1 of an etching rate V 2 of the second etching solution with respect to an etching rate V 1 of the first etching solution is at least 3.

2. The method according to claim 1 , wherein an etching rate V 1 of the first etching solution is less than or equal to 0.5 μm/minute.

3. The method according to claim 1 , wherein an etching rate V 2 of the second etching solution is from 1 μm/minute to 5 μm/minute.

4. The method according to claim 1 , wherein the thickness d 1 is less than a thickness of the glass substrate before the performing of the first etching (2).

5. The method according to claim 1 , wherein a thickness d 0 of the glass substrate before the performing the (2) is at least 0.3 mm.

6. The method according to claim 1 , wherein a thickness d 0 of the glass substrate before the performing of the first etching (2) is less than or equal to 0.5 mm.

7. The method according to claim 1 , wherein a ratio d 0 /R t0 of a thickness d 0 of the glass substrate before the performing of the first etching (2) with respect to a diameter R t0 of an opening of the initial hole at the first surface is at least 25.

8. The method according to claim 1 , wherein the initial hole formed in (1) is a through hole or a line of voids.

9. The method according to claim 1 , wherein the ratio d 1 /R t1 is from 10 to 15.

10. The method according to claim 1 , wherein the ratio d 1 /R t1 is from 13.4 to 15.6.

11. The method claim 1 ,

wherein the etching rate V 1 is an etching rate of the first etching of the glass substrate when a thickness of the substrate changes from d 0 to d 1 , wherein the thickness d 0 is a thickness of the glass substrate before the performing of the first etching, and

wherein the etching rate V 2 is an etching rate of the second etching of the glass substrate when a thickness of the substrate changes from d 1 to d 2 , wherein the thickness d 2 is a thickness of the glass substrate after the performing of the second etching.

12. A method forming a through hole in a glass substrate, the method comprising:

(1) forming an initial hole in a glass substrate, having first and second surfaces opposing each other, by irradiating laser light from a first surface side of the glass substrate;

(2) performing a first etching on the glass substrate using a first etching solution to form, from the initial hole, a first through hole that extends from a first opening formed at the first surface to a second opening formed at the second surface, and to make a ratio d 1 /R t1 of a thickness d 1 of the glass substrate with respect to a diameter R t1 of the first opening to be within a range of from 10 to 15.6, wherein d 1 is a thickness of the substrate after the performing of the first etching; and

(3) after the performing of the first etching (2), performing a second etching on the glass substrate to enlarge the first through hole using a second etching solution, whose etching rate with respect to the glass substrate is faster than an etching rate of the first etching solution with respect to the glass substrate,

wherein a ratio V 2 /V 1 of an etching rate V 2 of the second etching solution with respect to an etching rate V 1 of the first etching solution is 10 or more.

13. The method according to claim 12 , wherein an etching rate V 2 of the second etching solution is from 1 μm/minute to 5 μm/minute.

14. The method according to claim 12 , wherein the ratio d 1 /R t1 is from 10 to 15.

15. The method according to claim 12 , wherein the ratio d 1 /R t1 is from 13.4 to 15.6.

16. The method claim 12 ,

wherein the etching rate V 1 is an etching rate of the first etching of the glass substrate when a thickness of the substrate changes from d 0 to d 1 , wherein the thickness d 0 is a thickness of the glass substrate before the performing of the first etching, and

wherein the etching rate V 2 is an etching rate of the second etching of the glass substrate when a thickness of the substrate changes from d 1 to d 2 , wherein the thickness d 2 is a thickness of the glass substrate after the performing of the second etching.

Assignments (2)
CHANGE OF NAME Recorded Aug 7, 2018
From: ASAHI GLASS COMPANY, LIMITED
To: AGC INC.
Reel/Frame 046730/0786 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 5, 2017
From: ISOBE, MAMORU
To: ASAHI GLASS COMPANY, LIMITED
Reel/Frame 041861/0263 →
Priority Claims (2)
JP 2016-076743 · Apr 6, 2016 · national
JP 2017-072289 · Mar 31, 2017 · national
Continuity (1)
Related Publication 20170295652A1 · Oct 12, 2017