IP Library Granted Patent US 10,048,389
Granted Patent B1
US 10,048,389 · App. 15/491,709 · Granted Aug 14, 2018

Centroid contact radiation detector system and method

Inventors: James Francis Colaresi (Portland, CT); Kenneth Michael Yocum (Rocky Hill, CT); Aderemi Sikiru Adekola (Farmington, CT)
Assignee: MIRION TECHNOLOGIES (CANBERRA), INC.
G01T1/241
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Quick Facts
Patent No.
US 10,048,389
App. No.
15/491,709
Granted
Aug 14, 2018
Kind
B1
Abstract

A centroid contact radiation detector system/method providing for low capacitance and noise insensitivity is disclosed. The system incorporates a P-type/N-type bulk germanium volume (PGEV/NGEV) having an internal well cavity void (IWCV). The external NGEV surfaces incorporate an N+/P+ electrode and the surface of the IWCV incorporates a centrally located P+/N+ contact (CPPC). The IWCV surface is constructed and the CPPC is positioned within the IWCV so as to provide uniform symmetric field distribution within the PGEV/NGEV and improved noise immunity. The CPPC may be formed using point, reduced-area, medium-area, large-area, hemispherical, semi-hemispherical, and cylindrical annulus contact constructions. The PGEV/NGEV may be constructed using cylindrical, regular polyhedral, or spherical forms.

Claims (42)

1. A centroid contact radiation detector (CCRD) system comprising:

(a) P-type bulk germanium volume (PGEV);

(b) N+ electrode; and

(c) P+ electrode;

wherein:

said PGEV is symmetrically constructed along a central vertical longitudinal axis;

said PGEV further comprises an internal surface and an external surface;

said external surface comprises an outer surface and a cavity entry region (CER);

said PGEV further comprises an internal well cavity void (IWCV) coincident with said CER, the surface of said IWCV forming said internal surface;

said IWCV further comprises one or more side surfaces and a contact surface;

said N+ electrode is formed on said external surface; and

said P+ electrode is located on said contact surface at a geometric centroid of said PGEV.

2. The centroid contact radiation detector (CCRD) system of claim 1 wherein said PGEV forms a cylindrical annulus having a height H, external diameter D, and internal diameter I; said external surface of said PGEV forms a cylinder of said diameter D; said internal surface of said PGEV forms a cylinder of said diameter I; said P+ electrode forms a cylindrical annulus of said diameter I at a midplane of said cylindrical PGEV along a longitudinal centerline of said cylindrical PGEV; and said P+ electrode cylindrical annulus has a surface width less than or equal to 30% of said height H.

3. The centroid contact radiation detector (CCRD) system of claim 1 wherein said external surface of said PGEV forms a shape selected from a group consisting of: cylinder; dome; sphere; frustum; conic frustum; and regular polyhedron prism.

4. The centroid contact radiation detector (CCRD) system of claim 1 wherein said IWCV forms a shape selected from a group consisting of: cylinder; frustum; conic frustum; dome; and regular polyhedron prism.

5. The centroid contact radiation detector (CCRD) system of claim 1 wherein said P+ electrode forms a shape selected from a group consisting of: point contact; circular plate; hemisphere; semi-hemisphere; and cylindrical annulus.

6. The centroid contact radiation detector (CCRD) system of claim 1 wherein said P+ electrode is formed on only a portion of said internal surface.

7. The centroid contact radiation detector (CCRD) system of claim 1 wherein said N+ electrode is formed on only a portion of said external surface.

8. The centroid contact radiation detector (CCRD) system of claim 1 wherein said N+ electrode is formed on only a portion of said external surface and is adjacent to an isolation groove formed within said PGEV.

9. The centroid contact radiation detector (CCRD) system of claim 1 wherein said N+ electrode comprises an electrical contact selected from a group consisting of: implanted donor species; implanted acceptor species; diffused donor species; diffused acceptor species; surface barrier contact; amorphous semiconductor contact; metal oxide semiconductor (MOS) contact; metal insulator semiconductor (MIS) contact; Schottky barrier contacts; rectifying semiconductor contact; blocking semiconductor contact; and ohmic semiconductor contact.

10. The centroid contact radiation detector (CCRD) system of claim 1 wherein said P+ electrode comprises an electrical contact selected from a group consisting of: implanted donor species; implanted acceptor species; diffused donor species; diffused acceptor species; surface barrier contact; amorphous semiconductor contact; metal oxide semiconductor (MOS) contact; metal insulator semiconductor (MIS) contact; Schottky barrier contacts; rectifying semiconductor contact; blocking semiconductor contact; and ohmic semiconductor contact.

11. A centroid contact radiation detector (CCRD) system comprising:

(a) N-type bulk germanium volume (NGEV);

(b) P+ electrode; and

(c) N+ electrode;

wherein:

said NGEV is symmetrically constructed along a central vertical longitudinal axis;

said NGEV further comprises an internal surface and an external surface;

said external surface comprises an outer surface and a cavity entry region (CER);

said NGEV further comprises an internal well cavity void (IWCV) coincident with said CER, the surface of said IWCV forming said internal surface;

said IWCV further comprises one or more side surfaces and a contact surface;

said P+ electrode is formed on said external surface; and

said N+ electrode is located on said contact surface at a geometric centroid of said NGEV.

12. The centroid contact radiation detector (CCRD) system of claim 11 wherein said NGEV forms a cylindrical annulus having a height H, external diameter D, and internal diameter I; said external surface of said NGEV forms a cylinder of said diameter D; said internal surface of said NGEV forms a cylinder of said diameter I; said N+ electrode forms a cylindrical annulus of said diameter I at a midplane of said cylindrical NGEV along a longitudinal centerline of said cylindrical NGEV; and said N+ electrode cylindrical annulus has a surface width less than or equal to 30% of said height H.

13. The centroid contact radiation detector (CCRD) system of claim 11 wherein said external surface of said NGEV forms a shape selected from a group consisting of: cylinder; dome; sphere; frustum; conic frustum; and regular polyhedron prism.

14. The centroid contact radiation detector (CCRD) system of claim 11 wherein said IWCV forms a shape selected from a group consisting of: cylinder; frustum; conic frustum; dome; and regular polyhedron prism.

15. The centroid contact radiation detector (CCRD) system of claim 11 wherein said N+ electrode forms a shape selected from a group consisting of: point contact; circular plate; hemisphere; semi-hemisphere; and cylindrical annulus.

16. The centroid contact radiation detector (CCRD) system of claim 11 wherein said N+ electrode is formed on only a portion of said internal surface.

17. The centroid contact radiation detector (CCRD) system of claim 11 wherein said P+ electrode is formed on only a portion of said external surface.

18. The centroid contact radiation detector (CCRD) system of claim 11 wherein said P+ electrode is formed on only a portion of said external surface and is adjacent to an isolation groove formed within said NGEV.

19. The centroid contact radiation detector (CCRD) system of claim 11 wherein said P+ electrode comprises an electrical contact selected from a group consisting of: implanted donor species; implanted acceptor species; diffused donor species; diffused acceptor species; surface barrier contact; amorphous semiconductor contact; metal oxide semiconductor (MOS) contact; metal insulator semiconductor (MIS) contact; Schottky barrier contacts; rectifying semiconductor contact; blocking semiconductor contact; and ohmic semiconductor contact.

20. The centroid contact radiation detector (CCRD) system of claim 11 wherein said N+ electrode comprises an electrical contact selected from a group consisting of: implanted donor species; implanted acceptor species; diffused donor species; diffused acceptor species; surface barrier contact; amorphous semiconductor contact; metal oxide semiconductor (MOS) contact; metal insulator semiconductor (MIS) contact; Schottky barrier contacts; rectifying semiconductor contact; blocking semiconductor contact; and ohmic semiconductor contact.

Assignments (8)
SECURITY INTEREST Recorded Oct 22, 2021
From: MIRION TECHNOLOGIES (HOLDINGSUB2), LTD.; MIRION TECHNOLOGIES (USHOLDINGS), INC.; MIRION TECHNOLOGIES (US), INC.; MIRION TECHNOLOGIES (CANBERRA), INC.; MIRION TECHNOLOGIES (CONAX NUCLEAR), INC.; SUN NUCLEAR CORP.; GAMMEX, INC.; MIRION TECHNOLOGIES (IST) CORPORATION; BIODEX MEDICAL SYSTEMS, INC.; MIRION TECHNOLOGIES (CAPINTEC), INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 057890/0509 →
RELEASE OF SECURITY INTEREST Recorded Oct 22, 2021
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: MIRION TECHNOLOGIES (RADOS) GMBH; MIRION TECHNOLOGIES (CANBERRA UK) LTD.; MIRION TECHNOLOGIES (CANBERRA) SAS; MIRION TECHNOLOGIES (CANBERRA), INC.; MIRION TECHNOLOGIES (CANBERRA), INC. (F/K/A CANBERRA INDUSTRIES, INC.); MIRION TECHNOLOGIES (CANBERRA) INC. (F/K/A MIRION TECHNOLOGIES (IMAGING), LLC); MIRION TECHNOLOGIES (IST) CORPORATION; MIRION TECHNOLOGIES, INC.; BIODEX MEDICAL SYSTEMS, INC.; GAMMEX, INC.; SUN NUCLEAR CORP.
Reel/Frame 057890/0970 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (SECOND LIEN) Recorded Mar 13, 2019
From: CREDIT SUISSE AG, CAYMAN ISLANDS BRANCH
To: MIRION TECHNOLOGIES, INC.; MIRION TECHNOLOGIES (CANBERRA), INC.
Reel/Frame 048621/0409 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (FIRST LIEN) Recorded Mar 13, 2019
From: CREDIT SUISSE AG, CAYMAN ISLANDS BRANCH
To: MIRION TECHNOLOGIES, INC.; MIRION TECHNOLOGIES (CANBERRA), INC.
Reel/Frame 048580/0967 →
SECURITY AGREEMENT Recorded Mar 11, 2019
From: MIRION TECHNOLOGIES (CANBERRA), INC.; MIRION TECHNOLOGIES (IMAGING), LLC; MIRION TECHNOLOGIES (IST) CORPORATION; MIRION TECHNOLOGIES, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 048556/0421 →
FIRST LIEN GRANT OF SECURITY INTEREST Recorded Dec 7, 2017
From: MIRION TECHNOLOGIES, INC.; MIRION TECHNOLOGIES (CANBERRA), INC.
To: CREDIT SUISSE AG, CAYMAN ISLANDS BRANCH
Reel/Frame 044742/0626 →
SECOND LIEN GRANT OF SECURITY INTEREST Recorded Dec 7, 2017
From: MIRION TECHNOLOGIES, INC.; MIRION TECHNOLOGIES (CANBERRA), INC.
To: CREDIT SUISSE AG, CAYMAN ISLANDS BRANCH
Reel/Frame 044742/0658 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 17, 2017
From: COLARESI, JAMES FRANCIS; YOCUM, KENNETH MICHAEL; ADEKOLA, ADEREMI SIKIRU
To: MIRION TECHNOLOGIES (CANBERRA), INC.
Reel/Frame 042416/0650 →