IP Library Granted Patent US 10,444,031
Granted Patent B2
US 10,444,031 · App. 15/500,426 · Granted Oct 15, 2019

Sensor device

Inventors: Yoshimitsu Yanagawa (Tokyo, JP); Masahiro Matsumoto (Tokyo, JP); Satoshi Asano (Tokyo, JP); Hiroshi Nakano (Tokyo, JP); Akira Kotabe (Ibaraki, JP)
Assignee: Hitachi Automotive Systems, Ltd.
G01D3/028G05F1/569H02H1/0007H02H3/22H02M3/158G05F1/573H02H9/025H02M1/32H03K17/0822
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Quick Facts
Patent No.
US 10,444,031
App. No.
15/500,426
Granted
Oct 15, 2019
Kind
B2
Abstract

Provided is a sensor device wherein malfunction due to a negative surge is suppressed. This sensor device is provided with: a sensor element wherein electrical characteristics change corresponding to physical quantities; a signal processing circuit that processes output signals of the sensor element; a first transistor element that supplies currents to the sensor element and the signal processing circuit; a control circuit that controls a base current of the first transistor element; a power supply terminal; and a ground terminal. The sensor device is characterized in that the control circuit is provided with a limiting section that limits a current flowing from the ground terminal toward a base terminal of the first transistor element.

Claims (21)

1. A sensor device, comprising:

a sensor element whose electric characteristics vary according to a physical quantity;

a signal processing circuit for processing an output signal of the sensor element;

a first transistor element for supplying currents to the sensor element and the signal processing circuit;

a control circuit for controlling a base current of the first transistor element;

a power supply terminal; and

a ground terminal, wherein

the control circuit includes a restriction part for restricting a current flowing from the ground terminal toward a base terminal of the first transistor element, and

the first transistor element includes a first N-type well, the signal processing circuit includes a second N-type well, the sensor device includes a P-type substrate or a P-type well, and an isolation region is provided between the first N-type well and the second N-type well so that a current gain α of a parasitic bipolar transistor comprised of the first N-type well, the second N-type well, and either of the P-type substrate or the P-type well may become less than or equal to 0.5.

2. The sensor device according to claim 1 , wherein the control circuit includes a second transistor element for sending a current toward the ground terminal, the restriction part includes a diode element, and the diode element connects the base of the first transistor element with its anode and connects the second transistor element with its cathode.

3. The sensor device according to claim 1 , wherein the control circuit includes a second transistor element for sending a current toward the ground terminal, the restriction part includes a P-type field-effect transistor, a well, a gate, and a drain of the P-type field-effect transistor are connected to the second transistor element, and a source of the P-type field-effect transistor is connected to the base of the first transistor element.

4. The sensor device according to claim 1 , wherein the control circuit includes a second transistor element for sending a current toward the ground terminal, the restriction part includes an N-type field-effect transistor, a source of the N-type field-effect transistor is connected to the second transistor element, and a well, a gate, and a drain of the N-type field-effect transistor are connected to the base of the first transistor element.

5. The sensor device according to claim 1 , wherein the control circuit includes a second transistor element for sending a current toward the ground terminal, the restriction part includes an NPN transistor, an emitter of the NPN transistor is connected to the second transistor element, and a base and a collector of the NPN transistor are connected to the base of the first transistor element.

6. The sensor device according to claim 1 , wherein the control circuit includes a second transistor element for sending a current toward the ground terminal, the restriction part includes a PNP transistor, a base and a collector of the PNP transistor are connected to the second transistor element, and an emitter of the PNP transistor is connected to the base of the first transistor element.

7. The sensor device according to claim 1 , wherein the control circuit includes a second transistor element for sending a current toward the ground terminal, and the restriction part includes a resistance element for connecting a well of the second transistor element and the ground terminal.

8. The sensor device according to claim 1 ,

wherein the control circuit includes a second transistor element for sending a current toward the ground terminal, a resistance element for voltage dividing, and a switch part,

the switch part is connected between one end of the resistance element for voltage dividing and the ground terminal, and

the switch part is disconnected upon detection of impression of a negative voltage to the power supply terminal.

9. The sensor device according to claim 8 , wherein the switch part is an N-type field-effect transistor.

10. The sensor device according to claim 1 , wherein a length of the isolation region is more than or equal to 100 μm.

Assignments (2)
CHANGE OF NAME Recorded Mar 25, 2021
From: HITACHI AUTOMOTIVE SYSTEMS, LTD.
To: HITACHI ASTEMO, LTD.
Reel/Frame 056299/0447 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 30, 2017
From: YANAGAWA, YOSHIMITSU; MATSUMOTO, MASAHIRO; ASANO, SATOSHI; NAKANO, HIROSHI; KOTABE, AKIRA
To: HITACHI AUTOMOTIVE SYSTEMS, LTD.
Reel/Frame 041125/0076 →
Continuity (1)
Related Publication 20170227378A1 · Aug 10, 2017