Method and apparatus for multiple localized interferometric measurements

1. An Optical Frequency Domain Reflectometry (OFDR) interrogation system for measuring a parameter of an optical sensing light guide comprising:

an optical interferometric interrogator;

the optical sensing light guide manufactured to have one or more localized reference reflectors with at least one reference reflector being located in a segment of the optical sensing light guide between the ends of the optical sensing light guide, each reference reflector configured to produce a reference scattering event having a known scattering profile including elevated amplitude relative to scattering detected for neighboring segments of the optical sensing light guide, where each of the segments of the optical sensing light guide is a length of contiguous optical sensing light guide that is useable to initialize and perform a distributed OFDR sensing operation;

optical detection circuitry, coupled to the optical interferometric interrogator, configured to detect optical interferometric measurement signals for a length of the optical sensing light guide; and

data processing circuitry configured to:

receive interferometric measurement signals from the optical detection circuitry,

generate an interferometric measurement data set for the length of the optical sensing light guide;

isolate the interferometric measurement data set in proximity of each of the one or more reference reflectors including the at least one reference reflector;

determine an error signal from the isolated data set for each of the reference reflectors;

provide the error signal for correction of the interferometric measurement data set and/or reporting of the error signal.

2. The optical interrogation system in claim 1 , wherein the segment is a contiguous length of sensing fiber ranging in length from several centimeters to tens or hundreds of meters.

3. The optical interrogation system in claim 1 , wherein the segment does not include another reference reflector.

4. The optical interrogation system in claim 1 , wherein the known scattering profile is associated with an interference in the spectral domain of a discrete frequency proportional to a distance to a location of the reference reflector along the length of the optical sensing light guide.

5. The optical interrogation system in claim 1 , wherein the reference reflector has a length that is on the order of a measurement resolution of the interferometric measurement data set.

6. The optical interrogation system in claim 1 , wherein the error signal is determined without requiring baseline OFDR data for the optical sensing light guide.

7. The optical interrogation system in claim 1 , wherein the data processing circuitry is configured to correct the interferometric measurement data set locally for, at, or near each reference reflector with little or no a-priori knowledge of the state of the optical sensing light guide up to that point in the fiber.

8. The optical interrogation system in claim 1 , wherein each reference reflector has a spectral domain response of substantially constant magnitude and substantially increasing and substantially known variation in phase over a range of optical frequencies swept by a tunable laser source.

9. The optical interrogation system in claim 1 , wherein each reference reflector distinguishable from Rayleigh scattering and/or scattering associated with fiber Bragg gratings (FBGs).

10. The optical interrogation system in claim 1 , wherein the error signal compensates the interferometric measurement data set for time-varying perturbations such as vibration effecting the optical sensing light guide and distorting the interferometric measurement data set of the parameter of the optical sensing light guide.

11. The optical interrogation system in claim 1 , wherein the error signal compensates the interferometric measurement data set for any phenomenon that undermines an assumption that a single scattering location produces a pure frequency as a result of an OFDR swept-laser interferometry process.

12. The optical interrogation system in claim 11 , wherein the phenomenon includes non-linearity in time in an OFDR laser frequency sweep and/or, chromatic dispersion.

13. The optical interrogation system of claim 1 , wherein the data processing circuitry is configured to:

select and isolate a region of the interferometric measurement data set in the delay domain centered at a reference reflector;

transform the isolated data to the spectral domain;

extract the phase argument from the spectral domain data to produce a measurement of the reference reflectors's response; and

combine the reference reflectors known response with the measured response to produce a measured error signal.

14. The optical interrogation system of claim 1 , wherein the data processing circuitry is configured to:

measure an error signal using a reference reflector;

select and isolate a portion of the interferometric measurement data set in the delay domain to be compensated by a determined error signal;

transform the isolated portion of the interferometric measurement set from the delay domain to a spectral domain;

apply the error signal to the transformed isolated data; and

transform the compensated data to the delay domain to provide a compensated measurement data set for subsequent measurement of distributed sensor response.

15. The optical interrogation system of claim 1 , wherein the data processing circuitry is configured to:

measure an error signal for each of multiple reference reflectors along the length of the optical fiber;

divide the interferometric measurement data set in the delay domain into a number of measurement data segments equal to the number of multiple reference reflectors;

compensate each of the multiple measurement data segments by an error signal from a reference reflector located in proximity to each of the portions of measurement data; and

produce a corrected interferometric measurement data set by combining the compensated measurement data segments.

16. The optical interrogation system of claim 1 , wherein the data processing circuitry is configured to:

measure an error signal using a reference reflector;

determine a derivative of the error signal;

select a segment of the interferometric measurement data leading up to the location of the reference reflector;

perform an inverse Fourier transform on the portion of the interferometric measurement data;

resample the spectral domain response of the interferometric measurement data portion to have an optical frequency increment proportional to the derivative of the error signal for each of the data points in the interferometric measurement data portion; and

perform a Fourier Transform on the resampled spectral domain response to produce corrected interferometric measurement data that is corrected continuously over the interferometric measurement data portion.

17. An optical sensor comprising:

an optical fiber including multiple reference reflectors spaced along a length of the fiber, each of the multiple reference reflectors producing a reference scattering event having a known scattering profile including an elevated amplitude relative to scattering detected for neighboring segments of the optical fiber,

wherein each of the segments is a length of contiguous fiber that is useable to initialize and perform a distributed Optical Frequency Domain Reflectometry (OFDR) sensing operation.

18. The optical sensor in claim 17 , wherein the optical sensor is a multi-point vibration sensor configured for vibration measurement and correction at each reference reflector.

19. The optical sensor in claim 17 , wherein the reference reflectors are introduced in the optical fiber with a pulsed laser.

20. The optical sensor in claim 17 , wherein the reference reflectors are included in a core of the optical fiber with minimal damage to the cladding and/or coating of the fiber.

21. The optical sensor in claim 17 , wherein the reference reflectors are spliced into the optical fiber.

22. The optical sensor in claim 17 , wherein each of the segments ranges in length from the order of several centimeters to tens or hundreds of meters.

23. The optical sensor in claim 17 , wherein the segments do not include another reference reflector.

24. The optical sensor in claim 17 , wherein the known scattering profile is associated with an interference in a spectral domain of a discrete frequency proportional to a distance to a location of the reference reflector along the length of the optical fiber.

25. The optical sensor in claim 17 , wherein each reference reflector has a spectral domain response of substantially constant magnitude and substantially increasing and substantially known variation in phase over a range of optical frequencies swept by a tunable laser source.

26. A method in an Optical Frequency Domain Reflectometry (OFDR) interrogation system for measuring a parameter of an optical sensing light guide, comprising:

transmitting light via an optical interferometric interrogator to an optical sensing light guide manufactured to have one or more localized reference reflectors with at least one reference reflector being located in a segment of the optical sensing light guide between the ends of the optical sensing light guide;

each reference reflector producing a reference scattering event in response to the transmitted light and having a known scattering profile including elevated amplitude relative to scattering detected for neighboring segments of the optical sensing light guide, where each of the neighboring segments of the optical sensing light guide is a length of contiguous optical sensing light guide that is useable to initialize and perform a distributed OFDR sensing operation;

detecting optical interferometric measurement signals for a length of the optical sensing light guide; and

receiving interferometric measurement signals from the optical detection circuitry,

generating an interferometric measurement data set for the length of the optical sensing light guide;

isolating the interferometric measurement data set in proximity of each of the one or more reference reflectors including the at least one reference reflector;

determining a error signal from the isolated data set for each of the reference reflectors; and

providing the error signal for correction of the interferometric measurement data set and/or reporting of the error signal.

27. The method in claim 26 , wherein the error signal is determined without requiring baseline OFDR measurement data for the optical sensing light guide.

28. The method in claim 26 , further comprising correcting the interferometric measurement data set locally for, at, or near each reference reflector with little or no a-priori knowledge of the state of the optical sensing light guide up to that point in the fiber.

29. The method in claim 26 , further comprising using the error signal to compensate the interferometric measurement data set for any phenomenon that undermines an assumption that a single scattering location produces a pure frequency as a result of an OFDR swept-laser interferometry process.

30. The method in claim 26 , further comprising:

selecting and isolating a region of the interferometric measurement data set in the delay domain centered at a reference reflector;

transforming the isolated data to the spectral domain;

extracting the phase argument from the spectral domain data to produce a measurement of the reference reflector's response; and

combining the reference reflector's known response with the measured response to produce a measured error signal.

31. The method in claim 26 , further comprising:

measuring an error signal using a reference reflector;

selecting and isolating a portion of the interferometric measurement data set in a delay domain to be compensated by a determined error signal;

transforming the isolated portion of the interferometric measurement set from the delay domain to a spectral domain;

applying the error signal to the transformed isolated data; and

transforming the compensated data to the delay domain to provide a compensated measurement data set for subsequent measurement of distributed sensor response.

32. The method in claim 26 , further comprising:

measuring a error signal for each of multiple reference reflectors along the length of the optical fiber;

dividing the interferometric measurement data set in the delay domain into a number of measurement data segments equal to the number of multiple reference reflectors;

compensating each of the multiple measurement data segments by a error signal from a reference reflector located in proximity to each of the portions of measurement data;

producing a corrected interferometric measurement data set by combining the compensated measurement data segments.

33. The method in claim 26 , further comprising:

measuring a error signal using a reference reflector;

determining a derivative of the error signal;

selecting a segment of the interferometric measurement data leading up to the location of the reference reflector;

performing an inverse Fourier transform on the portion of the interferometric measurement data;

resampling the spectral domain response of the interferometric measurement data portion to have an optical frequency increment proportional to the derivative of the error signal for each of the data points in the interferometric measurement data portion;

performing a Fourier Transform on the resampled spectral domain response to produce corrected interferometric measurement data that is corrected continuously over the interferometric measurement data portion.