Silicon carbide substrate and method for manufacturing the same

1. A silicon carbide substrate having a main surface,

the main surface having a surface roughness (Ra) of less than or equal to 0.1 nm, and

vanadium, tungsten, molybdenum, platinum, nickel, titanium, zirconium, and chromium each having a concentration of less than or equal to 1.0×10 12 atoms/cm 2 in the main surface,

wherein vanadium has a concentration of more than or equal to 1.0×10 6 atoms/cm 2 in the main surface.

2. The silicon carbide substrate according to claim 1 , wherein vanadium, tungsten, molybdenum, platinum, nickel, titanium, zirconium, and chromium each have a concentration of less than or equal to 2.0×10 11 atoms/cm 2 in the main surface.

3. The silicon carbide substrate according to claim 1 , wherein potassium, sodium, calcium, iron, copper, aluminum, and tin each have a concentration of less than or equal to 1.0×10 10 atoms/cm 2 in the main surface.

4. The silicon carbide substrate according to claim 1 , having a diameter of more than or equal to 100 mm.

5. A method for manufacturing a silicon carbide substrate, comprising steps of:

preparing a silicon carbide substrate having a main surface;

polishing the main surface of the silicon carbide substrate using a polishing agent containing a metal catalyst; and

cleaning the silicon carbide substrate after the step of polishing,

the step of cleaning including a step of cleaning the silicon carbide substrate with aqua regia,

wherein

the step of cleaning further includes steps of:

cleaning the silicon carbide substrate with a sulfuric acid-hydrogen peroxide water mixture;

cleaning the silicon carbide substrate with an ammonia-hydrogen peroxide water mixture after the step of cleaning with the sulfuric acid-hydrogen peroxide water mixture, the step of cleaning with the aqua regia being performed after the step of cleaning with the ammonia-hydrogen peroxide water mixture;

cleaning the silicon carbide substrate with a hydrochloric acid-hydrogen peroxide water mixture after the step of cleaning with the aqua regia; and

cleaning the silicon carbide substrate with hydrofluoric acid after the step of cleaning with the hydrochloric acid-hydrogen peroxide water mixture.

6. The method for manufacturing the silicon carbide substrate according to claim 5 , wherein, in the step of polishing, the polishing agent contains at least one metal element selected from the group consisting of vanadium, tungsten, molybdenum, platinum, nickel, titanium, zirconium, and chromium, as the metal catalyst.

7. The method for manufacturing the silicon carbide substrate according to claim 5 , wherein a treatment time is set to more than or equal to 15 minutes in each of the steps of cleaning with the sulfuric acid-hydrogen peroxide water mixture, cleaning with the ammonia-hydrogen peroxide water mixture, cleaning with the aqua regia, cleaning with the hydrochloric acid-hydrogen peroxide water mixture, and cleaning with the hydrofluoric acid.

8. A method for manufacturing a silicon carbide substrate, comprising steps of:

preparing a silicon carbide substrate having a main surface;

polishing the main surface of the silicon carbide substrate using a polishing agent containing a metal catalyst; and

cleaning the silicon carbide substrate after the step of polishing,

the step of cleaning including a step of cleaning the silicon carbide substrate with aqua regia,

wherein the step of cleaning further includes a step of cleaning the silicon carbide substrate with an ammonia-hydrogen peroxide water mixture, the step of cleaning the silicon carbide substrate with the aqua regia being performed after the step of cleaning with the ammonia-hydrogen peroxide water mixture.

9. The method for manufacturing the silicon carbide substrate according to claim 8 , wherein a treatment time is set to more than or equal to 15 minutes in each of the steps of cleaning with the ammonia-hydrogen peroxide water mixture and cleaning with the aqua regia.

10. A method for manufacturing a silicon carbide substrate, comprising steps of:

preparing a silicon carbide substrate having a main surface;

polishing the main surface of the silicon carbide substrate using a polishing agent containing a metal catalyst; and

cleaning the silicon carbide substrate after the step of polishing,

the step of cleaning including a step of cleaning the silicon carbide substrate with aqua regia, wherein

the step of cleaning further includes steps of:

cleaning the silicon carbide substrate with a sulfuric acid-hydrogen peroxide water mixture, the step of cleaning with the aqua regia being performed after the step of cleaning with the sulfuric acid-hydrogen peroxide water mixture; and

cleaning the silicon carbide substrate with hydrofluoric acid after the step of cleaning with the aqua regia,

wherein a treatment time is set to more than or equal to 15 minutes in each of the steps of cleaning with the sulfuric acid-hydrogen peroxide water mixture, cleaning with the aqua regia, and cleaning with the hydrofluoric acid.

11. A method for manufacturing a silicon carbide substrate, comprising steps of:

preparing a silicon carbide substrate having a main surface;

polishing the main surface of the silicon carbide substrate using a polishing agent containing a metal catalyst; and

cleaning the silicon carbide substrate after the step of polishing,

the step of cleaning including a step of cleaning the silicon carbide substrate with aqua regia,

wherein, in the step of cleaning with the aqua regia, the aqua regia in a mixed solution prepared by mixing the aqua regia and ultrapure water has a volume concentration of more than or equal to 50% and less than or equal to 100%.

12. The method for manufacturing the silicon carbide substrate according to claim 5 , wherein, in the step of cleaning with the sulfuric acid-hydrogen peroxide water mixture, a volume of sulfuric acid contained in the sulfuric acid-hydrogen peroxide water mixture is more than or equal to one time and less than or equal to five times a volume of ultrapure water contained in the sulfuric acid-hydrogen peroxide water mixture, and a volume of hydrogen peroxide water contained in the sulfuric acid-hydrogen peroxide water mixture is more than or equal to one time and less than or equal to three times the volume of the ultrapure water contained in the sulfuric acid-hydrogen peroxide water mixture.

13. The method for manufacturing the silicon carbide substrate according to claim 5 , wherein, in the step of cleaning with the ammonia-hydrogen peroxide water mixture, a volume of an aqueous ammonia solution contained in the ammonia-hydrogen peroxide water mixture is more than or equal to one tenth and less than or equal to one time a volume of ultrapure water contained in the ammonia-hydrogen peroxide water mixture, and a volume of hydrogen peroxide water contained in the ammonia-hydrogen peroxide water mixture is more than or equal to one tenth and less than or equal to one time the volume of the ultrapure water contained in the ammonia-hydrogen peroxide water mixture.

14. A method for manufacturing a silicon carbide substrate, comprising steps of:

preparing a silicon carbide substrate having a main surface;

polishing the main surface of the silicon carbide substrate using a polishing agent containing a metal catalyst; and

cleaning the silicon carbide substrate after the step of polishing,

the step of cleaning including a step of cleaning the silicon carbide substrate with aqua regia,

wherein, in the step of cleaning, the silicon carbide substrate is set to have a temperature of less than or equal to 40° C.