Surface plasmon-enhanced fluorescence measurement device and surface plasmon-enhanced fluorescence measurement method

1. A surface plasmon-field enhanced fluorescence measurement apparatus equipped with a chip which includes a metal film and a diffraction grating formed in the metal film, the chip further including a ligand immobilized above the diffraction grating, the ligand being for capturing an analyte to be labeled with a fluorescent substance, the measurement apparatus detecting the presence or an amount of the analyte by irradiating the diffraction grating with excitation light, the measurement apparatus comprising:

a light source irradiating the diffraction grating with linearly polarized excitation light so that the fluorescent substance is excited by an enhanced electric field to emit fluorescence;

a rotation section controlling the direction of an optical axis of the excitation light relative to the diffraction grating in a plain view, and a polarization direction of the excitation light relative to the diffraction grating;

a polarizer isolating linearly polarized light from fluorescence emitted from the fluorescent substance; and

a light detection section detecting the linearly polarized light isolated by the polarizer.

2. The surface plasmon-field enhanced fluorescence measurement apparatus according to claim 1 , further comprising a processing section processing a detected value obtained in the light detection section, wherein

the polarizer isolates, from fluorescence emitted from the fluorescent substance when a liquid containing the fluorescent substance is present on the metal film,

first light with an angle of an oscillation direction of an electric field in the range of 0±30° relative to a plane and second light with an angle of an oscillation direction of an electric field in the range of 90±30° relative to the plane, the plane containing a normal line to a surface of the metal film and the optical axis of the excitation light, and

the polarizer isolates, from fluorescence emitted from the fluorescent substance when the analyte labeled with the fluorescent substance is captured by the ligand,

third light with an angle of an oscillation direction of an electric field in the range of 0±30° relative to the plane and fourth light with an angle of an oscillation direction of an electric field in the range of 90±30° relative to the plane;

wherein the light detection section detects the first light and the second light when the liquid containing the fluorescent substance is present on the metal film, and detects the third light and the fourth light when the analyte labeled with the fluorescent substance is captured by the ligand;

wherein the processing section calculates a difference value between a detected value of the first light and a detected value of the second light when the liquid containing the fluorescent substance is present on the metal film, and calculates a difference value between a detected value of the third light and a detected value of the fourth light when the analyte labeled with the fluorescent substance is captured by the ligand; and

wherein the rotation section, before the light detection section detects the third light and the fourth light, relatively rotates one of the optical axis of the excitation light and the diffraction grating and the polarization direction of the excitation light and the diffraction grating so that the difference value, which is calculated in the processing section, between the detected value of the first light and the detected value of the second light becomes zero.

3. The surface plasmon-field enhanced fluorescence measurement apparatus according to claim 2 , wherein the first light and the third light each have an angle of an oscillation direction of an electric field of 0° relative to the plane, and the second light and the fourth light each have an angle of an oscillation direction of an electric field of 90° relative to the plane.

4. The surface plasmon-field enhanced fluorescence measurement apparatus according to claim 1 , wherein the rotation section changes the direction of the optical axis of the excitation light relative to the diffraction grating in a plan view.

5. The surface plasmon-field enhanced fluorescence measurement apparatus according to claim 1 , wherein the rotation section changes the polarization direction of the excitation light relative to the diffraction grating in a plan view.

6. A surface plasmon-field enhanced fluorescence measurement method comprising:

a first step of preparing a chip which includes a metal film where a diffraction grating is formed in the metal film and which includes a ligand immobilized above the diffraction grating, the ligand being for capturing an analyte to be labeled with a fluorescent substance;

a second step of irradiating the diffraction grating with linearly polarized excitation light, when a liquid containing the fluorescent substance is present on the metal film, so as to generate surface plasmon resonance in the diffraction grating; detecting linearly polarized first light with an angle of an oscillation direction of an electric field in the range of 0±30° relative to a plane and linearly polarized second light with an angle of an oscillation direction of an electric field in the range of 90±30° relative to the plane, the plane containing a normal line to a surface of the metal film and an optical axis of the excitation light, the linearly polarized first light and the linearly polarized second light being contained in fluorescence emitted from the fluorescent substance; and changing a direction of the optical axis of the excitation light relative to the diffraction grating in a plan view or changing a polarization direction of the excitation light relative to the diffraction grating so that a difference value between a detected value of the first light and a detected value of the second light becomes zero;

a third step of bringing the analyte labeled with the fluorescent substance into contact with the ligand immobilized above the metal film or labeling the analyte captured by the ligand immobilized above the metal film with the fluorescent substance;

a fourth step of irradiating, after the second step and the third step, the diffraction grating with linearly polarized excitation light so as to generate surface plasmon resonance in the diffraction grating, and detecting linearly polarized third light with an angle of an oscillation direction of an electric field in the range of 0±30° relative to the plane and linearly polarized fourth light with an angle of an oscillation direction of an electric field in the range of 90±30° relative to the plane, the linearly polarized third light and the linearly polarized fourth light being contained in fluorescence emitted from the fluorescent substance; and

a fifth step of calculating a difference value between a detected value of the third light and a detected value of the fourth light.

7. The surface plasmon-field enhanced fluorescence measurement method according to claim 6 , wherein

the first light and the third light each have an angle of an oscillation direction of an electric field of 0° relative to the plane, and

the second light and the fourth light each have an angle of an oscillation direction of an electric field is 90° relative to the plane.

8. The surface plasmon-field enhanced fluorescence measurement method according to claim 6 , wherein the second step changes the direction of the optical axis of the excitation light relative to the diffraction grating in a plan view.

9. The surface plasmon-field enhanced fluorescence measurement method according to claim 6 , wherein the second step changes the polarization direction of the excitation light relative to the diffraction grating in a plan view.