Ultrasonic probe and ultrasonic diagnosis device provided with same
View Patent ↗Provided is an ultrasonic probe having an adjustable slew rate, the ultrasonic probe having minimal dimensions and circuit sizes. The ultrasonic probe includes: a transducer; a transmitting circuit; a correcting unit; and a distributing unit. The transmitting circuit includes a transducer driving unit and a current source. The transducer driving unit includes a current mirror of a low voltage transistor and a high voltage transistor. The high voltage transistor is connected to the transducer and the current source supplies an operating current to the low voltage transistor of the transducer driving unit. The correcting unit includes a transmission circuit driving unit replica, a bias unit, and an observing unit. The distributing unit transfers a signal to a current source of the transmitting circuit so that the same current value as the current value extracted by the observing unit flows.
1. An ultrasonic probe, comprising:
an ultrasonic transducer;
a transmitting circuit including a transducer driving unit and a current source, the transducer driving unit being configured with a current mirror of a first voltage transistor and a second voltage transistor, the second voltage transistor being connected to the ultrasonic transducer, the current source supplying an operating current to the first voltage transistor of the transducer driving unit;
a correcting unit including a transmission circuit driving unit replica having the same configuration as the transducer driving unit, a bias unit that constantly maintains a sum of electric currents flowing to a third voltage transistor and a fourth voltage transistor of the transmitting circuit driving unit replica, and an observing unit that copies and extracts the electric current flowing to the third voltage transistor of the transmitting circuit driving unit replica; and
a distributing unit operatively connected with the transmitting circuit with electric wiring.
2. The ultrasonic probe according to claim 1 , wherein the transmitting circuit and the correcting unit are formed on a same IC chip.
3. The ultrasonic probe according to claim 1 ,
wherein the observing unit includes a fifth voltage transistor, and
the current mirror is constituted by the fifth voltage transistor of the observing unit and the third voltage transistor of the transmitting circuit driving unit replica.
4. The ultrasonic probe according to claim 1 ,
wherein each of the distributing unit and the current source of the transmitting circuit includes a transistor, and
an output current of the observing unit is applied to a drain of the transistor of the distributing unit, and a current mirror is constituted by the transistor of the distributing unit and the transistor of the current source of the transmitting circuit.
5. The ultrasonic probe according to claim 1 , wherein the bias unit includes a seventh voltage transistor connected to the third voltage transistor of the transmitting circuit driving unit replica, an eighth voltage transistor connected to the fourth voltage transistor of the transmitting circuit driving unit replica, and a reference current source, and a bias voltage is applied to a gate of the seventh voltage transistor, a gate of the eighth voltage transistor is connected to a drain of the eighth voltage transistor, and a differential pair is constituted by the seventh voltage transistor, the eighth voltage transistor, and the reference current source.
6. The ultrasonic probe according to claim 5 , further comprising: a ninth voltage transistor that constitutes the current mirror with the third voltage transistor of the transmitting circuit driving unit replica; a tenth voltage transistor including a drain to which an electric current output from the ninth voltage transistor is applied and the drain and a gate of the tenth voltage transistor are connected; and a eleventh voltage transistor that constitutes the current mirror with the tenth voltage transistor and includes a drain which is connected to the seventh voltage transistor and the eighth voltage transistor.
7. The ultrasonic probe according to claim 1 ,
wherein an output of the distributing unit is connected to a plurality of transmitting circuits.
8. The ultrasonic probe according to claim 1 , further comprising, a slew rate setting unit between the correcting unit and the distributing unit, the slew rate setting unit setting a slew rate of a drive signal of the ultrasonic transducer on a basis of a slew rate setting signal.
9. The ultrasonic probe according to claim 8 ,
wherein the slew rate setting unit includes a variable current source, wherein an input of the variable current source is connected to an output of the observing unit, and an output of the variable current source is connected to the distributing unit.
10. An ultrasonic diagnostic device, comprising:
the ultrasonic probe according to claim 1 .