Defect reporting in application testing
View Patent ↗The present subject matter relates to defect reporting in application testing. In an implementation, a category of application testing is determined based on a testing instance of an application. The category of application testing is indicative of an aspect of the application, being tested. A list of previously reported defects associated with the determined category of application testing is displayed in a display layer over the testing instance of the application. A first user-input indicative of one of acceptance and rejection of a previously reported defect, from the list, with respect to the testing instance of the application is received. The first user-input is aggregated with previous user-inputs indicative of one of acceptance and rejection of the previously reported defect. It is determined whether the previously reported defect is irrelevant to the testing instance of the application based on the aggregation.
1. A method of defect reporting in application testing, the method comprising:
determining, by a computing device, a category of application testing based on a testing instance of an application, wherein the category of application testing is indicative of an aspect of the application being tested;
pooling, by the computing device, a plurality of previously reported defects associated with the determined category of application testing;
causing a display of a list of the pooled previously reported defects associated with the determined category of application testing in a display layer, the display layer being displayed over the testing instance of the application;
receiving, by the computing device, a first user-input indicative of one of acceptance and rejection of a previously reported defect, from the list of the pooled previously reported defects, with respect to the testing instance of the application;
aggregating, by the computing device, the first user-input with previous user-inputs indicative of one of acceptance and rejection of the previously reported defect,
determining, by the computing device, whether the previously reported defect is irrelevant to the testing instance of the application based on the aggregating; and
based on a determination that the previously reported defect is irrelevant to the testing instance of the application, removing, by the computing device, the previously reported defect from the list of the pooled previously reported defects displayed in the display layer over the testing instance of the application.
2. The method as claimed in claim 1 , wherein the aggregating comprises:
collecting, by the computing device, testing environment metadata associated with the first user-input and user comments for one of the acceptance and the rejection of the previously reported defect indicated by the first user-input; and
analyzing the testing environment metadata and the user comments associated with the first user-input, previous testing environment metadata and previous user comments associated with the previous user-inputs, and defect metadata associated with the previously reported defect.
3. The method as claimed in claim 1 , wherein the causing the display of the list of the pooled previously reported defects comprises providing defect metadata associated with each of the previously reported defects, wherein the defect metadata comprises a name of the respective previously reported defect and at least one of defect related comments, a screenshot, a defect criticality factor, defect reporting date and time, user details, defect resolving priority, and defect reporting count, associated with the respective previously reported defect.
4. The method as claimed in claim 1 , further comprising:
receiving a second user-input to increase a defect reporting count associated with a previously reported defect by one to indicate that a new defect being reported by a user is same as the previously reported defect.
5. The method as claimed in claim 1 further comprising:
receiving details of a new defect being reported by a user, wherein the receiving is through an add-defect graphic user interface displayed over the testing instance of the application, and wherein the details comprise defect metadata of the new defect; and
tagging the details of the new defect with the category of application testing.
6. The method as claimed in claim 5 , wherein the defect metadata comprises a name of the new defect, and at least one of defect related comments, a screenshot, a defect criticality factor, defect reporting date and time, user details, defect resolving priority, and defect reporting count, for the new defect.
7. The method as claimed in claim 1 , further comprising providing, by the computing device, a summary of the previously reported defects in the display layer over the testing instance of the application, wherein the summary comprises at least a number of previously reported defects and an attribute indicative of a level of criticality of resolving the previously reported defects.
8. A defect reporting system for defect reporting in application testing, the defect reporting system comprising:
a processor;
a memory on which is stored instructions that are to cause the processor to,
determine a category of application testing based on a testing instance of an application, wherein the category of application testing is indicative of an aspect of the application being tested;
pool a plurality of previously reported defects associated with the determined category of application testing;
cause a display of a list of the pooled previously reported defects associated with the determined category of application testing in a display layer, the display layer being displayed over the testing instance of the application;
receive details of a new defect being reported by a user, wherein the details of the new defect are received through an add-defect graphic user interface displayed over the testing instance of the application, and wherein the details comprise defect metadata of the new defect;
tag the details of the new defect with the category of application testing; and
add the new defect in the display of the list of the pooled previously reported defects displayed in the display layer over the testing instance of the application.
9. The defect reporting system as claimed in claim 8 , wherein the defect metadata of the new defect comprises a name of the new defect and at least one of defect related comments, a screenshot, a defect criticality factor, defect reporting date and time, user details, defect resolving priority, and defect reporting count, for the new defect.
10. The defect reporting system as claimed in claim 8 , wherein the instructions are further to cause the processor to display defect metadata associated with each of the previously reported defects, wherein the defect metadata comprises a name of the respective previously reported defect and at least one of defect related comments, a screenshot, a defect criticality factor, defect reporting date and time, user details, defect resolving priority, and defect reporting count, associated with the respective previously reported defect.
11. The defect reporting system as claimed in claim 8 , wherein the instructions are further to cause the processor to,
receive a user-input indicative of one of acceptance and rejection of a previously reported defect, from the list of previously reported defects, with respect to the testing instance of the application;
collect testing environment metadata associated with the user-input and user comments for one of the acceptance and the rejection of the previously reported defect indicated by the user-input;
analyze the testing environment metadata and the user comments associated with the user-input, previous testing environment metadata and previous user comments associated with previous user-inputs, and defect metadata associated with the previously reported defect, to determine whether the previously reported defect is irrelevant to the testing instance of the application, wherein the previous user-inputs are indicative of one of acceptance and rejection of the previously reported defect; and
remove the previously reported defect from the list when the previously reported defect is determined to be irrelevant to the testing instance of the application based on the analysis.
12. The defect reporting system as claimed in claim 8 , wherein the instructions are further to cause the processor to cause a display of a summary of the previously reported defects in the display layer over the testing instance of the application, wherein the summary comprises at least a number of previously reported defects and an attribute indicative of a level of criticality of resolving the previously reported defects.
13. A non-transitory computer-readable medium comprising computer readable instructions for defect reporting in application testing, executable by a processing resource of a computing device to:
determine a category of application testing based on a testing instance of an application, wherein the category of application testing is indicative of an aspect of the application being tested;
pool a plurality of previously reported defects associated with the determined category of application testing;
cause a display of a list of the pooled previously reported defects associated with the determined category of application testing in a display layer, the display layer being displayed over the testing instance of the application;
receive a user-input indicative of one of acceptance and rejection of a previously reported defect, from the list of previously reported defects, with respect to the testing instance of the application;
aggregate the first user-input with previous user-inputs indicative of one of acceptance and rejection of the previously reported defect;
determine whether the previously reported defect is irrelevant to the testing instance of the application based on the aggregation; and
based on a determination that the previously reported defect is irrelevant to the testing instance of the application, remove the previously reported defect from the list of the pooled previously reported defects displayed in the display layer over the testing instance of the application.
14. The non-transitory computer-readable medium as claimed in claim 13 comprising computer readable instructions executable by the processing resource to:
collect testing environment metadata associated with the user-input and user comments for one of the acceptance and the rejection of the previously reported defect indicated by the user-input; and
analyze the testing environment metadata and the user comments associated with the user-input, previous testing environment metadata and previous user comments associated with the previous user-inputs, and defect metadata associated with the previously reported defect, in the aggregation of the user-input with the previous user-inputs.