IP Library Granted Patent US 10,451,673
Granted Patent B2
US 10,451,673 · App. 15/561,761 · Granted Oct 22, 2019

Electronic component carrying device and electronic component inspection device

Inventors: Daisuke Kirihara (Azumino, JP); Masami Maeda (Suwa, JP)
Assignee: Seiko Epson Corporation
G01R31/2891G01R31/2881G01R31/2862G01R31/2893
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Quick Facts
Patent No.
US 10,451,673
App. No.
15/561,761
Granted
Oct 22, 2019
Kind
B2
Abstract

An inspection device includes: one chamber in which an IC device after an inspection can be arranged; another chamber in which the IC device after the inspection can be arranged and which is different from the one chamber; and a tray on which the electronic component after the inspection can be placed and which can move with the IC device from the one chamber to the another chamber. Also, the inspection device can detect at least one of humidity and temperature in the another chamber.

Claims (34)

1. An electronic component carrying device comprising:

a first chamber in which an electronic component is arranged;

a second chamber in which the electronic component is arranged and which is different from the first chamber; and

a placing unit on which the electronic component is placed so that the electronic component is moved from the first chamber to the second chamber when a controller determines that a predetermined time has passed after the electronic component is placed inside the first chamber,

wherein the second chamber maintains a humidity in a range of 0 to 20% and a temperature in a range of 10 to 35° C.

2. The electronic component carrying device according to claim 1 , further comprising:

a first open and close door which is provided between the first chamber and the second chamber and which switches between a circulation state where air circulates between the first chamber and the second chamber and a non-circulation state where the circulation of the air is less than the circulation state.

3. The electronic component carrying device according to claim 2 ,

wherein the circulation of the air between the first chamber and the second chamber is cut off in the non-circulation state.

4. The electronic component carrying device according to claim 2 ,

wherein a second open and close door, which is arranged at a different position from the first open and close door and which is configured to perform the circulation of the air between the second chamber and an outside of the electronic component carrying device, is formed in the second chamber.

5. The electronic component carrying device according to claim 4 ,

wherein the second open and close door opens and closes by swinging or sliding.

6. The electronic component carrying device according to claim 4 ,

wherein the second open and close door is installed at an opening provided in a wall between the first chamber and the second chamber, and

the second open and close door is configured to adjust a size of the opening.

7. The electronic component carrying device according to claim 4 ,

wherein the controller controls a period of time during which the second open and close door is open.

8. The electronic component carrying device according to claim 1 ,

wherein the placing unit is configured with a plurality of the placing units, and

wherein a staying time of the placing unit in the second chamber is measured beginning from a reference time in which all of the plurality of the placing units is placed in the second chamber.

9. The electronic component carrying device according to claim 1 ,

wherein when at least one of the humidity and the temperature in the second chamber meets a predetermined condition, the semiconductor component on the placing unit is moved from the first chamber to the second chamber.

10. The electronic component carrying device according to claim 1 ,

wherein an air pressure in the second chamber is equal to or below an air pressure in the first chamber, and

the air pressure in the second chamber is equal to or above an atmospheric pressure.

11. The electronic component carrying device according to claim 1 ,

wherein a predetermined inspection has been conducted on the electronic component before the electronic component is arranged in the first chamber.

12. An electronic component inspection device comprising:

a first chamber in which an electronic component is arranged;

a second chamber in which the electronic component is arranged and which is different from the first chamber;

a placing unit on which the electronic component is placed so that the electronic component is moved from the first chamber to the second chamber when a controller determines that a predetermined time has passed after the electronic component is placed inside the first chamber; and

an inspection unit which inspects the electronic component,

wherein the second chamber maintains a humidity in a range of 0 to 20% and a temperature in a range of 10 to 35° C.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 9, 2021
From: SEIKO EPSON CORPORATION
To: NS TECHNOLOGIES, INC.
Reel/Frame 056479/0775 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 26, 2017
From: KIRIHARA, DAISUKE; MAEDA, MASAMI
To: SEIKO EPSON CORPORATION
Reel/Frame 043704/0288 →
Priority Claims (1)
JP 2015-068261 · Mar 30, 2015 · national
Continuity (1)
Related Publication 20180080982A1 · Mar 22, 2018