IP Library Granted Patent US 10,511,418
Granted Patent B2
US 10,511,418 · App. 15/565,674 · Granted Dec 17, 2019

Measurement method in carrier aggregation and asynchronous dual connectivity

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Quick Facts
Patent No.
US 10,511,418
App. No.
15/565,674
Granted
Dec 17, 2019
Kind
B2
Abstract

An apparatus of a base station, comprising: a controller to configure a first measurement gap pattern with a first measurement gap repetition period (MGRP) for a first receive (Rx) chain of a user equipment (UE); and configure a second measurement gap pattern with a second measurement gap repetition period (MGRP) for a second receive (Rx) chain of the UE, wherein the first MGRP is different from the second MGRP. The apparatus may configure the measurement gap patterns to support carrier aggregation and/or dual connectivity.

Claims (30)

1. An apparatus of a base station, comprising:

a controller to:

configure a first measurement gap pattern with a first measurement gap repetition period (MGRP) for a first receive (Rx) chain of a user equipment (UE);

configure one or more gaps in addition to measurement gaps of the first measurement gap pattern for the first Rx chain; and

configure a second measurement gap pattern with a second MGRP for a second Rx chain of the UE, wherein the first MGRP is different from the second MGRP; and

a transmitter, coupled to the controller, to transmit the first measurement gap pattern and the second measurement gap pattern to the UE.

2. The apparatus of the base station of claim 1 , wherein individual measurement gaps of the one or more gaps each have a gap length shorter than a gap length of measurement gaps of the first measurement gap pattern.

3. The apparatus of the base station of claim 2 , wherein a measurement gap of the first measurement gap pattern is to start or end in a first subframe having an index and the controller is further to: configure a first measurement gap of the one or more gaps within a second subframe having the index.

4. The apparatus of the base station of claim 1 wherein the one or more gaps include a plurality of measurement gaps between consecutive measurement gaps of the first measurement gap pattern.

5. The apparatus of the base station of claim 1 , wherein the controller is further to: configure the one or more gaps based on an arrival time difference between the first Rx chain and the second Rx chain.

6. The apparatus of the base station of claim 5 , wherein the controller is further to: configure a first measurement gap of the one or more gaps in a first subframe of the first Rx chain, wherein the first subframe is concurrent with a front boundary of a measurement gap of the second Rx chain.

7. The apparatus of the base station of claim 6 , wherein the controller is to configure the first measurement gap to support asynchronous dual connectivity.

8. The apparatus of the base station of claim 6 , wherein the controller is further to: configure a second measurement gap in the one or more gaps in a second subframe with an index of n+1 or n+5 of the first Rx chain, wherein n represents an index of the first subframe, in response to the arrival time difference being less than 500 us.

9. The apparatus of the base station of claim 6 , wherein the controller is further to: configure a second measurement gap in the one or more gaps in a second subframe with an index of n+5 or n+6 of the first Rx chain, wherein n represents an index of the first subframe, in response to the arrival time difference being not less than 500 us.

10. The apparatus of the base station of claim 1 , wherein the controller is further to: configure the one or more gaps with a periodic gap having a periodicity of N ms, wherein N is to have a value more than 5.

11. The apparatus of the base station of claim 10 , wherein the controller is further to: configure a second measurement gap for the second Rx chain based on the periodic gap of the first Rx chain.

12. The apparatus of the base station of claim 11 , wherein the controller is further to: configure a measurement of the second Rx chain in one or more subframes after the periodic gap.

13. The apparatus of the base station of claim 1 , wherein the controller is further to: configure the one or more gaps with a periodic gap having a periodicity of N ms, wherein N is to have a value of 40.

14. The apparatus of the base station of claim 1 , wherein the controller is further to: configure a second measurement gap for the second Rx chain based on a periodic gap of the first Rx chain.

15. The apparatus of the base station of claim 14 , wherein the controller is further to: configure measurement of the second Rx chain in one or more subframes after the periodic gap.

16. A user equipment (UE), comprising:

a receiver to receive configuration information to configure a first measurement gap pattern with a first MGRP for a first receive (Rx) chain of the UE; a short-gap pattern for one or more gaps in addition to measurement gaps of the first measurement gap pattern for the first Rx chain; and a second measurement gap pattern with a second MGRP for a second receive (Rx) chain of the UE, wherein the first MGRP is different from the second MGRP; and

a controller to set up measurement gaps based on the first measurement gap pattern, the short-gap pattern, and the second measurement gap pattern.

17. The UE of claim 16 , wherein individual measurement gaps of the short-gap pattern each have a gap length shorter than the measurement gaps of the first measurement gap pattern.

18. The UE of claim 17 , wherein the controller is further to: set up a first measurement gap of the first measurement gap pattern to start or end in a first subframe having a first index: and set up a first measurement gap of the short-gap pattern within a second subframe having the first index.

19. The UE of claim 18 , wherein the controller is further to: set up the first measurement gap of the first measurement gap pattern to start in the first subframe; set up a second measurement gap pattern of the first measurement gap pattern to end in a third subframe having a second index; and set up a second measurement gap of the short-gap pattern within a fourth subframe having the second index.

20. The UE of claim 16 , wherein the controller is further to: set the measurement gaps based on an arrival time difference between the first Rx chain and the second Rx chain.

21. The UE of claim 16 , wherein the controller is further to: configure a first measurement gap of the short-gap pattern in a subframe of the first Rx chain, wherein the subframe is concurrent with a front boundary of a second measurement gap of the second Rx chain.

22. The UE of claim 20 , wherein the controller is further to: set up a first measurement gap of the short-gap pattern in a first subframe of the first Rx chain, wherein the subframe is concurrent with a front boundary of a second measurement gap of the second Rx chain to support an asynchronous dual connectivity.

23. The UE of claim 22 , wherein the controller is further to: set up a subsequent measurement gap of the short-gap pattern in a second subframe with an index of n+1 or n+5 of the first Rx chain, wherein n represents an index of the first subframe, in response to the arrival time difference being less than 500 us.

Assignments (3)
CONFIRMATORY ASSIGNMENT Recorded Jul 17, 2020
From: INTEL IP CORPORATION
To: INTEL CORPORATION
Reel/Frame 053236/0805 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 25, 2020
From: INTEL CORPORATION
To: APPLE INC.
Reel/Frame 053066/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 24, 2017
From: TANG, YANG; HUANG, RUI
To: INTEL IP CORPORATION
Reel/Frame 043939/0624 →