IP Library Granted Patent US 10,597,794
Granted Patent B2
US 10,597,794 · App. 15/593,938 · Granted Mar 24, 2020

High purity polymer derived 3C SiC, methods compositions and applications

Inventors: Mark S. Land (Houston, TX); Ashish P. Diwanji (New Albany, OH); Andrew R. Hopkins (Sylvania, OH); Walter J. Sherwood (Glenville, NY); Douglas M. Dukes (Troy, NY); Glenn Sandgren (Boston, MA); Brian L. Benac (Hadley, NY)
Assignee: Pallidus, Inc.
C30B23/00C01B32/956C04B35/56C04B35/5603C04B35/571C04B35/806C08G77/20C08G77/50C08L83/00C08L83/04C30B23/025C30B29/06C30B29/36H01L21/0262H01L21/02378H01L21/02381H01L21/02529H01L29/1608H01L29/66068H01L29/66893C04B2235/3418C04B2235/3826C04B2235/44C04B2235/48C04B2235/483C04B2235/528C04B2235/5427C04B2235/5436C04B2235/6581C04B2235/72C04B2235/77C04B2235/96C08G77/12C08G77/80
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,597,794
App. No.
15/593,938
Granted
Mar 24, 2020
Kind
B2
Abstract

Organosilicon chemistry, polymer derived ceramic materials, and methods. Such materials and methods for making polysilocarb (SiOC) and Silicon Carbide (SiC) materials having 3-nines, 4-nines, 6-nines and greater purity. Processes and articles utilizing such high purity SiOC and SiC.

Claims (21)

1. A SiC boule for use as a semiconductor, the SiC boule consisting essentially of 3C—SiC, the 3C—SiC formed by the steps comprising: curing of a liquid SiOC precursor formulation to form a cured SiOC solid material having a purity of at least 99.999%; pyrolyzing the SiOC solid material to form SiC particles having a purity of at least 99.999%; and, vapor deposition of the SiC particles, at a temperature from about 1,300 to about 1,700° C., to form a boule consisting essentially of 3C SiC and a purity of at least 99.999%.

2. The SiC boule of claim 1 , wherein the purity of the SiC particles is at least 99.9999% and the purity of the 3C SiC boule is at least 99.9999%.

3. A light-emitting diode comprising a portion of the SiC boule of claim 2 .

4. The SiC boule of claim 1 , wherein the purity of the SiC particles is at least 99.99999% and the purity of the 3C SiC boule is at least 99.99999%.

5. A light-emitting diode comprising a portion of the SiC boule of claim 4 .

6. A light-emitting diode comprising a portion of the SiC boule of claim 1 .

7. The boule of claim 1 , having a diameter from about 3 inches to about 8 inches.

8. The SiC boule of claim 1 , having a stacking sequence consisting essentially of the sequence ABCABC.

9. The SiC boule of claim 1 which is sectioned into a wafer.

10. The SiC wafer of claim 9 , wherein the purity of the SiC particles is at least 99.9999% and the purity of the 3 C SiC wafer is at least 99.9999%.

11. A light emitting diode comprising a portion of the SiC wafer of claim 10 .

12. The SiC wafer of claim 9 , wherein the purity of the SiC particles is at least 99.99999% and the purity of the 3 C SiC wafer is at least 99.99999%.

13. A light emitting diode comprising a portion of the SiC wafer of claim 12 .

14. A light emitting diode comprising a portion of the SiC wafer of claim 9 .

15. A method of making a 3C—SiC, the method comprising:

a. placing polymer derived SiC particles in a vapor deposition apparatus, wherein the SiC particles have a purity of at least 99.999%; and,

b. directly vaporizing the polymer derived SiC particles and depositing the vapors on a target to form 3 C crystalline SiC; wherein the vaporization occurs without the need for a preheating step of the SiC.

16. The method of claim 15 , wherein the 3 C crystalline SiC is a single crystal SiC boule.

17. The method of claim 16 , wherein the single crystal SiC boule is sectioned and etched and thereby manufactured into a semiconductor device.

18. The method of claim 17 , comprising incorporating the semiconductor device in a light-emitting diode; wherein the semiconductor device is operably incorporated into the light-emitting diode.

19. The method of claim 15 , wherein the 3 C crystalline SiC is a single crystal SiC layer.

Assignments (3)
SECURITY INTEREST Recorded Jan 10, 2025
From: PALLIDUS, INC.
To: R&R PALLIDUS HOLDINGS II LLC, AS ADMINISTRATIVE AGENT
Reel/Frame 069818/0486 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 24, 2020
From: SANDGREN, GLENN; DIWANJI, ASHISH P.; HOPKINS, ANDREW R.; SHERWOOD, WALTER J.; DUKES, DOUGLAS M.; LAND, MARK S.; BENAC, BRAIN L.
To: MELIOR INNOVATIONS, INC.
Reel/Frame 051610/0382 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 1, 2018
From: MELIOR INNOVATIONS, INC.
To: PALLIDUS, INC.
Reel/Frame 045685/0773 →
Continuity (12)
Continuation 14864539 · Sep 24, 2015
Continuation In Part 14268150 · May 2, 2014
Continuation In Part 14634814 · Feb 28, 2015
Continuation In Part 14212896 · Mar 14, 2014
Provisional Application 62055397 · Sep 25, 2014
Provisional Application 62055461 · Sep 25, 2014
Provisional Application 62055497 · Sep 25, 2014
Provisional Application 62112025 · Feb 4, 2015
Provisional Application 61818906 · May 2, 2013
Provisional Application 61818981 · May 3, 2013
Provisional Application 61946598 · Feb 28, 2014
Related Publication 20180066379A1 · Mar 8, 2018