IP Library Granted Patent US 10,755,866
Granted Patent B2
US 10,755,866 · App. 15/614,975 · Granted Aug 25, 2020

Graphene-semiconductor based wavelength selective photodetector for sub-bandgap photo detection

Inventors: Jinyao Tang (Hong Kong, CN); Ze Xiong (Hong Kong, CN); Jiawei Chen (Hong Kong, CN)
Assignee: The University of Hong Kong
H01G9/2059G01J1/44G03F7/0042G03F7/2059H01G9/0029H01G9/209H01G9/2045H01G9/2095H01L51/0003H01L51/0097H01L51/426H01L51/428H01L51/447H01L51/448Y02P70/521
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Quick Facts
Patent No.
US 10,755,866
App. No.
15/614,975
Granted
Aug 25, 2020
Kind
B2
Abstract

Graphene photodetectors capable of operating in the sub-bandgap region relative to the bandgap of semiconductor nanoparticles, as well as methods of manufacturing the same, are provided. A photodetector can include a layer of graphene, a layer of semiconductor nanoparticles, a dielectric layer, a supporting medium, and a packaging layer. The semiconductor nanoparticles can be semiconductors with bandgaps larger than the energy of photons meant to be detected.

Claims (19)

1. A photodetector comprising:

a supporting medium;

a layer of graphene on the supporting medium; and

a layer of semiconductor nanoparticles in direct, physical contact with the layer of graphene,

wherein the semiconductor nanoparticles are semiconductors with bandgaps larger than the energy of photons intended to be detected by the photodetector, and

wherein the semiconductor nanoparticles are silver halide nanoparticles.

2. The photodetector of claim 1 , wherein the layer of semiconductor nanoparticles is on the layer of graphene.

3. The photodetector of claim 1 , wherein the layer of semiconductor nanoparticles is under the layer of graphene.

4. The photodetector of claim 1 , wherein the layer of semiconductor nanoparticles is mixed in with the layer of graphene.

5. The photodetector of claim 1 , wherein the graphene is chemical vapor deposition grown, liquid exfoliated, or mechanically exfoliated.

6. The photodetector of claim 1 , wherein the diameter of the semiconductor nanoparticles is from the nanometer range to the micrometer range.

7. The photodetector of claim 1 , wherein the semiconductor nanoparticles are AgCl nanoparticles, with Eg=3.25 eV, which detect photons with energy of less than 3.25 eV.

8. The photodetector of claim 1 , wherein the semiconductor nanoparticles are sensitized by organic or inorganic dyes so as to modulate their properties.

9. The photodetector of claim 1 , wherein the supporting medium is one or more of quartz, thermal oxidized Si, sapphire, silicon carbide, aluminum nitride, polydimethylsiloxane, and a flexible plastic substrate.

10. The photodetector of claim 8 , wherein the supporting medium is integrated with a photonic structure to modulate the performance of the device, wherein the photonic structure is a micro cavity, a waveguide, or a metal plasmonic structure.

11. The photodetector of claim 1 , wherein the thickness of the supporting medium is modulated to achieve selective enhancement of photodetection.

12. A method of performing flexible and transparent optoelectronics for imaging, spectroscopy, sensing, or optical communications, the method comprising:

providing a photodetector according to claim 1 ; and

using the photodetector to detect photons having an energy smaller than the bandgaps of the semiconductor nanoparticles.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 20, 2017
From: TANG, JINYAO; XIONG, ZE; CHEN, JIAWEI
To: THE UNIVERSITY OF HONG KONG
Reel/Frame 043268/0244 →
Continuity (2)
Provisional Application 62346706 · Jun 7, 2016
Related Publication 20170352492A1 · Dec 7, 2017