IP Library Granted Patent US 10,117,571
Granted Patent B2
US 10,117,571 · App. 15/627,077 · Granted Nov 6, 2018

Fast absolute-reflectance method for the determination of tear film lipid layer thickness

Inventors: Stanley W. Huth (Newport Beach, CA); Denise Tran (Irvine, CA)
Assignee: Johnson & Johnson Surgical Vision, Inc.
A61B3/101A61B3/0025G01B11/06G01J3/45
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,117,571
App. No.
15/627,077
Granted
Nov 6, 2018
Kind
B2
Abstract

A method for determining reflectivity of a tear film lipid layer of a patient and recommending a course of treatment based on the same. The method includes the steps of: measuring a tear film aqueous plus lipid layer relative reflectance spectrum using a wavelength-dependent optical interferometer; converting the measured tear film aqueous plus lipid layer relative reflectance spectrum to a calculated absolute reflectance spectrum; comparing the calculated absolute reflectance spectrum to a theoretical absolute lipid reflectance spectrum to determine a tear film lipid layer thickness; and determining a reflectivity value for the tear film lipid layer thickness at a first wavelength of light corresponding to ultraviolet, violet, or blue light.

Claims (21)

1. A method of determining tear film lipid layer thickness, comprising the steps of:

measuring a tear film aqueous plus lipid layer relative reflectance spectrum using a wavelength-dependent optical interferometer;

converting the measured tear film aqueous plus lipid layer relative reflectance spectrum to a calculated absolute reflectance spectrum;

iteratively comparing the calculated absolute reflectance spectrum to a plurality of theoretical absolute reflectance lipid spectra to generate a tear film lipid layer thickness estimate;

determining a standard error for the tear film lipid layer thickness estimate; and

identifying a correct lipid layer thickness based on the standard error.

2. The method of claim 1 , wherein identifying the correct lipid layer thickness based on the standard error comprises identifying the correct lipid layer thickness when the standard error is minimized.

3. The method of claim 1 , wherein identifying the correct lipid layer thickness based on the standard error comprises identifying the correct lipid layer thickness when the standard error is less than 0.1.

4. The method of claim 1 , wherein iteratively comparing the calculated absolute reflectance spectrum to the plurality of theoretical absolute reflectance lipid spectra comprises minimizing a sum of least squares differences between the calculated absolute reflectance spectrum and the plurality of theoretical absolute reflectance lipid spectra.

5. The method of claim 1 , wherein iteratively comparing the calculated absolute reflectance spectrum to the plurality of theoretical absolute reflectance lipid spectra comprises starting the iteration using a first lipid layer thickness value estimate.

6. The method of claim 5 , wherein the first lipid layer thickness value estimate is 65 nm.

7. The method of claim 5 , wherein, if the standard error is greater than 0.1, the method further comprises restarting the iteration using a second lipid layer thickness value estimate different from the first lipid layer thickness value estimate.

8. A method of determining tear film lipid layer thickness, comprising the steps of:

measuring a tear film aqueous plus lipid layer relative reflectance spectrum using a wavelength-dependent optical interferometer;

converting the measured tear film aqueous plus lipid layer relative reflectance spectrum to a measured lipid layer relative reflectance spectrum;

converting the measured lipid layer relative reflectance spectrum to a calculated absolute reflectance spectrum; and

iteratively comparing the calculated absolute reflectance spectrum to a plurality of theoretical absolute reflectance lipid spectra to generate a tear film lipid layer thickness estimate.

9. The method of claim 8 , wherein iteratively comparing the calculated absolute reflectance spectrum to the plurality of theoretical absolute reflectance lipid spectra comprises minimizing a sum of least squares differences between the calculated absolute reflectance spectrum and the plurality of theoretical absolute reflectance lipid spectra.

10. The method of claim 8 , wherein iteratively comparing the calculated absolute reflectance spectrum to the plurality of theoretical absolute reflectance lipid spectra comprises starting the iteration using a first lipid layer thickness value estimate.

11. The method of claim 10 , wherein the first lipid layer thickness value estimate is 65 nm.

12. The method of claim 10 , wherein, if the standard error is greater than 0.1, the method further comprises restarting the iteration using a second lipid layer thickness value estimate different from the first lipid layer thickness value estimate.

Assignments (3)
CHANGE OF NAME Recorded Sep 18, 2018
From: ABBOTT MEDICAL OPTICS INC.
To: JOHNSON & JOHNSON SURGICAL VISION, INC.
Reel/Frame 047101/0584 →
CHANGE OF NAME Recorded Aug 3, 2018
From: ABBOTT MEDICAL OPTICS INC.
To: JOHNSON & JOHNSON SURGICAL VISION, INC.
Reel/Frame 046704/0651 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 19, 2017
From: HUTH, STANLEY W.; TRAN, DENISE
To: ABBOTT MEDICAL OPTICS INC.
Reel/Frame 042751/0097 →
Continuity (4)
Division 14831678 · Aug 20, 2015
Continuation In Part 14298176 · Jun 6, 2014
Continuation In Part 14298036 · Jun 6, 2014
Related Publication 20170280992A1 · Oct 5, 2017