Chevron interconnect for very fine pitch probing
An apparatus an apparatus comprising: a substrate having a plane; and an array of at least one conductive probe having a base affixed to the substrate, the at least one conductive probe having a major axis extending from the plane of the substrate and terminating at a tip, wherein the one or more conductive probes comprise at least three points that are non-collinear.
1. An apparatus comprising:
a substrate comprising conductive trace routing embedded within a dielectric material and coupled to metal features exposed at a surface of the substrate; and
an array of a plurality of conductive probes over a plane of the substrate and having a pitch of no more than 100 microns, wherein:
a base of individual ones of the probes is in direct contact with corresponding ones of the metal features;
individual ones of the probes have a major axis from the base to a tip that extends no more than 500 microns from the surface of the substrate in a direction substantially orthogonal to the plane of the substrate;
individual ones of the probes comprise a first straight segment comprising the base and a first end, the first segment extending a first distance in a first direction over the plane of the substrate and at a first zenith angle oblique to the plane of the substrate; and
the individual ones of the probes comprise a second straight segment comprising a second end and a third end, the second end in direct contact with the first end at an elbow, the second segment extending from the elbow a second distance in a second direction over the plane of the substrate that is rotated azimuthally from the first direction, and at a second zenith angle oblique to the plane of the substrate.
2. The apparatus of claim 1 , wherein the second direction is substantially opposite the first direction.
3. The apparatus of claim 2 , wherein the first and second distances are substantially equal with individual ones of the probes having a chevron shape.
4. The apparatus of claim 2 , wherein individual ones of the probes comprise a third straight segment with a fourth end in direct contact with the third end of the second segment at a second elbow, the third segment extending from the second elbow in a third direction over the plane of the substrate that is rotated azimuthally from the second direction toward the base.
5. The apparatus of claim 1 , wherein all of the segments are coplanar.
6. The apparatus of claim 1 , wherein two or more segments are non-coplanar.
7. The apparatus of claim 1 , wherein the major axis extends from the substrate by 300 microns or less.
8. The apparatus of claim 7 , wherein the major axis extends from the substrate by 100 microns or less.
9. The apparatus of claim 1 , wherein the plurality of probes have a pitch of 40 microns or less in at least one dimension over the plane of the substrate.
10. The apparatus of claim 1 , wherein the metal features comprise copper and the probes comprise copper or tungsten.
11. A system comprising:
a probe station; and
a probe card electrically coupled to the probe station, the probe card comprising:
a substrate comprising one or more electrically conductive paths embedded in dielectric material and coupled to metal features exposed at a surface of the substrate; and
an array of a plurality of conductive probes over a plane of the substrate and having a pitch of no more than 100 microns, wherein:
a base of individual ones of the probes is in direct contact with corresponding ones of the metal features;
individual ones of the probes have a major axis from the base to a tip that extends no more than 500 microns from the surface of the substrate in a direction substantially orthogonal to the plane of the substrate, and
individual ones of the probes comprise a first straight segment comprising the base and a first end, the first segment extending a first distance in a first direction over the plane of the substrate and at a first zenith angle oblique to the plane of the substrate; and
the individual ones of the probes comprise a second straight segment comprising a second end and a third end, the second end in direct contact with the first end at an elbow, the second segment extending from the elbow a second distance in a second direction over the plane of the substrate that is azimuthally rotated from the first direction, and at a second zenith angle oblique to the plane of the substrate.
12. The system of claim 11 , wherein the electrically conductive path comprises trace routing that is electrically coupled to at least one of the probes.
13. The system of claim 11 , wherein the first and second segments are co-planar and define a chevron shape.