IP Library Granted Patent US 10,707,378
Granted Patent B2
US 10,707,378 · App. 15/640,669 · Granted Jul 7, 2020

Semiconductor light-emitting device

Inventors: Hideyuki Tomizawa (Kanazawa, JP); Akihiro Kojima (Nonoichi, JP); Miyoko Shimada (Hakusan, JP); Yosuke Akimoto (Nonichi, JP); Hideto Furuyama (Yokohama, JP); Yoshiaki Sugizaki (Fujisawa, JP)
Assignee: ALPAD Corporation
H01L33/382H01L33/385H01L33/40H01L33/42H01L33/44H01L33/486H01L33/50
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Quick Facts
Patent No.
US 10,707,378
App. No.
15/640,669
Granted
Jul 7, 2020
Kind
B2
Abstract

According to one embodiment, the p-side electrode is provided on the second semiconductor layer. The insulating film is provided on the p-side electrode. The n-side electrode includes a first portion, a second portion, and a third portion. The first portion is provided on a side face of the first semiconductor layer. The second portion is provided in the first n-side region. The third portion overlaps the p-side electrode via the insulating film and connects the first portion and the second portion to each other.

Claims (35)

1. A semiconductor light-emitting device, comprising:

a semiconductor layer including a first semiconductor layer, a second semiconductor layer, and a light-emitting layer provided between the first semiconductor layer and the second semiconductor layer, the first semiconductor layer having a first n-side region surrounded by a stacked film including the light-emitting layer and the second semiconductor layer;

a fluorescent material layer provided on the first semiconductor layer;

a p-side electrode provided on the second semiconductor layer;

an insulating film provided on the p-side electrode;

an n-side electrode including a first portion, a second portion, and a third portion, the first portion provided on a side face of the first semiconductor layer, the second portion provided in the first n-side region, the third portion overlapping the p-side electrode via the insulating film and connecting the first portion and the second portion to each other;

a p-side interconnection portion provided on the insulating film and connected to the p-side electrode;

an n-side interconnection portion provided on the insulating film and connected to the n-side electrode; and

a resin layer provided around the semiconductor layer, an upper face of the resin layer being higher than an upper face of the first semiconductor layer with the fluorescent material layer being above the semiconductor layer.

2. The device according to claim 1 , wherein the n-side electrode has a fourth portion provided along an outer periphery of the p-side electrode.

3. The device according to claim 2 , wherein the fourth portion overlaps an end portion of the p-side electrode via the insulating film.

4. The device according to claim 2 , wherein the fourth portion is connected to the third portion.

5. The device according to claim 2 , wherein the n-side electrode includes a contact portion integrally provided with the fourth portion, and

the n-side interconnection portion is connected to the contact portion.

6. The device according to claim 5 , wherein the contact portion overlaps the p-side electrode via the insulating film.

7. The device according to claim 1 , wherein the n-side electrode includes an aluminum film in contact with the first semiconductor layer.

8. The device according to claim 1 , wherein the p-side electrode includes a silver film in contact with the second semiconductor layer.

9. The device according to claim 1 , wherein the n-side electrode contacts the first semiconductor layer at the first portion and at the second portion.

10. The device according to claim 1 , wherein the first portion, the second portion, and the third portion of the n-side electrode are integrally formed with a same material.

11. The device according to claim 2 , wherein the first portion, the second portion, the third portion, and the fourth portion of the n-side electrode are integrally formed with a same material.

12. The device according to claim 1 , wherein

the first semiconductor layer has a second n-side region provided between the side face and the stacked film; and

the first portion of the n-side electrode is also provided in the second n-side region.

13. The device according to claim 12 , wherein a contact area of the n-side electrode and the side face of the first semiconductor layer is larger than a total area of a contact area of the n-side electrode and the first n-side region, and a contact area of the n-side electrode and the second n-side region.

14. The device according to claim 1 , wherein a plurality of first n-side regions is disposed in a dot-like pattern.

15. The device according to claim 1 , further comprising a transparent electrode provided on a first face continuous to the side face of the first semiconductor layer, and connected to the first portion of the n-side electrode.

16. The device according to claim 15 , wherein

the first portion of the n-side electrode has an end portion projecting out from the side face of the first semiconductor layer; and

the transparent electrode is in contact with the end portion of the first portion.

17. The device according to claim 1 , wherein the fluorescent material layer is provided on the first semiconductor layer without a substrate interposed between the fluorescent material layer and the first semiconductor layer.

18. The device according to claim 1 , further comprising an inorganic film provided between the first semiconductor layer and the fluorescent material layer.

19. The device according to claim 1 , wherein

the p-side interconnection portion includes a p-side interconnection layer connected to the p-side electrode, and a p-side metal pillar provided on the p-side interconnection layer and thicker than the p-side interconnection layer; and

the n-side interconnection portion includes an n-side interconnection layer connected to the n-side electrode, and an n-side metal pillar provided on the n-side interconnection layer and thicker than the n-side interconnection layer.

20. The device according to claim 1 , wherein the resin layer is also provided between the p-side interconnection portion and the n-side interconnection portion.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 30, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: ALPAD CORPORATION
Reel/Frame 044258/0945 →
Priority Claims (1)
JP 2015-049093 · Mar 12, 2015 · national
Continuity (2)
Division 14830039 · Aug 19, 2015
Related Publication 20170301829A1 · Oct 19, 2017
Cited By (1)
US 12,439,747