Diagnostic system for a DC-DC voltage converter
A diagnostic system for a DC-DC voltage converter is provided. A first temperature sensor generates a first temperature signal associated with a buck mode integrated circuit. A first analog multiplexer outputs the first temperature signal to a first analog-to-digital converter which generates a first temperature value. A second temperature sensor generates a second temperature signal associated with a boost mode integrated circuit. A second analog multiplexer outputs the second temperature signal to a second analog-to-digital converter which generates a second temperature value. A microcontroller generates control signals to command first and second bi-directional switches in the DC-DC voltage converter to each transition to an open operational state if the first temperature value is greater than a first threshold temperature value.
1. A diagnostic system for a DC-DC voltage converter having first and second switches and a DC-DC converter control circuit comprising:
a microcontroller generating a first control signal that is received by the DC-DC converter control circuit to command a buck mode integrated circuit therein to activate, while a boost mode integrated circuit therein is de-activated;
a first temperature sensor generating a first temperature signal indicative of a temperature level of the buck mode integrated circuit;
a first analog multiplexer having an input port being electrically coupled to the first temperature sensor, and an output port being electrically coupled to a first analog-to-digital converter of the microcontroller, the first analog multiplexer outputting the first temperature signal to the first analog-to-digital converter;
the first analog-to-digital converter generating a first temperature value corresponding to the first temperature signal;
a second temperature sensor generating a second temperature signal indicative of a temperature level of the boost mode integrated circuit;
a second analog multiplexer having an input port being electrically coupled to the second temperature sensor, and an output port being electrically coupled to a second analog-to-digital converter of the microcontroller, the second analog multiplexer outputting the second temperature signal to the second analog-to-digital converter;
the second analog-to-digital converter generating a second temperature value corresponding to the second temperature signal;
the microcontroller generating second and third control signals to command the first and second switches, respectively, to each transition to an open operational state if the first temperature value is greater than a first threshold temperature value; and
the microcontroller generating fourth and fifth control signals to command the first and second switches, respectively, to each transition to the open operational state if the second temperature value is greater than a second threshold temperature value.
2. The diagnostic system of claim 1 , wherein:
the microcontroller further determining a first temperature difference value by subtracting the second temperature value from the first temperature value; and
the microcontroller generating sixth and seventh control signals to command the first switch and the second switch, respectively, to each transition to the open operational state if the first temperature difference value is less than zero.
3. The diagnostic system of claim 2 , wherein the microcontroller sends a message to a vehicle controller indicating that the first analog multiplexer is malfunctioning if the first temperature difference value is less than zero.
4. The diagnostic system of claim 1 , wherein the first temperature sensor is disposed proximate to and external of the buck mode integrated circuit.
5. The diagnostic system of claim 1 , wherein the second temperature sensor is disposed proximate to and external of the boost mode integrated circuit.
6. The diagnostic system of claim 1 , wherein the first threshold temperature value is greater than the second threshold temperature value.
7. The diagnostic system of claim 1 , wherein the first switch is a first bi-directional MOSFET switch, and the second switch is a second bi-directional MOSFET switch.
8. A diagnostic system for a DC-DC voltage converter having first and second switches and a DC-DC converter control circuit comprising:
a microcontroller generating a first control signal that is received by the DC-DC converter control circuit to command a boost mode integrated circuit therein to activate, while a buck mode integrated circuit therein is de-activated;
a first temperature sensor generating a first temperature signal indicative of a temperature level of the buck mode integrated circuit;
a first analog multiplexer having an input port being electrically coupled to the first temperature sensor, and an output port being electrically coupled to a first analog-to-digital converter of the microcontroller, the first analog multiplexer outputting the first temperature signal to the first analog-to-digital converter;
the first analog-to-digital converter generating a first temperature value corresponding to the first temperature signal;
a second temperature sensor generating a second temperature signal indicative of a temperature level of the boost mode integrated circuit;
a second analog multiplexer having an input port being electrically coupled to the second temperature sensor, and an output port being electrically coupled to a second analog-to-digital converter of the microcontroller, the second analog multiplexer outputting the second temperature signal to the second analog-to-digital converter;
the second analog-to-digital converter generating a second temperature value corresponding to the second temperature signal;
the microcontroller generating second and third control signals to command the first and second switches, respectively, to each transition to an open operational state if the first temperature value is greater than a first threshold temperature value; and
the microcontroller generating fourth and fifth control signals to command the first and second switches, respectively, to each transition to the open operational state if the second temperature value is greater than a second threshold temperature value.
9. The diagnostic system of claim 8 , wherein:
the microcontroller determining a first temperature difference value by subtracting the first temperature value from the second temperature value; and
the microcontroller generating sixth and seventh control signals to command the first switch and the second switch, respectively, to each transition to the open operational state if the first temperature difference value is less than zero.
10. The diagnostic system of claim 9 , wherein the microcontroller sends a message to a vehicle controller indicating that the second analog multiplexer is malfunctioning if the first temperature difference value is less than zero.
11. The diagnostic system of claim 8 , wherein the first temperature sensor is disposed proximate to and external of the buck mode integrated circuit.
12. The diagnostic system of claim 8 , wherein the second temperature sensor is disposed proximate to and external of the boost mode integrated circuit.
13. The diagnostic system of claim 8 , wherein the second threshold temperature value is greater than the first threshold temperature value.
14. The diagnostic system of claim 8 , wherein the first switch is a first bi-directional MOSFET switch, and the second switch is a second bi-directional MOSFET switch.