IP Library Granted Patent US 10,453,891
Granted Patent B2
US 10,453,891 · App. 15/666,038 · Granted Oct 22, 2019

Substrate with conductive film

Inventors: Takeshi Tomizawa (Chiyoda-ku, JP); Yuki Aoshima (Chiyoda-ku, JP); Reo Usui (Chiyoda-ku, JP); Hidefumi Odaka (Chiyoda-ku, JP)
Assignee: AGC Inc.
H01L27/14696B32B7/02B32B9/00H01B5/14H01L51/0021H05K1/02C01G9/02C01G15/00C01G19/02C08F14/26C08G63/183C08G64/02H01L2251/306
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Quick Facts
Patent No.
US 10,453,891
App. No.
15/666,038
Granted
Oct 22, 2019
Kind
B2
Abstract

A substrate with conductive film includes a base material; and a film of a conductive metal oxide arranged on an upper part of the base material. The film includes, by a top plan view, a first region and a second region, the second region is configured of a same material as the first region, and an electric resistance of the second region is higher than an electric resistance of the first region. The second region includes a part configured by a plurality of cellular sections surrounded by a plurality of fine cracks. In the part, each fine crack has a width of 1 nm to 50 nm, and each cellular section has a largest measure of less than 10 μm.

Claims (21)

1. A substrate with conductive film comprising:

a base material; and

a film of a conductive metal oxide arranged on an upper part of the base material,

wherein the film includes, by a top plan view, a first region and a second region, the second region is configured of a same material as the first region, and an electric resistance of the second region is higher than an electric resistance of the first region,

wherein the second region includes a part configured by a plurality of cellular sections surrounded by a plurality of fine cracks, and

wherein in the part a local expansion in volume occurs in the conductive metal oxide forming random fine cracks, each fine crack has a width of 5 nm to 30 nm, and each cellular section has a largest measure of less than 10 μm.

2. The substrate with conductive film according to claim 1 ,

wherein an uppermost surface of the first region and an uppermost surface of the second region are at a same height level.

3. The substrate with conductive film according to claim 1 , wherein the film is a transparent film.

4. The substrate with conductive film according to claim 1 , wherein the conductive metal oxide includes an oxide of at least one metal selected from a group including indium (In), tin (Sn), and zinc (Zn).

5. The substrate with conductive film according to claim 1 , wherein the conductive metal oxide has a free electron concentration of greater than or equal to 5.0×10 20 /cm 3 .

6. The substrate with conductive film according to claim 1 , wherein the film has a thickness that falls within a range of 10 nm to 300 nm.

7. The substrate with conductive film according to claim 1 , wherein the base material is a transparent base material.

8. The substrate with conductive film according to claim 1 , wherein the base material is a glass.

9. The substrate with conductive film according to claim 1 , wherein the film is a laminated film of two or more layers.

10. The substrate with conductive film according to claim 1 , wherein the second region is arranged as a linear-shaped pattern, a lattice-shaped pattern, or a dot-shaped pattern.

11. The substrate with conductive film according to claim 1 , wherein the largest measure of a cellular section ranges from 1 μm to 7 μm.

12. The substrate with conductive film according to claim 1 , wherein in a part where the film of a conductive metal oxide is formed, regions having appreciably different refractive indices are not present.

13. The substrate with conductive film according to claim 1 , wherein an uppermost surface of the second region in said film is raised relative to an uppermost surface of the first region.

14. The substrate with conductive film according to claim 13 , wherein the extent of raising is at most 200 Å.

15. The substrate with conductive film according to claim 1 , wherein the height of an uppermost surface of the second region is within a range of ±20% with respect to the height of an uppermost surface of the first region in said film.

Assignments (2)
CHANGE OF NAME Recorded Aug 7, 2018
From: ASAHI GLASS COMPANY, LIMITED
To: AGC INC.
Reel/Frame 046730/0786 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 1, 2017
From: TOMIZAWA, TAKESHI; AOSHIMA, YUKI; USUI, REO; ODAKA, HIDEFUMI
To: ASAHI GLASS COMPANY, LIMITED
Reel/Frame 043157/0489 →