IP Library Granted Patent US 11,099,449
Granted Patent B1
US 11,099,449 · App. 15/691,293 · Granted Aug 24, 2021

EC devices with nanostructred thin film anodes

Inventors: Daniel Giaquinta (South San Francisco, CA); Hye-Jin Choi (South San Francisco, CA); John Roudebush (South San Francisco, CA); Brian Wiers (South San Francisco, CA); Ellen Murphy (South San Francisco, CA); Howard Turner (South San Francisco, CA)
Assignee: KINESTRAL TECHNOLOGIES, INC.
G02F1/1525G02F1/153G02F1/15245
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Quick Facts
Patent No.
US 11,099,449
App. No.
15/691,293
Filed
Aug 30, 2017
Granted
Aug 24, 2021
Kind
B1
Examiner
TRA, TUYEN Q
Art Unit
2872
USPC
359/265
Abstract

A method of manufacturing a thin film is provided. The method includes providing a plurality of crystalline anodic electrochromic particles, size-reducing the crystalline anodic electrochromic particles by grinding to produce crystalline hexagonal tungsten trioxide nanostructures, and coating the crystalline anodic electrochromic nanostructures onto a substrate to produce a thin film. An electrochromic multi-layer stack is also provided.

Claims (31)

1. A method of manufacturing a thin film comprising:

providing a plurality of crystalline anodic electrochromic particles;

size-reducing the crystalline anodic electrochromic particles by grinding to produce crystalline anodic electrochromic nanostructures; and

coating the crystalline anodic electrochromic nanostructures onto a substrate to produce an electrochromic thin film;

wherein the crystalline anodic electrochromic nanostructures comprise an alkali metal oxide material.

2. The method of claim 1 , wherein the crystalline anodic electrochromic nanostructures comprise a lithium nickel metal oxide material.

3. The method of claim 2 , wherein the lithium nickel metal oxide material comprises Li, Ni, O, and at least one metal selected from the group consisting of Al, Ti, Zn, Nb, Mo, Sb, and Te.

4. The method of claim 2 , wherein the lithium nickel oxide material comprises Li x Ni (2−(4x/3)) (Sb y Nb 1−y ) (x/3) O 2 , wherein x is from 1 to 1.2 and y is from 0 to 0.5.

5. The method of claim 1 , wherein the crystalline anodic electrochromic nanostructures comprise Li, a first metal, a second metal, and O, wherein

the first metal is selected from the group consisting of Mn, Fe, Co, Ni, and Sn;

and the second metal is selected from the group consisting of P, B, Si, Ge, Sn, Sb and Te.

6. The method of claim 1 , wherein the crystalline anodic electrochromic particles are produced using a thermal treatment at a temperature greater than 600° C.

7. The method of claim 1 , wherein the electrochromic thin film does not include a binder material.

8. The method of claim 1 , wherein the substrate comprises a material with a softening point less than 600° C.

9. The method of claim 1 , wherein the substrate comprises a material with a softening point less than 300° C.

10. The method of claim 1 , wherein the electrochromic thin film is an electrochromic anode layer in an electrochromic device.

11. An electrochromic multi-layer stack comprising:

an electrochromic anode layer comprising crystalline anodic electrochromic nanostructures;

an electrically conductive layer; and

an outer substrate;

wherein:

the multi-layer stack is incorporated into an electrochromic device;

the electrochromic anode layer does not include a binder;

the crystalline anodic electrochromic nanostructures comprise an alkali metal oxide material;

the crystalline anodic electrochromic nanostructures comprise a lithium nickel metal oxide material; and

the lithium nickel oxide material comprises Li x Ni (2−(4x/3)) (Sb y Nb 1−y ) (x/3) O 2 , wherein x is from 1 to 1.2 and y is from 0 to 0.5.

12. The electrochromic multi-layer stack of claim 11 , wherein the transparent substrate comprises a material with a softening point less than 600° C.

13. The electrochromic multi-layer stack of claim 11 , wherein the transparent substrate comprises a material with a softening point less than 300° C.

14. The electrochromic device of claim 11 , wherein the electrochromic device comprises a clear state and a dark state, wherein

the clear state comprises a CIE-Lab L* in transmission from 50 to 95, b* in transmission from −8 to 8, and a* in transmission from −4 to 4; and

the dark state comprises a CIE-Lab L* in transmission from 0 to 30, b* in transmission from −5 to −2, and a* in transmission from −7 to −5.

Assignments (11)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 6, 2025
From: HALIO , LLC
To: SMART WINDOW INC., LIMITED
Reel/Frame 070438/0392 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 5, 2025
From: HALIO, INC.
To: HALIO, LLC
Reel/Frame 070404/0027 →
RELEASE OF SECURITY INTEREST Recorded Oct 27, 2023
From: SK INC. (FORMERLY KNOWN AS SK HOLDINGS CO., LTD.)
To: HALIO, INC. (FORMERLY KNOWN AS KINESTRAL TECHNOLOGIES, INC.)
Reel/Frame 065383/0200 →
CHANGE OF NAME Recorded Apr 1, 2021
From: KINESTRAL TECHNOLOGIES, INC.
To: HALIO, INC.
Reel/Frame 056031/0001 →
SECURITY INTEREST Recorded Jul 10, 2020
From: KINESTRAL TECHNOLOGIES, INC.
To: SK HOLDINGS CO., LTD.
Reel/Frame 053180/0686 →
RELEASE OF SECURITY INTEREST Recorded Jun 9, 2020
From: HORIZON TECHNOLOGY FINANCE CORPORATION
To: KINESTRAL TECHNOLOGIES, INC.
Reel/Frame 052887/0962 →
SECURITY INTEREST Recorded Nov 19, 2019
From: KINESTRAL TECHNOLOGIES, INC.
To: HORIZON TECHNOLOGY FINANCE CORPORATION
Reel/Frame 051059/0378 →
RELEASE OF SECURITY INTEREST Recorded Feb 1, 2019
From: GPB DEBT HOLDINGS II, LLC
To: KINESTRAL TECHNOLOGIES, INC.
Reel/Frame 048226/0446 →
SECURITY INTEREST Recorded Jan 31, 2019
From: KINESTRAL TECHNOLOGIES, INC.
To: SK HOLDINGS CO., LTD.
Reel/Frame 048199/0113 →
SECURITY INTEREST Recorded Dec 18, 2018
From: KINESTRAL TECHNOLOGIES, INC.
To: MURCHINSON VENTURE CREDIT LLC
Reel/Frame 047972/0503 →
SECURITY INTEREST Recorded Jun 7, 2018
From: KINESTRAL TECHNOLOGIES, INC.
To: GPB DEBT HOLDINGS II, LLC
Reel/Frame 046328/0594 →
Continuity (1)
Provisional Application 62381373 · Aug 30, 2016
Cited By (1)
US 12,703,645