Digital-to-analog converter (DAC) with enhanced dynamic element matching (DEM) and calibration
Systems and methods are provided for digital-to-analog converters (DACs) with enhanced dynamic element matching (DEM) and calibration. DEM may be adapted based on assessment of one or more conditions that may affect the DACs or DEM functions thereof. The one or more condition may comprise amount of signal backoff. The adaption may comprise switching the DEM function (as a whole, or partially—e.g., individual DEM elements) on or off based on the assess conditions. The DACs may incorporate use of calibration. The DEM and/or the calibration may be applied to only a portion of the DAC, such as a particular segment (e.g., a middle segment comprising bits between the MSBs and the LSBs).
1. A system comprising:
a digital-to-analog converter (DAC) that is operable to apply digital-to-analog conversions, the DAC comprising:
a plurality of switching elements with each switching element configured to handle particular bit an input to the DAC; and
one or more control circuits operable to apply:
dynamic element matching; and
calibration, to one or more parameters and/or functions of the DAC, the calibration comprises detecting and correcting one or more types of errors that occur during operation of the DAC and/or reducing effects resulting from the one or more types of errors;
wherein the one or more control circuits are operable to apply the dynamic element matching and/or the calibration to only a subset of the plurality of switching elements.
2. The system of claim 1 , wherein:
the DAC is operable to switch between a normal mode and a calibration mode; and
the one or more control circuits are operable to apply the calibration only during the calibration mode.
3. The system of claim 1 , wherein the one or more control circuits are operable to apply the calibration during active operation of the DAC.
4. The system of claim 1 , wherein:
the DAC comprises a plurality of segments, with each segment comprising one or more of the switching elements; and
the one or more control circuits are operable to apply the dynamic element matching and/or the calibration to only one or more of the plurality of segments.
5. The system of claim 4 , comprising a selector circuit for facilitating applying the dynamic element matching and/or the calibration to one of the plurality of segments.
6. The system of claim 4 , wherein the plurality of segments comprises:
a most significant bits (LSBs) segment;
an upper LSBs (ULSBs) segment; and
a least significant bits (LSBs) segment.
7. The system of claim 6 , wherein the one or more control circuits are operable to apply the dynamic element matching and/or the calibration only to the ULSBs segment.
8. The system of claim 1 , wherein the one or more types of errors comprise mismatch errors, and the one or more effects resulting from errors comprise spurs.