Determining temperature inside a high pressure cell by evaluating solid solution composition
View Patent ↗A method for the measurement of temperature in high temperature and high pressure processes includes the steps of providing at least a first material compound and at least a second material compound. The at least first and second compounds are mixed to form a material sample. The material sample is loaded into a device and the device and material sample are subjected to a high pressure of up to about 10 GPa and a high temperature of up to about 1700° C. to form the material sample into a solid crystalline solution. The material sample is recovered for analysis and the composition of the crystalline solid solution is measured to determine the temperature.
1. A method of measuring temperature in a high pressure high temperature (HPHT) process, comprising:
subjecting a quantity of a sensor material to an HPHT process having a pressure of up to about 10 GPa and a temperature of up to about 1700° C. to modify a solid solution composition of the sensor material;
recovering the sensor material from the HPHT process; and
determining the temperature in the HPHT process by evaluating a crystalline structure of the recovered sensor material to determine the solid solution composition of the sensor material.
2. The method of claim 1 , wherein the sensor material comprises at least two compounds.
3. The method of claim 1 , wherein the sensor material is crystalline prior to subjecting the sensor material to the HPHT process.
4. The method of claim 1 , wherein the sensor material is amorphous prior to subjecting the sensor material to the HPHT process.
5. The method of claim 1 , wherein the sensor material comprises TiO 2 and GeO 2 .
6. The method of claim 5 , wherein TiO 2 and GeO 2 are provided in a molar ratio from about 30:70 to about 70:30.
7. The method of claim 5 , wherein TiO 2 and GeO 2 are provided in a molar ratio from about 40:60 to about 60:40.
8. The method of claim 1 , wherein the sensor material exhibits a crystalline lattice structure that corresponds to the solid solution composition.
9. The method of claim 8 , wherein the crystalline lattice structure of the sensor material is evaluated using at least one of electron microprobe, X-ray diffraction, or Raman spectroscopy.
10. The method of claim 8 , further comprising determining a maximum temperature experienced by the sensor material in the HPHT process based on the evaluated crystalline lattice structure of the sensor material.
11. The method of claim 10 , further comprising characterizing a non-uniform maximum temperature experienced by the sensor material in the HPHT process based on a non-uniform crystalline lattice structure of the sensor material.