Balancer for multiple field effect transistors arranged in a parallel configuration
In at least one general aspect, an apparatus can include a first field effect transistor (FET) device and a second FET device. The apparatus can include a characterization circuit coupled to the first FET device and the second FET device where the characterization circuit can be configured to characterize a responsiveness of each of the first FET device and the second FET device. The apparatus can include a balancer configured to produce a modified gate drive signal for the first FET device based on the responsiveness of the first FET device.
1. An apparatus comprising:
a first field effect transistor (FET) device;
a second FET device;
a characterization circuit coupled to the first FET device and the second FET device, the characterization circuit configured to characterize a threshold voltage of each of the first FET device and the second FET device; and
a balancer directly coupled to a gate of the first FET device and directly coupled to a gate of the second FET device, the balancer configured to produce a first modified gate drive signal directly to the gate of the first FET device based on the threshold voltage of the first FET device and based on an input gate drive signal, the balancer configured to produce a second modified gate drive signal, different from the first modified gate signal and different from the input gate drive signal, directly to the gate of the second FET device based on the threshold voltage of the second FET device and based on the input gate drive signal, the balancer being configured to produce the first modified gate drive signal to compensate for a difference between the threshold voltage of the first FET device and the threshold voltage of the second FET device.
2. The apparatus of claim 1 , wherein the balancer is configured to produce the modified gate drive signal so that an output of the first FET device is within a specified voltage range of an output voltage of the second FET device in response to the input gate drive signal.
3. The apparatus of claim 1 , wherein the input gate drive signal is a single input gate drive signal, the modified gate drive signal is the first modified gate drive signal, the balancer is configured to produce the second modified gate drive signal for the second FET device based on the threshold voltage of the second FET device,
the balancer is configured to produce the first modified gate drive signal and the second modified gate drive signal based on the single input gate drive signal.
4. The apparatus of claim 1 , further comprising a driver integrated circuit, wherein the balancer is configured to produce the modified gate drive signal for the first FET device based on the input gate drive signal produced from the driver integrated circuit.
5. The apparatus of claim 4 , wherein the balancer is configured to multiplex the input gate drive signal produced by the driver integrated circuit.
6. The apparatus of claim 1 , wherein the input gate drive signal is a single input gate drive signal, the modified gate drive signal is the first modified gate drive signal, the balancer is configured to produce the second modified gate drive signal for the second FET device based on the threshold voltage of the second FET device,
the balancer is configured to produce the first modified gate drive signal and the second modified gate drive signal based on the single input gate drive signal, the first modified gate drive signal being different from the second modified gate drive signal and different from the single input gate drive signal.
7. The apparatus of claim 1 , wherein the first FET device is parallel to the second FET device.
8. The apparatus of claim 1 , further comprising a driver integrated circuit,
wherein the balancer is disposed between the driver integrated circuit and both of the first FET device and second FET device to trigger a balanced response between the first FET device and the second FET device.
9. The apparatus of claim 1 , wherein the characterization circuit is configured to trigger the balancer to turn on each of the first FET device and the second FET device, one at a time, to determine a critical output voltage each of the first FET device and the second FET device.
10. The apparatus of claim 1 , wherein the characterization circuit is configured to use differences in gate voltages for each of the first FET device and the second FET device to determine a critical output voltage produced by the balancer during normal operation.
11. The apparatus of claim 1 , further comprising a single input coupled to both the first FET device and the second FET device.
12. An apparatus comprising:
a plurality of field effect transistor (FET) devices;
a characterization circuit coupled to the plurality of FET devices, the characterization circuit configured to characterize a threshold voltage of each of the plurality of FET devices during a characterization time period; and
a balancer directly coupled to each gate of each of the plurality of FET devices, the balancer configured to produce a plurality of modified gate drive signals for the plurality of FET devices during normal operation after the characterization time period, the plurality of modified gate drive signals being configured to compensate for differences in the threshold voltages of the plurality of FET devices such that a power output from each of the plurality of FET devices, when turned on, is equal in response to a single input gate drive signal.
13. The apparatus of claim 12 , wherein at least one of the modified gate drive signals is different from the single input gate drive signal.
14. The apparatus of claim 12 , further comprising a driver integrated circuit configured to produce the single input gate drive signal.
15. The apparatus of claim 12 , wherein each of the modified gate drive signals is different from the remaining modified gate drive signals.
16. An apparatus comprising:
a plurality of FET devices; and
a balancer directly coupled to a gate of each of the plurality of FET devices, the balancer configured to produce a plurality of modified gate drive signals for the gates of each of the plurality of FET devices in response to a single gate drive signal, at least one of the plurality of modified gate drive signals being configured to compensate for a difference in threshold voltages between at least a pair of the plurality of FET devices such that a power output from each of the plurality of FET devices, when turned on, is equal in response to the single gate drive signal.
17. The apparatus of claim 16 , wherein the balancer is configured to produce the at least one of the plurality of modified gate drive signals such that a responsiveness of the pair of the plurality of FET devices satisfies a matching condition in response to the single gate drive signal.
18. The apparatus of claim 16 , wherein the balancer is configured to produce the at least one of the plurality of modified gate drive signals for based on characterization of the pair of the plurality of FET devices.