Systems, devices and methods for the quality assessment of OLED stack films
This disclosure provides techniques for assessing quality of a deposited film layer of an organic light emitting diode (“OLED”) device. An image is captured and filtered to identify a deposited layer that is to be analyzed. Image data representing this layer can be optionally converted to brightness (grayscale) data. A gradient function is then applied to emphasize discontinuities in the deposited layer. Discontinuities are then compared to one or more thresholds and used to ascertain quality of the deposited layer, with optional remedial measures then being applied. The disclosed techniques can be applied in situ, to quickly identify potential defects such as delamination before ensuing manufacturing steps are applied. In optional embodiments, remedial measures can be taken dependent on whether defects are determined to exist.
1. A computer-implemented method for monitoring quality of a film deposited on a substrate, wherein the film has been deposited to form a layer respective to each structure of a plurality of structures on the substrate, the layer to have a common size and shape for each of the plurality of structures, the computer-implemented method comprising:
receiving one or more digital images, wherein the one or more digital images collectively represent each of the plurality of structures;
for each given structure of the plurality of structures
processing image data from the one or more digital images to identify gradients derived from image data which correspond to the common size and shape and which satisfy a first threshold, and
identifying a quality defect if gradients which are greater than the first threshold collectively satisfy a second threshold; and
identifying that the film is not defective for a product represented by the plurality of structures dependent on performing the processing of the gradients and the identifying the quality defect for each of the plurality of structures.
2. The computer-implemented method of claim 1 , wherein:
the first threshold is a non-zero threshold; and
processing the image data comprises filtering the image data to obtain filtered image data representing only an expected footprint of the film corresponding to the given structure, applying an operator to the filtered image data which emphasizes intensity variation to obtain the gradients, and comparing an absolute value of a magnitude of each gradient with the first threshold, such that the gradients which satisfy the first threshold represent at least a predetermined amount of intensity variation in the image data.
3. The computer-implemented method of claim 2 , wherein the operator is a Sobel operator.
4. The computer-implemented method of claim 1 , wherein:
processing the image data comprises filtering the image data to obtain filtered image data representing only an expected footprint of the film corresponding to the given structure; and
identifying the quality defect comprises
identifying a number of the gradients which are greater than the first threshold, if any,
processing the number of gradients which are greater than the first threshold to obtain a result, and
determining whether the result satisfies the second threshold.
5. The computer-implemented method of claim 1 , wherein each structure is an electro-optical element of the product, and wherein the plurality of structures comprises at least one thousand of the electro-optical elements.
6. The computer-implemented method of claim 5 , wherein the product is a display device, and wherein the computer-implemented method further comprises taking a remedial measure if the quality defect is identified for at least a predetermined number of the electro-optical elements.
7. The computer-implemented method of claim 5 , wherein the layer is a first layer and wherein the computer-implemented method further comprises causing one or more ensuing layers to be fabricated on top of the first layer and the substrate for each structure of the plurality of structures, to finish the product, if the film is determined to not be defective.
8. The computer-implemented method of claim 1 , wherein the film deposited on the substrate is a wet, organic material.
9. The computer-implemented method of claim 1 , wherein processing the image data comprises:
filtering image data to identify the layer for the given structure;
creating a mask from the filtered image data; and
applying the mask to the image data so as to eliminate image data not representing the layer, and processing the remaining image data.
10. The computer-implemented method of claim 1 , wherein the computer-implemented method further comprises:
causing a printer to print the film as a wet ink; and
in response to identifying that the film is not defective, causing a processing device to perform at least one of cure or dry of the film.
11. The computer-implemented method of claim 1 , wherein receiving the one or more digital images comprises causing a high-resolution camera to take a picture of at least part of the substrate, receiving the image data from the high-resolution camera, and storing the image data in digital memory.
12. A fabrication method for fabricating a product, comprising:
printing an ink on a substrate to deposit a film, the film to form a layer respective to each structure of a plurality of structures on the substrate, the layer to have a common size and shape for each of the plurality of structures;
performing a computer-implemented method for monitoring quality of the film, comprising
receiving one or more digital images, wherein the one or more digital images collectively represent each of the plurality of structures,
for each given structure of the plurality of structures
processing image data from the one or more digital images to identify gradients derived from image data which correspond to the common size and shape and which satisfy a first threshold, and
identifying a quality defect if gradients which are greater than the first threshold collectively satisfy a second threshold, and
identifying that the film is not defective for a product represented by the plurality of structures dependent on performing the processing of the gradients and the identifying the quality defect for each of the plurality of structures; and
in response to identifying that the film is not defective, causing a processing device to perform at least one of cure or dry of the film.
13. The fabrication method of claim 12 , wherein:
the first threshold is a non-zero threshold; and
processing the image data comprises filtering the image data to obtain filtered image data representing only an expected footprint of the film corresponding to the given structure, applying an operator to the filtered image data which emphasizes intensity variation to obtain the gradients, and comparing an absolute value of a magnitude of each gradient with the first threshold, such that the gradients which satisfy the first threshold represent at least a predetermined amount of intensity variation in the image data.
14. The fabrication method of claim 13 , wherein the operator is a Sobel operator.
15. The fabrication method of claim 12 , wherein:
processing the image data comprises filtering the image data to obtain filtered image data representing only an expected footprint of the film corresponding to the given structure; and
identifying the quality defect comprises
identifying a number of the gradients which are greater than the first threshold, if any,
processing the number of gradients which are greater than the first threshold to obtain a result, and
determining whether the result satisfies the second threshold.
16. The fabrication method of claim 12 , wherein each structure is an electro-optical element of the product, and wherein the plurality of structures comprises at least one thousand of the electro-optical elements.
17. The fabrication method of claim 16 , wherein the product is a display device, and wherein the fabrication method further comprises taking a remedial measure if the quality defect is identified for at least a predetermined number of the electro-optical elements.
18. The fabrication method of claim 16 , wherein the layer is a first layer and wherein the fabrication method further comprises causing one or more ensuing layers to be fabricated on top of the first layer and the substrate for each structure of the plurality of structures, to finish the product, if the film is determined to not be defective.
19. The fabrication method of claim 12 , wherein processing the image data comprises:
filtering image data to identify the layer for the given structure;
creating a mask from the filtered image data; and
applying the mask to the image data so as to eliminate image data not representing the layer, and processing the remaining image data.
20. The fabrication method of claim 12 , wherein receiving the one or more digital images comprises causing a high-resolution camera to take a picture of at least part of the substrate, receiving the image data from the high-resolution camera, and storing the image data in digital memory.
21. A computer-implemented method for monitoring quality of a film deposited on a substrate, wherein the film has been deposited to form a layer respective to each structure of a plurality of structures on the substrate, the layer to have a common size and shape for each of the plurality of structures, the computer-implemented method comprising:
receiving one or more digital images, wherein receiving comprises causing a high-resolution camera to take a picture of at least part of the substrate, receiving the one or more digital images from the high-resolution camera, and storing associated image data in digital memory, wherein the one or more digital images collectively represent each of the plurality of structures;
for each given structure of the plurality of structures
processing the image data to identify gradients derived from image data which correspond to the common size and shape and which satisfy a first threshold, and
identifying a quality defect, if any, if gradients which are greater than the first threshold collectively satisfy a second threshold;
identifying that the film is not defective for a product represented by the plurality of structures dependent on performing the processing of the gradients and the identifying the quality defect for each of the plurality of structures; and
repeating the receiving, processing, identifying the quality defect, if any, and identifying that the film is not defective, for each of respective substrates.