IP Library Granted Patent US 10,199,541
Granted Patent B2
US 10,199,541 · App. 15/722,551 · Granted Feb 5, 2019

Light-emitting device

Inventors: Kuo-Feng Huang (Hsinchu, TW); Cheng-Hsing Chiang (Hsinchu, TW); Jih-Ming Tu (Hsinchu, TW)
Assignee: EPISTAR CORPORATION
H01L33/30H01L33/0062H01L33/0095H01L33/025H01L33/06H01L33/14H01L33/22H01L33/38H01L2933/0083H01L2933/0091
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Quick Facts
Patent No.
US 10,199,541
App. No.
15/722,551
Granted
Feb 5, 2019
Kind
B2
Abstract

A light-emitting device is provided. The light-emitting device comprises The light-emitting device comprises a light-emitting stack comprising a first semiconductor layer, a second semiconductor layer and an active layer between the first semiconductor layer and the second semiconductor layer; and a third semiconductor layer on the light-emitting stack and comprising a first sub-layer, a second sub-layer and a roughened surface, wherein the first sub-layer has the same composition as that of the second sub-layer, and the second sub-layer is farther from the light-emitting stack than the first sub-layer; wherein the first sub-layer and the second sub-layer each comprises a Group III element and a Group V element, and an atomic ratio of the Group III element to the Group V element of the first sub-layer is less than an atomic ratio of the Group III element to the Group V element of the second sub-layer.

Claims (27)

1. A light-emitting device, comprising:

a light-emitting stack comprising a first semiconductor layer, a second semiconductor layer and an active layer between the first semiconductor layer and the second semiconductor layer; and

a third semiconductor layer on the light-emitting stack and comprising a first sub-layer, a second sub-layer and a roughened surface, wherein the first sub-layer has the same composition as that of the second sub-layer, and the second sub-layer is farther from the light-emitting stack than the first sub-layer;

wherein a concentration Al of the second sub-layer is higher than that of the first sub-layer,

wherein the first sub-layer and the second sub-layer each comprises a Group III element and a Group V element, and an atomic ratio of the Group III element to the Group V element of the first sub-layer is less than an atomic ratio of the Group III element to the Group V element of the second sub-layer.

2. The light-emitting device according to claim 1 , wherein the third semiconductor layer further comprises a first portion and a second portion, and the second portion comprises the roughened surface.

3. The light-emitting device according to claim 2 , wherein the first portion has a first thickness t 1 , and the second portion has a second thickness between 0.3*t 1 and 0.85*t 1 .

4. The light-emitting device according to claim 3 , wherein the first thickness is between 2000 nm and 4000 nm both inclusive.

5. The light-emitting device according to claim 2 , wherein the second portion substantially surrounds the first portion.

6. The light-emitting device according to claim 1 , wherein an atomic percentage of the Group III element of the second sub-layer is gradually changed in a direction toward the light-emitting stack.

7. The light-emitting device according to claim 1 , wherein the first sub-layer comprises (Al y Ga (1-y) ) 1-x In x P, the second sub-layer comprises (Al z Ga (1-z) ) 1-x In x P, and a difference between z and y is between 0.1 and 0.5 both inclusive.

8. The light-emitting device according to claim 1 , wherein the first sub-layer comprises (Al y Ga (1-y) ) 1-x In x P, 0.3≤y≤0.5, the second sub-layer comprises (Al z Ga (1-z) ) 1-x In x P, 0≤x<1, 0.5≤z≤0.7, and a difference between z and y is not less than 0.1.

9. The light-emitting device according to claim 1 , wherein the first sub-layer comprises (Al y Ga (1-y) ) 1-x In x P, 0≤x<1, 0.3≤y≤0.5, and the second sub-layer comprises (Al z Ga (1-z) ) 1-x In x P, 0≤x<1, 0.4≤z≤0.7, wherein z is gradually decreased in a direction toward the light-emitting stack.

10. The light-emitting device according to claim 1 , wherein the second sub-layer is on the first sub-layer and comprises an upper surface, and the roughened surface is between the light-emitting stack and the upper surface.

11. The light-emitting device according to claim 10 , further comprising a first electrode on the upper surface of the second sub-layer.

12. The light-emitting device according to claim 1 , wherein the second sub-layer has a thickness smaller than a thickness of the first sub-layer.

13. The light-emitting device according to claim 1 , wherein the roughened surface has an irregular surface texture.

14. The light-emitting device according to claim 1 , wherein the second sub-layer has an element having an atomic percentage gradually changed in a direction toward the light-emitting stack.

15. A light-emitting device, comprising:

a light-emitting stack comprising a first semiconductor layer, a second semiconductor layer and an active layer between the first semiconductor layer and the second semiconductor layer; and

a third semiconductor layer on the light-emitting stack and comprising a first sub-layer, a second sub-layer and a roughened surface, wherein the first sub-layer has the same composition as that of the second sub-layer, and the second sub-layer is farther from the light-emitting stack than the first sub-layer;

wherein the first sub-layer comprises Al x Ga (1-x) As, and the second sub-layer comprises Al y Ga (1-y) As, wherein an atomic ratio of Al to Ga in the first sub-layer is less than an atomic ratio of Al to Ga in the second sub-layer.

16. The light-emitting device according to claim 15 , wherein 0.3≤x≤0.7.

17. The light-emitting device according to claim 15 , wherein 0.4≤y≤0.8.

18. The light-emitting device according to claim 15 , wherein a difference between x and y is between 0.1 and 0.5 both inclusive.

19. The light-emitting device according to claim 15 , wherein y is gradually decreased in a direction toward the light-emitting stack.

20. The light-emitting device according to claim 15 , wherein the second sub-layer has a thickness smaller than a thickness of the first sub-layer.

Assignments (2)
CHANGE OF NAME Recorded Feb 26, 2026
From: EPISTAR CORPORATION
To: ENNOSTAR CORPORATION
Reel/Frame 075152/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 2, 2017
From: HUANG, KUO-FENG; CHIANG, CHENG-HSING; TU, JIH-MING
To: EPISTAR CORPORATION
Reel/Frame 043758/0128 →
Continuity (2)
Continuation 14873547 · Oct 2, 2015
Related Publication 20180026158A1 · Jan 25, 2018