Apparatus and a method for predicting a future state of an electronic component

1. A method for predicting a future state of an electronic component, comprising:

measuring a waveform of a signal related to the electronic component;

calculating a predicted value of a characteristic of the electronic component based on a reliability model of the electronic component using the waveform of the signal,

measuring an instantaneous value of the characteristic of the electronic component at a time instant;

comparing the instantaneous value of the characteristic of the electronic component to the predicted value of the characteristic of the electronic component calculated for the time instant or a quality criterion; and

adjusting the reliability model based on the comparison between the instantaneous value of characteristic of the electronic component and the predicted value of the characteristic of the electronic component calculated for the time instant or the quality criterion.

2. The method of claim 1 , wherein the method further comprises:

comparing the predicted value of the characteristic of the electronic component to the quality criterion; and

adjusting an operation parameter of the electronic component based on a result of the comparison.

3. The method of claim 1 , wherein calculating the predicted value of the characteristic of the electronic component is further based on a temperature of the electronic component.

4. The method of claim 1 , wherein the method further comprises adjusting the operation parameter of the electronic component based on the comparison between the instantaneous value of characteristic of the electronic component and the predicted value of the characteristic of the electronic component calculated for the time instant or the quality criterion.

5. The method of claim 1 , wherein the electronic component is a transistor.

6. The method of claim 1 , wherein the method is only performed in response to a trigger event.

7. A method for predicting a future state of a semiconductor circuit, comprising:

measuring a waveform of a signal at a node of the semiconductor circuit, the signal being related to an electronic component of the semiconductor circuit;

calculating a predicted value of a characteristic of the electronic component based on a reliability model of the electronic component using the waveform of the signal;

calculating a predicted value of a characteristic of the semiconductor circuit based on the predicted value of the characteristic of the electronic component,

measuring an instantaneous value of the characteristic of the electronic component at a time instant; and

comparing the instantaneous value of the characteristic of the electronic component to the predicted value of the characteristic of the electronic component calculated for the time instant or a quality criterion; and

adjusting the reliability model based on the comparison between the instantaneous value of characteristic of the electronic component and the predicted value of the characteristic of the electronic component calculated for the time instant or the quality criterion.

8. The method of claim 7 , wherein the method further comprises:

comparing the predicted value of the characteristic of the semiconductor circuit to the quality criterion; and

adjusting an operation parameter of the semiconductor circuit based on a result of the comparison.

9. The method of claim 7 , wherein calculating the predicted value of the characteristic of the electronic component is further based on a temperature of the semiconductor circuit.

10. The method of claim 7 , wherein the method further comprises adjusting the operation parameter of the semiconductor circuit based on the comparison between the instantaneous value of characteristic of the electronic component and the predicted value of the characteristic of the electronic component calculated for the time instant or the quality criterion.

11. The method of claim 7 , wherein the electronic component is a transistor.

12. An apparatus for predicting a future state of an electronic component, comprising:

a measuring unit configured to measure a waveform of a signal related to the electronic component; and

a processing unit configured to calculate a predicted value of a characteristic of the electronic component based on a reliability model of the electronic component using the waveform of the signal,

wherein the measuring unit is further configured to measure an instantaneous value of the characteristic of the electronic component at a time instant,

wherein the processing unit is further configured to compare the instantaneous value of the characteristic of the electronic component to the predicted value of the characteristic of the electronic component calculated for the time instant or a quality criterion, and adjust the reliability model based on the comparison between the instantaneous value of characteristic of the electronic component and the predicted value of the characteristic of the electronic component calculated for the time instant or the quality criterion.

13. The apparatus of claim 12 , wherein the processing unit is further configured to:

compare the predicted value of the characteristic of the electronic component to the quality criterion; and

adjust an operation parameter of the electronic component based on a result of the comparison.

14. The apparatus of claim 12 , wherein the processing unit is further configured to calculate the predicted value of the characteristic of the electronic component based on a temperature of the electronic component.

15. The apparatus of claim 12 , wherein the processing unit is further configured to adjust the operation parameter of the electronic component based on the comparison between the instantaneous value of characteristic of the electronic component and the predicted value of the characteristic of the electronic component calculated for the time instant or the quality criterion.

16. An apparatus for predicting a future state of a semiconductor circuit, comprising:

a measuring unit configured to measure a waveform of a signal at a node of the semiconductor circuit, the signal being related to an electronic component of the semiconductor circuit; and

a processing unit configured to calculate a predicted value of a characteristic of the electronic component based on a reliability model of the electronic component using the waveform of the signal,

wherein the processing unit is further configured to calculate a predicted value of a characteristic of the semiconductor circuit based on the predicted value of the characteristic of the electronic component,

wherein the measuring unit is further configured to measure an instantaneous value of the characteristic of the electronic component at a time instant,

wherein the processing unit is further configured to compare the instantaneous value of the characteristic of the electronic component to the predicted value of the characteristic of the electronic component calculated for the time instant or a quality criterion, and adjust the reliability model based on the comparison between the instantaneous value of characteristic of the electronic component and the predicted value of the characteristic of the electronic component calculated for the time instant or the quality criterion.

17. The apparatus of claim 16 , wherein the processing unit is further configured to:

compare the predicted value of the characteristic of the semiconductor circuit to a quality criterion; and

adjust an operation parameter of the semiconductor circuit based on a result of the comparison.

18. The apparatus of claim 16 , wherein the processing unit is further configured to adjust the operation parameter of the semiconductor circuit based on the comparison between the instantaneous value of characteristic of the electronic component and the predicted value of the characteristic of the electronic component calculated for the time instant or the quality criterion.