Inspection device
In an inspection device, components are separated and collected after electrical characteristics have been measured. The inspection device includes holding table, pair of measuring elements and configured to grip a component held on holding table and measure electrical characteristics of the component; and a relative movement device configured to relatively move holding table and the pair of measuring elements. The components are separated and collected by the relative position of movable element and holding table being changed based on measurement results of the electrical characteristics of the component.
1. An inspection device provided in a mounter that picks up a component supplied from a component supply device and mounts the component on a circuit board, the inspection device comprising:
a holding table configured to hold a component;
a measuring section provided with a pair of measuring elements configured to move towards and away from each other so as to grip and release the component, and configured to measure electrical characteristics of a component using the pair of measuring elements;
a relative movement device configured to relatively move the pair of measuring elements and the holding table; and
a sorting and collecting device configured to separate and collect the component released from the pair of measurement elements into one of a plurality of collection devices by relatively moving the pair of measuring elements and the holding table between entrances of the collection devices by control of the relative movement device based on measurement results of the electrical characteristics of the component as measured by the measurement section.
2. The inspection device according to claim 1 , further comprising
a main body including a first through-hole and a second through-hole formed with an interval between them along a direction of the relative movement of the pair of measuring elements and the holding table by the relative movement device.
3. The inspection device according to claim 2 , further comprising
a separating wall provided on the main body between the first through-hole and the second through-hole.
4. The inspection device according to claim 2 , further comprising
(a) a first housing section and a second housing section each configured to store a component released from the pair of measuring elements, (b) a first collection passage configured to connect the first housing section and the first through-hole, and (c) a second collection passage configured to connect the second housing section and the second through-hole,
wherein an opening surface area of each of the first through-hole and the second through hole becomes smaller progressing downwards.
5. The inspection device according to claim 1 , wherein
the pair of measuring elements includes a fixed element that is fixed to the main body, and a movable element capable of moving away from and towards the fixed element, with each of the fixed element and the movable element including an opposing surface capable of gripping the component, and
the inspection device further includes
a main body including a first through-hole and a second through-hole formed with an interval between them in the direction of relative movement between the holding table and the pair of measuring elements by the holding table moving device,
wherein the sorting and collecting device includes a relative position changing section configured to, by controlling the relative movement device based on the measurement results, switch to and from a first state in which the holding table is positioned above the second through-hole and the opposing surface of the movable element is positioned on the first through-hole side with respect to the holding table, and a second state in which the holding table is positioned above the first through-hole and the opposing surface of the movable element is positioned on the second through-hole side with respect to the holding table.
6. The inspection device according to claim 1 , further comprising:
a main body including a first through-hole and a second through-hole formed with an interval between them along a direction of the relative movement of the pair of measuring elements and the holding table by the relative movement device, wherein
the first through-hole and the second through-hole are the entrances to two of the collection devices.
7. An inspection device provided in a mounter that picks up a component supplied from a component supply device and mounts the component on a circuit board, the inspection device comprising:
a holding table configured to hold a component;
a measuring section provided with a pair of measuring elements configured to move towards and away from each other so as to grip and release the component, and configured to measure electrical characteristics of a component using the pair of measuring elements;
a relative movement device configured to relatively move the pair of measuring elements and the holding table; and
a sorting and collecting device configured to separate and collect the component released from the pair of measurement elements by relatively moving the pair of measuring elements and the holding table by control of the relative movement device based on measurement results of the electrical characteristics of the component as measured by the measurement section, wherein
the relative moving device includes a holding table moving device configured to move the holding table, and
the sorting and collecting device includes a holding table movement control section configured to control the holding table moving device based on the measurement results so as to change the relative position of the holding table and the pair of measuring elements that have been separated from each other.
8. The inspection device according to claim 7 , comprising
a main body including a first through-hole and a second through-hole formed with an interval between them, wherein
the holding table moving device moves the holding table above the first through-hole and the second through-hole of the main body, and
the holding body movement control section includes a storage section selection section that moves the holding table to a first position above the second through-hole and separated from a position above the first through-hole, and a second position above the first through-hole and separated from a position above the second through-hole.
9. An inspection device provided in a mounter that picks up a component supplied from a component supply device and mounts the component on a circuit board, the inspection device comprising:
a holding table configured to hold a component;
a measuring section provided with a pair of measuring elements configured to move towards and away from each other so as to grip and release the component, and configured to measure electrical characteristics of a component using the pair of measuring elements;
a relative movement device configured to relatively move the pair of measuring elements and the holding table; and
a sorting and collecting device configured to separate and collect the component released from the pair of measurement elements by relatively moving the pair of measuring elements and the holding table by control of the relative movement device based on measurement results of the electrical characteristics of the component as measured by the measurement section, wherein
the pair of measuring elements includes a fixed element that is fixed to the main body, and a movable element capable of moving away from and towards the fixed element, with each of the fixed element and the movable element including an opposing surface capable of gripping the component, and
the inspection device includes an air supply device configured to supply air to the opposing surface of the movable element when the pair of measuring elements are separated from each other.