IP Library Granted Patent US 10,613,313
Granted Patent B2
US 10,613,313 · App. 15/782,920 · Granted Apr 7, 2020

Microscopy system, microscopy method, and computer-readable recording medium

Inventor: Yoko Abe (Hino, JP)
Assignee: OLYMPUS CORPORATION
G02B21/367G02B21/241G06K9/00127G06K9/209G06K9/3233G06T5/003G06T5/50G06T7/00G06T7/0012G02B21/025G02B21/088G02B21/26G02B21/368G06T2207/10056G06T2207/10148G06T2207/20221
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Quick Facts
Patent No.
US 10,613,313
App. No.
15/782,920
Granted
Apr 7, 2020
Kind
B2
Abstract

A microscopy system includes: an imaging unit that acquires an image by capturing an object image generated by an observation optical system; a shift unit that shifts a focal plane and a position of a field of view of the observation optical system; an imaging control unit that causes the imaging unit to acquire a multi-focus superimposed image including image information on planes in an optical axis direction of the observation optical system by shifting the focal plane and the position of the field of view during one exposure period; a shift amount acquisition processing unit that acquires a shift amount by which the position of the field of view is shifted; an all-in-focus image generation unit that generates all-in-focus images based on multi-focus superimposed images, respectively, acquired under conditions in which the shift amounts are different; and a display unit that displays the all-in-focus images.

Claims (25)

1. A microscopy system comprising:

an image sensor configured to acquire an image by capturing an object image generated by an observation optical system of a microscope;

an object stage configured to shift a focal plane and a position of a field of view of the observation optical system;

a processor comprising hardware, the processor being configured to:

cause the image sensor to acquire a multi-focus superimposed image including image information on planes in an optical axis direction of the observation optical system by shifting the focal plane and the position of the field of view during one exposure period of the image sensor;

acquire a shift amount by which the position of the field of view is shifted;

generate all-in-focus images based on multi-focus superimposed images, respectively, acquired under conditions in which the shift amounts are different;

determine an area selected from any one of the all-in-focus images as an observation area in accordance with an operation performed from outside;

extract an area corresponding to the observation area from, other than the one of the all-in-focus images from which the observation area is selected, another one of the all-in-focus images and acquire a position of a slice including a structure of an object corresponding to the observation area based on a shift amount between a position of the observation area in the one of the all-in-focus images from which the observation area is selected and a position of the area in the other one of the all-in-focus images from which the area is extracted; and

display the all-in-focus images.

2. The microscopy system according to claim 1 , wherein the processor is further configured to determine an imaging start position at a time of acquiring each of the multi-focus superimposed images based on the acquired shift amount.

3. The microscopy system according to claim 1 , wherein the generation of the all-in-focus images comprises determining an imaging position at the time of acquiring a multi-focus superimposed image while shifting the position of the field of view of the observation optical system during the one exposure period of the image sensor, based on the position of the observation area in the one of the all-in-focus image from which the observation area is selected.

4. The microscopy system according to claim 3 , wherein the determining of the imaging position determines the imaging position such that the position of the observation area in each all-in-focus image does not change among the all-in-focus images.

5. A microscopy method of acquiring an image by capturing, with an image sensor, an object image generated by an observation optical system of a microscope, the microscopy method comprising:

acquiring a multi-focus superimposed image including image information on planes in an optical axis direction of the observation optical system by shifting a focal plane and a position of a field of view of the observation optical system during one exposure period of the image sensor;

generating all-in-focus images based on multi-focus superimposed images, respectively, acquired under conditions in which shift amounts by which the position of the field of view is shifted are different;

determining an area selected from any one of the all-in-focus images as an observation area in accordance with an operation performed from outside;

extracting an area corresponding to the observation area from, other than the one of the all-in-focus images from which the observation area is selected, another one of the all-in-focus images and acquire a position of a slice including a structure of an object corresponding to the observation area based on a shift amount between a position of the observation area in the one of the all-in-focus images from which the observation area is selected and a position of the area in the other one of the all-in-focus images from which the area is extracted; and

displaying the all-in-focus images.

6. A non-transitory computer-readable recording medium with an executable program stored thereon, the program acquiring an image by capturing, with an image sensor, an object image generated by an observation optical system of a microscope and causing a processor to execute:

acquiring a multi-focus superimposed image including image information on planes in an optical axis direction of the observation optical system by shifting a focal plane and a position of a field of view of the observation optical system during one exposure period of the image sensor;

generating all-in-focus images based on multi-focus superimposed images, respectively, acquired under conditions in which shift amounts by which the position of the field of view is shifted are different;

determining an area selected from any one of the all-in-focus images as an observation area in accordance with an operation performed from outside;

extracting an area corresponding to the observation area from, other than the one of the all-in-focus images from which the observation area is selected, another one of the all-in-focus images and acquire a position of a slice including a structure of an object corresponding to the observation area based on a shift amount between a position of the observation area in the one of the all-in-focus images from which the observation area is selected and a position of the area in the other one of the all-in-focus images from which the area is extracted; and

displaying the all-in-focus images.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 7, 2023
From: OLYMPUS CORPORATION
To: EVIDENT CORPORATION
Reel/Frame 062902/0423 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 13, 2017
From: ABE, YOKO
To: OLYMPUS CORPORATION
Reel/Frame 043856/0376 →
Continuity (2)
Continuation PCTJP2015061742 · Apr 16, 2015
Related Publication 20180081162A1 · Mar 22, 2018