Microscope system
View Patent ↗Provided is a microscope system including: a stage on which a sample is placed and that is movable in a direction orthogonal to an observation optical axis; a detecting unit that detects a position of the stage; an imaging unit that acquires an image of the sample on the stage; an image generating unit that generates an overlapped image by overlapping the acquired image with the position of the stage; a searching unit that searches for a position of the acquired image in the generated overlapped image; and a control unit that performs control including causing the image generating unit to stop the overlapping process and causing the searching unit to execute the position search when detection by the detecting unit fails, and causing the image generating unit to resume the overlapping process starting from a search position of the searching unit when the search is successful.
1. A microscope system comprising:
a stage on which a sample is placed and that is movable in a direction orthogonal to an observation optical axis;
a camera configured to acquire an image of the sample on the stage; and
a processor comprising hardware, the processor configured to:
detect a position of the stage;
generate an overlapped image by performing an overlapping process on the image acquired by the camera based on the detected position of the stage;
perform a position search to search for a position of the image acquired by the camera in the overlapped image;
perform a control including stopping the overlapping process and executing the position search when detection of the position of the stage fails, and resuming the overlapping process starting from a search position that is searched when the position search is successful,
calculate a reliability of a search result and calculate a possibility of a false detection of the position of the stage from a distribution of a degree-of-similarity map used during the position search, and
determine that the position search is successful if both the reliability is above a first predetermined threshold value and the possibility of false detection is below a second predetermined threshold value.
2. The microscope system according to claim 1 ,
wherein the camera is configured to acquire a plurality of images at a predetermined frame rate, and
wherein the processor is further configured to detect the position of the stage in accordance with a cumulative value obtained by cumulating relative positions between the images consecutively acquired by the camera.
3. The microscope system according to claim 1 ,
wherein the processor is further configured to:
calculate a reliability of a detection result of the position of the stage, and
determine that the position detection has failed if the reliability that is calculated is below a predetermined threshold value.
4. The microscope system according to claim 1 ,
wherein the processor is further configured to:
calculate the number of pixels exceeding a predetermined threshold value in the degree-of-similarity map used during the position search and
calculate the number of pixels or a ratio of the number of pixels to the total number of pixels as the possibility of false detection.
5. The microscope system according to claim 1 ,
wherein the processor is further configured to calculate the possibility of false detection of the position from a distribution of a histogram of the degree-of-similarity map used during the position search.