Laser projector with flash alignment
A method for aligning a laser projector for projecting a laser image onto a work surface is provided. The method includes providing a laser projector assembly with a laser source for projecting a laser image onto a work surface, a secondary light source for illuminating the work surface and a photogrammetry device for generating an image of the work surface. The method also includes affixing reflective targets onto the work surface and transmitting light from the secondary light source toward the work surface and reflecting light toward the photogrammetry device. The method further includes scanning the targets with a laser beam generated by the laser source for reflecting the laser beam toward a laser sensor and calculating a location for projecting the laser image onto the work surface from the reflected laser beam.
1. A method for projecting a laser image onto a three-dimensional work surface, comprising the steps of:
affixing a plurality of reflective targets onto the work surface;
transmitting light toward the work surface;
receiving reflected light from each of the plurality of reflective targets;
using the reflected light to identify a general location for each of the plurality of reflective targets;
using the general location to scan each of the plurality of reflective targets with a laser beam;
receiving a reflected laser beam from each of the plurality of reflective targets;
using the reflected laser beam to identify a precise location for each of the plurality of reflective targets; and
using the precise location for each of the plurality of reflective targets to determine where to project.
2. The method set forth in claim 1 , wherein said step of receiving reflected light from each of the plurality of reflective targets is further defined by the reflected light being received from each of the plurality of reflective targets be stereo cameras for determining the location of the targets by triangulation.
3. The method set forth in claim 1 , wherein the light is transmitted toward the work surface using intermittent light flashes.
4. The method set forth in claim 1 , wherein the light and the laser are transmitted at a same wavelength.
5. The method set forth in claim 1 , further including the step of identifying a pattern of the plurality of targets from the reflected laser beam.
6. The method set forth in claim 5 , further including the step of measuring drift of the work surface from a first position to a second position.
7. The method set forth in claim 1 , further comprising the step of using the reflected light to generate wherein said step of providing a photogrammetry assembly is further defined by providing a single camera for generating an image of the work surface.
8. A system for projecting a laser image onto a three-dimensional work surface wherein the work surface includes a plurality of reflective targets on the work surface, the system comprising:
a secondary light source; a photogrammetry device; a processor; a laser source; and a laser sensor; wherein:
the secondary light source transmits light toward the work surface;
the photogrammetry device receives reflected light from each of the plurality of reflective targets;
the processor uses the reflected light to identify a general location for each of the plurality of reflective targets;
the laser source uses the general location to scan each of the plurality of reflective targets with a laser beam;
the laser sensor receives a reflected laser beam from each of the plurality of reflective targets;
the processor uses the reflected laser beam to identify a precise location for each of the plurality of reflective targets; and
the laser source uses the precise location for each of the plurality of reflective targets to determine where to project the laser image onto the work surface.
9. The system set forth in claim 8 , wherein said photogrammetry device includes a first and second camera.
10. The system set forth in claim 8 , wherein the processor measures drift or dynamic movement of the work surface.
11. The system set forth in claim 8 , wherein when the light comprises intermittent light flashes.
12. The system set forth in claim 8 , wherein the light and the laser are transmitted at a same wavelength.
13. The system set forth in claim 8 , wherein the processor identifies a pattern of the plurality of targets from the reflected laser beam.
14. The method set forth in claim 8 , wherein the processor uses the reflected light to generate an image of the work surface.