Combined scatter and transmission multi-view imaging system
The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.
1. An X-ray inspection system for scanning an object, the inspection system comprising:
a first X-ray source configured to rotate and emit a first X-ray beam having a first transmission path defined by a first area;
a second X-ray source configured to rotate and emit a second X-ray beam having a second transmission path defined by a second area, wherein the second X-ray source is positioned apart from the first X-ray source and wherein an overlap of the first area and the second area define an scanning area;
a first detector array placed on an opposite side of the scanning area relative to the first X-ray source;
a second detector array placed on an opposite side of the scanning area relative to the second X-ray source; and
at least one controller configured to control a rotation of the first X-ray source and a rotation of the second X-ray source such that the first X-ray beam and second X-ray beam are concurrently activated but do not cross.
2. The X-ray inspection system of claim 1 , wherein the first X-ray source is at a same vertical level but is horizontally displaced from the second X-ray source.
3. The X-ray inspection system of claim 1 , wherein the first X-ray source is both vertically and horizontally displaced from the second X-ray source.
4. The X-ray inspection system of claim 1 , wherein the first X-ray source is configured to emit a pencil beam and configured to rotate over a predetermined angle of rotation.
5. The X-ray inspection system of claim 4 , wherein the second X-ray source is configured to emit a pencil beam and configured to rotate over a predetermined angle of rotation.
6. The X-ray inspection system of claim 1 , wherein at least one of the first detector array or the second detector array comprises one or more non-pixellated detectors.
7. The X-ray inspection system of claim 1 , further comprising a third X-ray source configured to rotate and emit a third X-ray beam having a third transmission path defined by a third area, wherein the third X-ray source is positioned apart from the first X-ray source and the second X-ray source and wherein an overlap of the first area, second area, and third area define the scanning area.
8. The X-ray inspection system of claim 7 , wherein the third X-ray source is positioned vertically above the first X-ray source and the second X-ray source and wherein the first X-ray source is horizontally displaced from the second X-ray source.
9. The X-ray inspection system of claim 7 , wherein the first X-ray source, the second X-ray source and the third X-ray source are each configured to simultaneously emit the first X-ray beam, the second X-ray beam, and the third X-ray beam.
10. The X-ray inspection system of claim 9 , wherein the first X-ray source is configured to scan the object by starting at a substantially vertical position and moving in a clockwise manner.
11. The X-ray inspection system of claim 10 , wherein the third X-ray source is configured to scan the object by starting at a substantially downward vertical position and moving in a clockwise manner.
12. The X-ray inspection system of claim 11 , wherein the second X-ray source is configured to scan the object by starting at a substantially horizontal position and moving in a clockwise manner.
13. The X-ray inspection system of claim 1 , wherein the controller is configured to cause the first X-ray source to begin scanning the object in a direction that does not overlap with an initial scanning direction of the second X-ray source, thereby eliminating cross talk between the first X-ray beam and the second X-ray beam.
14. The X-ray inspection system of claim 1 , wherein each detector of the first detector array and the second detector array is configured to be irradiated by only one X-ray beam at a time.
15. The X-ray inspection system of claim 1 , wherein each detector of the first detector array and the second detector array comprise at least one of CdZnTe, CdTe, HgI, Si or Ge.
16. The X-ray inspection system of claim 1 , wherein at least one of the first detector array or second detector array is configured to detect gamma rays when the first X-ray source and the second X-ray source is switched off by switching from a current integrating mode to a pulse counting mode.
17. The X-ray inspection system of claim 1 , wherein at least one of the first detector array or the second detector array comprises at least two backscatter detectors and a transmission detector positioned between the at least two backscatter detectors.
18. The X-ray inspection system of claim 17 , wherein the at least two backscatter detectors and the transmission detector are positioned within a single plane facing the object begin scanned and wherein the transmission detector has a smaller exposed surface area than each of the at least two backscatter detectors.
19. The X-ray inspection system of claim 17 , further comprising a fixed collimator positioned between the transmission detector and one of the at least two backscatter detectors.
20. The X-ray inspection system of claim 1 , wherein the first X-ray source and the second X-ray source each comprise an anode X-ray tube, a rotating collimator assembly, a bearing, a drive motor, and a rotary encoder.
21. The X-ray inspection system of claim 1 , wherein the controller is configured to receive data representing a speed of the object and, based upon said data, adjust at least one of a rotation speed of the first X-ray source or second X-ray source, a data acquisition rate, or an X-ray tube current.