High security key scanning system
A high security key scanning system and method is provided. The scanning system may comprise a sensing device configured to determine information and characteristics of a master high security key, and a digital logic to analyze the information and characteristics of the master key. The sensing device may be configured to capture information about the geometry of features cut into the surface of the master key. The logic may analyze the information related to that geometry and compare it to known characteristics of that style of high security key in order to determine the data needed to replicate the features on a new high security key blank. The system may be configured to capture the surface geometry using a camera or other imaging device. The system may utilize object coating techniques, illumination techniques, filtering techniques, image processing techniques, and feature extraction techniques to capture the desired features.
1. A high security key scanning system comprising:
an imaging device configured to capture images of a portion of a first side of a blade of a high security master key;
a plurality of light sources positioned to direct light along a light path towards the first side of said blade of the high security master key at an imaging position;
a mirror positioned towards the imaging position to align an optical path with said imaging device, said optical path traverses though said light path of said one or more light sources;
wherein the plurality of light sources are controlled to be individually turned on and off to direct light onto the surface of the high security master key at different illumination scenarios;
wherein said images reveal surface features formed into a face of at least a portion of said blade wherein the surface features include at least one formed pathway on the blade of the high security master key; and
a logic configured to analyze the captured images having different illumination scenarios to determine characteristics of said surface features.
2. The key scanning system of claim 1 , wherein said high security master key is a sidewinder key.
3. The key scanning system of claim 1 further comprises a backlight positioned to direct light opposite from the direction of the optical path relative to the imaging position.
4. The key scanning system of claim 3 , wherein the logic is configured to identify the high security master key type, verify if the high security master key is stationary, or determine the orientation of the high security master key.
5. The key scanning system of claim 1 , wherein at least one of said plurality of light sources directs collimated light towards the imaging position.
6. The key scanning system of claim 1 , wherein a position of said plurality of lights allow for the optical path to be uninterrupted from view of the imaging position.
7. The key scanning system of claim 1 , wherein said plurality of light sources includes a first light source, a second light source, a third light source and a fourth light source.
8. The key scanning system of claim 1 , wherein said plurality of light sources include a first top light and a second top light and a first bottom light and a second bottom light, wherein the first and second top lights are generally symmetric with one another relative to a vertical imaging position axis.
9. The key scanning system of claim 8 , wherein the first and second bottom lights are generally symmetric with one another relative to said vertical imaging position axis, wherein the first and second bottom lights have a different angle from the first and second top lights relative to said vertical imaging position axis.
10. The key scanning system of claim 1 further comprising at least one filter aligned along the optical path of said imaging device.
11. A method for scanning a high security master key, said method comprising:
illuminating surface features formed onto a first side of a blade of said high security master key from a plurality of angles wherein the step of illuminating surface features from a plurality of angles is provided by a plurality of light sources wherein the surface features include at least one formed pathway on the blade of the high security master key;
controlling the plurality of light sources to create different illumination scenarios onto the surface features of the high security master key;
defining an optical path for an imaging device, said optical path is aligned with a mirror and traverses through said plurality of light sources;
capturing a plurality of images of a portion of the illuminated surface of the blade of said high security master key from different illumination scenarios; and
determining characteristics of said surface features.
12. The method of claim 11 , wherein the step of illuminating surface features from a plurality of angles includes controlling the plurality of light sources to be on or off to create different illumination angles before capturing at least one image.
13. The method of claim 11 , wherein said surface features are determined with a logic that is configured to analyze a plurality of images with said different illumination scenarios.
14. The method of claim 13 further comprising comparing said characteristics of said surface features with cut position data of known lock styles.
15. The method of claim 14 further comprising backlighting said high security master key.
16. The method of claim 15 further comprising at least one of identifying the type of high security master key, verifying if the high security master key is stationary, and determining the orientation of the high security master key.
17. The method of claim 16 further comprising identifying a proper key blank associated with the high security master key.
18. The method of claim 11 further comprising directing collimated light towards the imaging position by at least one of the plurality of light sources.
19. The method of claim 11 wherein the step of illuminating surface features further comprises illuminating surface features from a first top light, a second top light, a first bottom light, and a second bottom light, wherein the first and second top lights are generally symmetric with one another relative to a vertical imaging position axis.
20. The method of claim 11 further comprising aligning at least one filter along the optical path of said imaging device.
21. The key scanning system of claim 1 wherein the formed pathway includes at least one of a pathway formed down the middle of the face of the blade, a single pathway formed onto the face of the blade, a pair of opposing pathways formed near the edges of the face of the blade, dimples formed into the face of the blade, and notches formed into the face of the blade.
22. The method of claim 11 wherein the formed pathway includes at least one of a pathway formed down the middle of the face of the blade, a single pathway formed onto the face of the blade, a pair of opposing pathways formed near the edges of the face of the blade, dimples formed into the face of the blade, and notches formed into the face of the blade.