IP Library Granted Patent US 10,490,676
Granted Patent B2
US 10,490,676 · App. 15/794,430 · Granted Nov 26, 2019

Method of manufacturing oxidation layer for solar cell

Inventors: Hyunjin Kim (Seoul, KR); Daeyeong Gong (Seoul, KR); Bokyeom Choi (Seoul, KR)
Assignee: LG ELECTRONICS INC.
H01L31/02167H01L21/02164H01L21/02236H01L31/028H01L31/1804H01L31/1864H01L31/1868H01L31/1876Y02E10/547Y02P70/521
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Quick Facts
Patent No.
US 10,490,676
App. No.
15/794,430
Granted
Nov 26, 2019
Kind
B2
Abstract

A method of manufacturing an oxidation layer for a solar cell is disclosed. The method includes exposing a substrate to a wet oxidation atmosphere and forming an oxidation layer on the substrate by maintaining a concentration of an oxidizing agent in the wet oxidation atmosphere for a process time.

Claims (22)

1. A method of manufacturing an oxidation layer for a solar cell using an etching facility equipped with a plurality of baths to remove a saw damage from a substrate by wet etching, the method comprising:

removing the saw damage of the substrate by using the etching facility;

forming a wet oxidation atmosphere by filling any one of the plurality of baths of the etching facility with an oxidation vapor; and

forming an oxidation layer on the substrate by exposing the substrate to the wet oxidation atmosphere at room temperature,

wherein a pressure of the wet oxidation atmosphere is 1.1 to 1.3 atm,

wherein the substrate is a silicon substrate and the oxidation layer is a silicon oxidation layer (SiO 2 ), and

wherein a thickness of the oxidation layer is 0.5 nm to 2 nm.

2. The method of claim 1 , wherein a concentration of an oxidizing agent in the oxidation vapor is 3 to 100 ppm.

3. The method of claim 1 , wherein the substrate is exposed to the wet oxidation atmosphere for 30 to 600 seconds.

4. The method of claim 1 , wherein an oxidizing agent in the oxidation vapor is any one selected from O 2 , H 2 O and O 3 .

5. The method of claim 1 , wherein the wet oxidation atmosphere with the oxidation vapor is formed by pressurizing and spraying O 2 gas having a purity of 99.9% or less alone.

6. The method of claim 1 , wherein the wet oxidation atmosphere with the oxidation vapor is formed by mixing N 2 gas with O 2 gas having a purity of 99.9% or more and pressurizing and spraying the mixed gas.

7. The method of claim 1 , further comprising:

performing a hydrophobic treatment to the substrate before the forming of the wet oxidation atmosphere.

8. The method of claim 7 , wherein the performing of the hydrophobic treatment and the removing of the saw damage are performed in-situ.

9. The method of claim 7 , wherein the forming of the oxidation layer is performed in-situ with the removing of the saw damage.

10. The method of claim 1 , further comprising:

heating the oxidation layer at about 600° C.

11. The method of claim 1 , further comprising:

after the forming of the oxidation layer, drying the substrate with hot air at a temperature lower than 60° C.

12. The method of claim 1 , wherein the oxidation vapor is formed by vaporizing or heating a liquid oxidizing agent.

13. The method of claim 1 , wherein an oxidizing agent in the oxidation vapor is injected with an injection pressure of 0.1 to 0.5 Mpa.

Assignments (3)
CHANGE OF NAME Recorded Dec 11, 2023
From: SHANGRAO JINKO SOLAR TECHNOLOGY DEVELOPMENT CO., LTD
To: SHANGRAO XINYUAN YUEDONG TECHNOLOGY DEVELOPMENT CO. LTD
Reel/Frame 066044/0299 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 28, 2022
From: LG ELECTRONICS INC.
To: SHANGRAO JINKO SOLAR TECHNOLOGY DEVELOPMENT CO., LTD
Reel/Frame 061571/0754 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 26, 2017
From: KIM, HYUNJIN; GONG, DAEYEONG; CHOI, BOKYEOM
To: LG ELECTRONICS INC.
Reel/Frame 043962/0753 →
Priority Claims (1)
KR 10-2017-0024418 · Feb 23, 2017 · national
Continuity (1)
Related Publication 20180240917A1 · Aug 23, 2018