Systems and methods of designing, tuning and producing ceramic filters

1. A method of making a tuned ceramic filter, comprising:

printing an oversized pattern of electrically conductive metallized ceramic material on a ceramic filter;

removing, at a first tune location of the ceramic filter, a first amount of the electrically conductive metallized ceramic material using a laser to shrink the oversized pattern;

comparing a coupling matrix of the ceramic filter after the removing step with a coupling matrix of a prototype of the ceramic filter;

generating a tune vector based upon a difference between the coupling matrix of the ceramic filter and the coupling matrix of the prototype filter; and

iteratively modifying the removing of the electrically conductive metallized ceramic material using a femto-second laser at the first tune location to have a coefficient of the tune vector corresponding to the first tune location to converge toward zero.

2. The method of claim 1 , further comprising:

performing the removing, the comparing, the generating and the iteratively modifying steps at additional locations of the ceramic filter to reduce respective additional coefficients of the tune vector to zero.

3. The method of claim 1 , wherein the tune vector is formed from a difference of measurements of coupling coefficients in the coupling matrix of the ceramic filter and the coupling matrix of the prototype filter during a given iteration.

4. The method of claim 1 , wherein the first tune location is between two shunt zero locations of the ceramic filter.

5. The method of claim 1 , wherein the first tune location corresponds to a local minimum in a reflectance characteristic in a time domain response of the ceramic filter.

6. The method of claim 1 , wherein the removing step is carried out for a recessed top portion of the ceramic filter.

7. The method of claim 1 , wherein the first tune location is chosen such that only one of the coefficients of the coupling matrix of the ceramic filter is modified by the removing step and additional coefficients of the coupling matrix of the ceramic filter are unaffected by the removing step.

8. The method of claim 1 , wherein the comparing step includes measuring at least one electrical property of the ceramic filter after the removing step.

9. The method of claim 1 , wherein the femto-second laser is controlled to emit pulses of at most 1 femto-second.

10. A system for laser based tuning of ceramic filters, comprising:

a processor;

a memory coupled to the processor, the memory having non-transitory computer readable medium on which are stored instructions for laser tuning a recessed top ceramic filter, the instructions when executed by the processor cause the processor to:

position a femto-second laser source to a first tune location of the recessed top ceramic filter, the first tune location is selected based upon simulated data of electrical characteristics of the recessed top ceramic filter, the first tune location having an oversized pattern of electrically conductive metallized ceramic material;

turn-on the femto-second laser to emit a femto-second pulse on the electrically conductive metallized ceramic material of the first tune location;

measure electrical characteristics of the recessed top ceramic filter after a removal of a portion of the electrically conductive metallized ceramic material by the femto-second laser source to generate a tune vector;

compare the tune vector with a simulated tune vector corresponding to simulated data for the recessed-top ceramic filter, each of the tune vector and the simulated tune vectors being derived from an actual coupling matrix and a simulated coupling matrix, respectively, of the recessed-top ceramic filter; and

iteratively modify the simulated data and the amount of the electrically conductive metallized ceramic material removed such that the tune vector and the simulated tune vector match.

11. A method for designing a ceramic filter, comprising:

printing an oversized pattern of electrically conductive metallized ceramic material on a ceramic filter;

selecting, a first tune location of the ceramic filter, based upon simulated data of electrical characteristics of the ceramic filter;

removing, at the first tune location, an amount of the electrically conductive metallized ceramic material using a femto-second laser to shrink the oversized pattern;

measuring actual electrical characteristics of the ceramic filter after the removing step to generate a tune vector for the ceramic filter;

comparing the tune vector with a simulated tune vector corresponding to the simulated data, wherein the tune vector and the simulated tune vector being derived from an actual coupling matrix and a simulated coupling matrix, respectively, of the ceramic filter; and

iteratively modifying the simulated data and the amount of the electrically conductive metallized ceramic material removed such that the tune vector and the simulated tune vector match.

12. The method of claim 11 , further comprising:

performing the selecting, the removing, the measuring, the comparing, the generating and the iteratively modifying steps at additional locations of the ceramic filter to match respective coefficients of the tune vector to coefficients of the simulated tune vector.

13. The method of claim 11 , wherein the tune vector is formed from a difference of measurements of coupling coefficients in the actual coupling matrix during a given iteration.

14. The method of claim 11 , wherein the first tune location is between two shunt zero locations of the ceramic filter.

15. The method of claim 11 , wherein the first tune location corresponds to a local minimum in a reflectance characteristic in a time domain response of the ceramic filter.

16. The method of claim 11 , wherein the removing step is carried out for a recessed top portion of the ceramic filter.

17. The method of claim 11 , wherein the first tune location is chosen such that only one coefficient of the actual coupling matrix is modified by the removing step and additional coefficients of the coupling matrix are unaffected by the removing step.

18. The method of claim 11 , wherein the femto-second laser is computer controlled to emit pulses of 1 femto-second or lesser.

19. The method of claim 11 , wherein the comparing step includes measuring at least one electrical property of the ceramic filter after the removing step.