IP Library Granted Patent US 10,319,883
Granted Patent B2
US 10,319,883 · App. 15/808,931 · Granted Jun 11, 2019

Semiconductor device and display unit

Inventors: Atsuhito Murai (Tokyo, JP); Motohiro Toyota (Tokyo, JP)
Assignee: JOLED INC.
H01L33/38H01L27/1214H01L27/156H01L27/3244H01L27/3248H01L33/40
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Quick Facts
Patent No.
US 10,319,883
App. No.
15/808,931
Granted
Jun 11, 2019
Kind
B2
Abstract

A semiconductor device includes a substrate, a gate electrode, an oxide semiconductor film, a first electrode, a second electrode, and a third electrode. The gate electrode is provided on the substrate. The oxide semiconductor film is provided on the substrate with the gate electrode interposed therebetween. The oxide semiconductor film includes a channel region facing the gate electrode and a low-resistance region adjacent to the channel region. The first electrode contains a constituent material same as that of the gate electrode, and has same thickness as that of the gate electrode. The second electrode has at least a portion facing the first electrode, and contains a constituent material same as that of the oxide semiconductor film. The third electrode has at least a portion provided at a position facing the first electrode with the second electrode interposed therebetween. The third electrode is electrically coupled to the first electrode.

Claims (38)

1. A semiconductor device comprising:

a substrate;

a gate electrode provided on the substrate;

an oxide semiconductor film provided on the substrate with the gate electrode being interposed therebetween, the oxide semiconductor film including a channel region that faces the gate electrode and a low-resistance region adjacent to the channel region;

a first electrode that contains a constituent material same as a constituent material of the gate electrode, the first electrode having a same thickness as a thickness of the gate electrode;

a second electrode having at least a portion that faces the first electrode, the second electrode containing a constituent material same as a constituent material of the oxide semiconductor film; and

a third electrode having at least a portion that is provided at a position facing the first electrode with the second electrode being interposed therebetween, the third electrode being electrically coupled to the first electrode and to the low-resistance region.

2. The semiconductor device according to claim 1 , further comprising a channel protective film that covers the channel region of the oxide semiconductor film.

3. The semiconductor device according to claim 2 , wherein, in a plan view, the channel protective film is provided in inner side of the gate electrode, and is provided to have a width larger than a channel width of the oxide semiconductor film.

4. The semiconductor device according to claim 1 , further comprising a source-drain electrode electrically coupled to the low-resistance region of the oxide semiconductor film.

5. The semiconductor device according to claim 4 , further comprising:

a first insulating film provided between the oxide semiconductor film and the gate electrode; and

a second insulating film that contains metal, and is in contact with the low-resistance region of the oxide semiconductor film.

6. The semiconductor device according to claim 5 , further comprising a third insulating film that covers the second insulating film, wherein

the source-drain electrode is electrically coupled to the low-resistance region of the oxide semiconductor film through a contact hole provided on the third insulating film and the second insulating film.

7. The semiconductor device according to claim 6 , wherein the second insulating film and the third insulating film are provided between the second electrode and the third electrode.

8. The semiconductor device according to claim 5 , wherein the metal comprises aluminum.

9. The semiconductor device according to claim 4 , wherein the source/drain electrode is electrically coupled to the first electrode.

10. The semiconductor device according to claim 4 , wherein the source/drain electrode is integral with the first electrode and the third electrode.

11. The semiconductor device of claim 4 , wherein the source/drain electrode extends along a sidewall of the low-resistance region.

12. The semiconductor device according to claim 1 , wherein the second electrode has a same thickness as a thickness of the low-resistance region of the oxide semiconductor film.

13. The semiconductor device according to claim 1 , wherein the first electrode, the second electrode, and the third electrode are provided in this order from the substrate.

14. A display unit comprising:

a semiconductor device; and

a display element layer that is provided on the semiconductor device, and includes a plurality of pixels,

the semiconductor device including

a substrate,

a gate electrode provided on the substrate,

an oxide semiconductor film provided on the substrate with the gate electrode being interposed therebetween, the oxide semiconductor film including a channel region that faces the gate electrode and a low-resistance region adjacent to the channel region,

a first electrode that contains a constituent material same as a constituent material of the gate electrode, the first electrode having a same thickness as a thickness of the gate electrode,

a second electrode having at least a portion that faces the first electrode, the second electrode containing a constituent material same as a constituent material of the oxide semiconductor film,

a third electrode having at least a portion that is provided at a position facing the first electrode with the second electrode being interposed therebetween, the third electrode being electrically coupled to the first electrode; and

a source/drain electrode electrically coupled to the low-resistance region and to the first electrode.

15. The display unit according to claim 14 , wherein the semiconductor device includes a pixel circuit of each of the plurality of pixels, the pixel circuit including a driving transistor and a switching transistor, and the gate electrode and the oxide semiconductor film configure the driving transistor in the pixel circuit.

16. The display unit according to claim 15 , wherein the second electrode is provided integrally with the oxide semiconductor film.

17. The display unit according to claim 14 , wherein the semiconductor device includes a pixel circuit of each of the plurality of pixels, the pixel circuit including a driving transistor and a switching transistor, and the gate electrode and the oxide semiconductor film configure the switching transistor in the pixel circuit.

18. The display unit according to claim 17 , wherein the second electrode is provided integrally with the oxide semiconductor film.

19. The semiconductor device of claim 14 , wherein the source/drain electrode is integral with the first electrode and the third electrode.

Assignments (5)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 18, 2025
From: JDI DESIGN AND DEVELOPMENT G.K.
To: MAGNOLIA BLUE CORPORATION
Reel/Frame 072039/0656 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 31, 2024
From: JOLED, INC.
To: JDI DESIGN AND DEVELOPMENT G.K.
Reel/Frame 066382/0619 →
CORRECTION BY AFFIDAVIT FILED AGAINST REEL/FRAME 063396/0671 Recorded Jun 12, 2023
From: JOLED, INC.
To: JOLED, INC.
Reel/Frame 064067/0723 →
SECURITY INTEREST Recorded Apr 20, 2023
From: JOLED, INC.
To: INCJ, LTD.
Reel/Frame 063396/0671 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 12, 2017
From: MURAI, ATSUHITO; TOYOTA, MOTOHIRO
To: JOLED INC.
Reel/Frame 044099/0155 →
Priority Claims (1)
JP 2016-246393 · Dec 20, 2016 · national
Continuity (1)
Related Publication 20180175246A1 · Jun 21, 2018