Capacitively coupled level shifter
A half bridge GaN circuit is disclosed. The circuit includes a low side power switch configured to be selectively conductive according to one or more input signals, a high side power switch configured to be selectively conductive according to the one or more input signals, and a high side power switch controller, configured to control the conductivity of the high sigh power switch based on the one or more input signals. The high side power switch controller includes a capacitor, and a logic circuit, wherein the capacitor is configured to capacitively couple a signal based on the input signals to the logic circuit, and the logic circuit is configured to control the conductivity of the high sigh power switch based on the capacitively coupled signal.
1. A half bridge GaN circuit, comprising:
a low side power switch configured to be selectively conductive according to one or more input signals;
a high side power switch configured to be selectively conductive according to the one or more input signals;
a high side power switch controller, configured to control the conductivity of the high sigh power switch based on the one or more input signals;
an inverting or noninverting logic gate having an input threshold based on the voltage of a power node, where the voltage of the power node has a voltage which changes according to the input signals, wherein a power terminal of the logic gate is connected to the power node; and
a voltage generator configured to generate a power voltage at a VMID node, wherein the power voltage is based on the voltage of the power node, wherein a ground terminal of the logic gate is connected to the VMID node, and wherein the input threshold voltage of the logic gate is between the voltage of the power node and the power voltage at the VMID node.
2. The circuit of claim 1 , wherein in the input signals are referenced to a first voltage and the capacitively coupled signal is referenced to a second voltage.
3. The circuit of claim 2 , wherein the first voltage is a ground voltage and the second voltage changes according to the input signals.
4. The circuit of claim 1 , wherein the input threshold of the logic gate changes according to changes in the voltage of the power node.
5. The circuit of claim 1 , wherein the voltage generator comprises a Zener diode, and wherein the power voltage at the VMID node is less than the voltage of the power node substantially by a breakdown voltage of the Zener diode.
6. The circuit of claim 1 , wherein the high side power switch controller further comprises a latch, wherein the logic circuit is configured to generate one or more latch input signals based on the capacitively coupled signal for the latch, wherein the latch is configured to receive the latch input signals and to generate one or more latch output signals based on the latch input signals, and wherein the latch output signals control the conductivity of the high sigh power switch.
7. The circuit of claim 6 , wherein the high side power switch controller further comprises a power switch driver, wherein the driver is configured to receive the latch output signals, and to control the conductivity of the high sigh power switch based on the latch output signals.
8. An electronic component, comprising:
a package base; and
at least one GaN-based die secured to the package base and including an electronic circuit comprising:
a low side power switch configured to be selectively conductive according to one or more input signals;
a high side power switch configured to be selectively conductive according to the one or more input signals;
a high side power switch controller, configured to control the conductivity of the high sigh power switch based on the one or more input signals;
an inverting or noninverting logic gate having an input threshold based on the voltage of a power node, where the voltage of the power node has a voltage which changes according to the input signals, wherein a power terminal of the logic gate is connected to the power node; and
a voltage generator configured to generate a power voltage at a VMID node, wherein the power voltage is based on the voltage of the power node, wherein a ground terminal of the logic gate is connected to the VMID node, and wherein the input threshold voltage of the logic gate is between the voltage of the power node and the power voltage at the VMID node.
9. The electronic component of claim 8 , wherein in the input signals are referenced to a first voltage and the capacitively coupled signal is referenced to a second voltage.
10. The electronic component of claim 9 , wherein the first voltage is a ground voltage and the second voltage changes according to the input signals.
11. The electronic component of claim 8 , wherein the input threshold of the logic gate changes according to changes in the voltage of the power node.
12. The electronic component of claim 8 , wherein the voltage generator comprises a Zener diode, and wherein the power voltage at the VMID node is less than the voltage of the power node substantially by a breakdown voltage of the Zener diode.
13. The electronic component of claim 8 , wherein the high side power switch controller further comprises a latch, wherein the logic circuit is configured to generate one or more latch input signals based on the capacitively coupled signal for the latch, wherein the latch is configured to receive the latch input signals and to generate one or more latch output signals based on the latch input signals, and wherein the latch output signals control the conductivity of the high sigh power switch.
14. The electronic component of claim 13 , wherein the high side power switch controller further comprises a power switch driver, wherein the driver is configured to receive the latch output signals, and to control the conductivity of the high sigh power switch based on the latch output signals.