Integrated circuit physically unclonable function
An integrated circuit (IC) based physically unclonable function (PUF) that comprises a common source amplifier for generating PUF output voltages, a unity gain, negative feedback operational amplifier for generating bias voltages, a voltage regulator and a bit exclusion circuit that excludes unstable PUF bits. Compensation circuitry built into the IC-PUF provides a high power supply rejection ratio and enables highly reliable operation of the IC-PUF across varying input voltages and operating temperatures. The IC-PUF generates a uniformly random output bit stream by taking advantage of process variations that are inherent to the fabrication of (metal-oxide semiconductor) MOS transistors.
1. An apparatus comprising:
a plurality of physically unclonable functions (PUFs), wherein each PUF of the plurality of PUFs comprises a common source amplifier and an output terminal that generates a PUF output voltage; and
a negative feedback operational amplifier configured to generate a first bias voltage and a second bias voltage, wherein the first bias voltage and the second bias voltage drive the common source amplifier of each PUF of the plurality of PUFs;
wherein:
the negative feedback operational amplifier comprises at least a first stage and an output stage;
the first stage has a negative input terminal for receiving a negative feedback voltage;
the output stage has a common-source amplifier configuration in which a common drain terminal of an NMOS transistor unit consisting of plural, parallel-connected NMOS transistors is connected in series with a common drain terminal of a PMOS transistor unit consisting of plural, parallel-connected PMOS transistors; and
the negative input terminal of the first stage is connected between the NMOS common drain terminal and the PMOS common drain terminal of the output stage;
and wherein, within each respective PUF:
the respective PUF common source amplifier comprises a first MOS transistor and a second MOS transistor;
the first bias voltage is input to a switch that applies it as a switched first bias voltage to a gate terminal of the first MOS transistor;
the second bias voltage is input to a switch that applies it as a switched second bias voltage to a gate terminal of the second MOS transistor;
the gate terminal of the first MOS transistor is connected through the applicable switching arrangement to a common gate terminal of one of the output stage transistor units; and
the gate terminal of the second MOS transistor is connected through the applicable switching arrangement to a common gate terminal of the other output stage transistor unit.
2. The apparatus of claim 1 , wherein the negative feedback operational amplifier comprises a parallel combination of a plurality of nominally identical NMOS transistors and a parallel combination of an equal plurality of nominally identical PMOS transistors.
3. The apparatus of claim 1 , further comprising:
an address decoder circuit configured to sequentially enable or disable each of the plurality of PUFs; and
a voltage regulator configured to supply a regulated supply voltage to the negative feedback operational amplifier.
4. The apparatus of claim 1 , further comprising:
memory that is operable to store, for each of the plurality of PUFs, a flag indicating whether a respective PUF is stable, wherein the output terminal of a stable PUF generates a respective PUF output voltage that falls outside of a predefined bit-exclusion width.
5. The apparatus of claim 1 , wherein the plurality of PUFs are configured to provide a string of M binary output values, wherein M is an integer, wherein the plurality of PUFs comprise an array of N PUF elements, and wherein M is an integer less than N.
6. The apparatus of claim 1 , wherein the PUF output voltage is intermediate between voltages on respective power-supply rails that correspond to the regulated supply voltage and a ground plane.
7. The apparatus of claim 1 , wherein:
the plurality of PUFs consists of an array of N PUFs, N an integer;
the array of N PUFs is configured to generate N PUF output voltages, wherein N is an integer, and wherein each of the N PUF output voltages is intermediate between a regulated supply voltage and a ground voltage; and
the apparatus further comprises a bit-exclusion circuit connected to the array of N PUFs and configured to convert the N PUF output voltages into M binary output values, wherein M is an integer less than N.
8. The apparatus of claim 7 , wherein the NMOS transistor unit of the negative feedback operational amplifier comprises a parallel combination of at least thirty nominally identical NMOS transistors and the PMOS transistor unit of the negative feedback operational amplifier comprises a parallel combination of at least thirty nominally identical PMOS transistors.
9. The apparatus of claim 8 , wherein the negative feedback operational amplifier is a unity gain negative feedback operational amplifier, and wherein the bit-exclusion circuit generates the same M binary output values over a range of operating temperatures from −55° C. to +125° C.
10. The apparatus of claim 9 , wherein the array of N PUFs generates the same M binary output values over a range of power supply voltages from 0.72V to 0.82V.
11. The apparatus of claim 7 , further comprising:
an address decoder circuit configured to sequentially enable or disable each PUF of the array of N PUFs; and
a voltage regulator configured to supply the regulated supply voltage to the negative feedback operational amplifier.
12. The apparatus of claim 7 , wherein the first bias voltage varies between approximately 531 mV and 563 mV and the second bias voltage varies between approximately 253 mV and 285 mV.
13. A system comprising:
an array of N physically unclonable functions (PUFs) configured to generate N PUF output voltages, wherein N is an integer, and wherein each of the N PUF output voltages is intermediate between a regulated supply voltage and a ground voltage;
a feedback amplifier providing a first bias voltage and a second bias voltage to each PUF of the array of N PUFs; and
a bit-exclusion circuit connected to the array of N PUFs and configured to convert the N PUF output voltages into M binary output values, wherein M is an integer less than N, wherein the bit-exclusion circuit is configured to:
convert the N PUF output voltages into the M binary output values based on comparing a respective magnitude of the PUF output voltage to a predefined bit-exclusion width, and
output M respective logic-0 bits or logic-1 bits.
14. An apparatus comprising:
a plurality of physically unclonable functions (PUFs), wherein each PUF of the plurality of PUFs comprises a common source amplifier and an output terminal that generates a PUF output voltage;
a negative feedback operational amplifier configured to generate a first bias voltage and a second bias voltage, wherein the first bias voltage and the second bias voltage drive the common source amplifier of each PUF of the plurality of PUFs;
memory that is operable to store, for each of the plurality of PUFs, a flag indicating whether a respective PUF is stable, wherein the output terminal of a stable PUF generates a respective PUF output voltage that falls outside of a predefined bit-exclusion width; and
a bit-exclusion circuit responsive to the flag stored in the memory and configured to exclude outputs of at least one unstable PUF of the plurality of PUFs.
15. The apparatus of claim 14 , wherein the bit-exclusion circuit is configured to:
categorize respective PUF output voltages into stable and unstable categories based on a respective magnitude of the PUF output voltage, and
output, based on the categorization, respective logic-0 bits or logic-1 bits for each stable PUF of the plurality of PUFs.
16. The apparatus of claim 14 , further comprising an address decoder circuit configured to sequentially enable or disable each PUF of the plurality of PUFs.
17. The apparatus of claim 14 , further comprising a voltage regulator configured to supply a regulated supply voltage to the negative feedback operational amplifier.
18. The apparatus of claim 14 , wherein the first bias voltage varies between approximately 531 mV and 563 mV and the second bias voltage varies between approximately 253 mV and 285 mV.