IP Library Patent Application 15840026
Patent Application
App. No. 15/840,026

PHOTODETECTOR WITH INTEGRATED TEMPERATURE CONTROL ELEMENT

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Quick Facts
Patent No.
US None
App. No.
15/840,026
Abstract

A temperature-controlled photodetector sub-system is described. The temperature control element allows the operation of the photodetector at a desired temperature. The temperature control element can be a heater or a cooler. In some cases, the photodetector is a germanium photodetector. In some cases a temperature measuring device is provided. In some cases, a control circuit is used to control the temperature of the germanium photodetector within a temperature range, or at a temperature of interest. An advantage provided by the apparatus described is the operation of the photodetector so that the responsivity of the germanium detector can be held at essentially a constant value.

Claims (26)

1 - 28 . (canceled)

29 . A photonic device comprising:

a wafer comprising a waveguiding layer;

a photodetector integrated with the wafer in optical communication with the waveguiding layer; and

a temperature control element integrated with the wafer proximate to the photodetector so as to control the temperature thereof.

30 . The photonic device of claim 29 , wherein the photodetector is a germanium photodetector.

31 . The photonic device of claim 29 , wherein the temperature control element comprises one of a heater and a cooler.

32 . The photonic device of claim 29 , wherein the temperature control element is disposed at most 10 microns apart from the photodetector.

33 . The photonic device of claim 29 , wherein the temperature control element is disposed less than 50 microns apart from the photodetector.

34 . The photonic device of claim 29 , wherein the temperature control comprises a Peltier device.

35 . The photonic device of claim 29 , further comprising a thermal measurement device situated proximate to the photodetector.

36 . The photonic device of claim 35 , including a control circuit connecting the temperature control element with the thermal measurement device and configured to control a temperature of the photodetector in a predetermined temperature range.

37 . The photonic device of claim 29 , wherein the temperature control element comprises two heaters disposed on opposite sides of the photodetector or two coolers disposed on opposite sides of the photodetector.

38 . The photonic device of claim 29 , wherein the waveguiding layer comprises a semiconductor.

39 . The photonic device of claim 29 , wherein the temperature control element comprises a resistive heater.

40 . The photonic device of claim 29 further comprising an electrical signal barrier disposed between the photodetector and the temperature control element.

41 . The photonic device of claim 40 , wherein the electrical signal barrier comprises a p-n-p-n junction.

42 . A method of operating a photonic device in a predefined wavelength range across a first temperature range, the photonic device comprising a wafer and a photodetector integrated therewith, the photodetector being capable of efficiently detecting light of the predefined wavelength range within only a portion of the first temperature range, the method comprising:

integrating a temperature control element with the wafer proximate to the photodetector, and

operating the temperature control element to maintain a temperature of the photodetector within the pre-determined portion of the first temperature range.

43 . The method of claim 42 , comprising using a germanium photodetector as the photodetector.

44 . The method of claim 42 , comprising using one of a heater and a cooler as the temperature control element.

45 . The method of claim 42 , comprising integrating the temperature control element at most 10 microns away from the photodetector.

46 . The method claim 42 , wherein the photodetector is disposed on a semiconductor layer, and wherein the integrating the temperature control element comprises forming the temperature control element at least in part in the semiconductor layer or over the semiconductor layer.

47 . The method claim 46 , comprises forming an electrical signal barrier in the semiconductor layer between the temperature control element and the photodetector.

48 . The method of claim 42 , wherein integrating the temperature control element comprises integrating a heater proximate to the photodetector.

Assignments (7)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 11, 2023
From: ELENION TECHNOLOGIES LLC
To: NOKIA SOLUTIONS AND NETWORKS OY
Reel/Frame 063284/0464 →
RELEASE OF SECURITY INTEREST Recorded Mar 27, 2020
From: HERCULES CAPITAL, INC.
To: ELENION TECHNOLOGIES CORPORATION; ELENION TECHNOLOGIES, LLC
Reel/Frame 052251/0186 →
RELEASE OF SECURITY INTEREST Recorded Feb 8, 2019
From: EASTWARD FUND MANAGEMENT, LLC
To: ELENION TECHNOLOGIES CORPORATION
Reel/Frame 048290/0070 →
SECURITY INTEREST Recorded Feb 8, 2019
From: ELENION TECHNOLOGIES, LLC; ELENION TECHNOLOGIES CORPORATION
To: HERCULES CAPITAL INC., AS AGENT
Reel/Frame 048289/0060 →
SECURITY INTEREST Recorded Apr 16, 2018
From: ELENION TECHNOLOGIES CORPORATION
To: EASTWARD FUND MANAGEMENT, LLC
Reel/Frame 045959/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 20, 2017
From: NOVACK, ARI; SHI, RUIZHI; LABARRIE, JEAN CLAUDE
To: CORIANT ADVANCED TECHNOLOGY, LLC
Reel/Frame 044446/0047 →
CHANGE OF NAME Recorded Dec 20, 2017
From: CORIANT ADVANCED TECHNOLOGY, LLC
To: ELENION TECHNOLOGIES, LLC
Reel/Frame 044918/0502 →